The Ultim Extreme Silicon Drift Detector for EDS in the SEM

The Ultim Extreme ∞ (“Infinity”) is a revolutionary solution for ultra-high-resolution FEG-SEM. This advanced detector is designed to enable energy-dispersive X-ray spectroscopy (EDS) data collection at very low accelerating voltages (e.g. 1-3 kV) and extremely short working distances. It supports elemental analysis under the precise conditions needed to study nanomaterials and surfaces at the highest possible SEM resolution. Its unmatched sensitivity is achieved through innovative technological features, including a specially engineered sensor shape, windowless design, sensor-to-sample proximity, small electron trap, and an exceptionally high solid angle.

Why Infinity?

Ultim Extreme Infinity delivers solutions beyond conventional micro and nano-analysis. It comes with guaranteed performance, tested on installation, beyond the typical specifications of any other detector. The highest sensitivity is ensured by specific technological solutions that include specially shaped sensor, windowless design, proximity of sensor to the sample, small electron trap and very high solid angle. Solid angle is 7-8× that of a typical 100 mm² conventional EDS detector.

Infinity gives you:

  • Ultimate performance
  • Excellent characterisation at high spatial resolution
  • Resolution of more difficult challenges using Tru-Q IQ
  • Fastest and most accurate nano-characterisation
  • Nano resolution imaging and elemental analysis at the same conditions (WD, current, kV)
  • Light element sensitivity and analysis of beam sensitive materials

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