The Bettersizer S3 Plus integrates laser diffraction and dynamic image analysis into a single device. It can quantify particle sizes and shapes ranging from 0.01 μm to 3500 μm.
Featuring exceptional sensitivity to both ultrafine and oversized particles, along with unmatched resolution, this size and shape analyzer is the ideal tool for researchers conducting top scientific research.
Features and Benefits
- Combines laser diffraction and dynamic image analysis into one instrument, allowing size and shape results to be obtained simultaneously
- Compliance with 21 CFR Part 11, ISO 13320, USP <429>, CE
- Dual-camera imaging technology can show particle images in real-time and detect oversized particles up to 3500 um
- Measuring range is 0.01 - 3,500μm (laser system), 2 - 3,500μm (image system)
- The patented DLOI (Dual Lenses & Oblique Incidence) system enables the measurement of ultrafine particles down to 0.01 um
- Refractive index measurement determines the refractive index of unknown samples and improves the reliability of results
Bettersizer S3 Plus | Particle Size and Shape Analyzer
Video Credit: Bettersize Instruments Ltd.
Overview
Features
1. Bettersizer S3 Plus Particle Size and Shape Analyzer Overview
The Bettersizer S3 Plus, a laser diffraction particle size and shape analyzer, features two high-speed CCD cameras (0.5X and 10X magnification) for capturing sample images.
During measurement, particles dispersed in the chosen medium pass through two sample cells. In the first cell, short-wave laser light (532 nm) illuminates and scatters the particles. Optical signals within an angle range of 0.02° to 165° are detected by 96 detectors. Simultaneously, the CCD cameras in the second sample cell continuously capture particle images, providing shape information within the range of 2 to 3500 µm.
Image Credit: Bettersize Instruments Ltd.
2. Patented DLOI (Dual Lenses Oblique Incidence) System: Laser Diffraction
Laser diffraction technology remains the preferred approach for routine particle size analysis in a variety of industrial areas. The Bettersizer S3 Plus uses a proprietary DLOI device with a Fourier structure to accurately quantify ultrafine particles as small as 0.01 μm.
Features and Benefits
- Zero stabilization and preheating time is needed with a solid-state light source.
- A single short-wave laser system (532 nm) delivers a continuous scattering spectrum with a consistent wavelength.
- Robust optical system with superior resolution using the dual lenses design.
- Measures ultrafine particles accurately with the large angular range (0.02 - 165°) with 96 detectors.
Image Credit: Bettersize Instruments Ltd.
3. Dual-Camera System: Dynamic Image Analysis
Dynamic image analysis can improve the understanding of materials by providing detailed shape or morphological information that is not affected by laser diffraction. Individual particles with unique geometric features, such as agglomerates, crushed particles, and foreign particles, can be accurately monitored with the dual-camera system.
Features and Benefits
- High-speed strobe lights - Capture up to 10,000 particle images in 60 seconds, offering authentic shape results
- 0.5x and 10x cameras - Photograph an extremely wide size range of particles
- Suitable for measuring heterogeneous samples with unknown optical properties
4. Groundbreaking Combination: Laser Diffraction with Dynamic Image Analysis
The Bettersizer S3 Plus combines laser diffraction and dynamic image analysis in a single device to measure particle size, size distribution, and shape throughout a large dynamic range. Users can obtain a better understanding of material behavior by working together to speed up the troubleshooting and method development processes.
Features and Benefits
- 2-in-1 System - Obtains particle size and shape results simultaneously
- DLOI System - Precisely measures ultrafine particles down to 0.01 μm
- Dual-camera Imaging System - Detects oversized particles up to 3,500 μm efficiently
- Fast time-to-result - Generates results in as little as 10 seconds
5. Applications
Image Credit: Bettersize Instruments Ltd.
Performance
1. High Resolution and Sensitivity
The Bettersizer S3 Plus excels in resolution and sensitivity for particle size measurements. Its DLOI system enables precise determination of size distributions in polydisperse samples and sensitive detection of size changes in products.
A mixed alumina sample is investigated, and as to be expected, the analysis noted the existence of the three raw samples, suggesting the high-resolution capability of the DLOI system. Image Credit: Bettersize Instruments Ltd.
The sizes of as-prepared MCC (microcrystalline cellulose) exhibit a slightly decreased trend with the increasing Fe3+ concentration, suggesting the high-sensitvity capability of the DLOI system. Image Credit: Adapted from Yue, Xiaopeng, et al. Cellulose.
2. Multiple Shape Parameters
Below is an illustration of shape analysis utilizing additive manufacturing with the Bettersizer S3 Plus. Two AlSi10Mg samples are used to record a representative number of individual particles, and the number-weighted aspect ratio and circularity are assessed in accordance with ISO criteria. (Taken from Chem. Ing. Tech. 93.8 (2021): 1199–1203 by F. Schleife and C. Oetzel.)
Compared to the fresh powders, the spatter particles show a significantly larger aspect ratio and thus a lower average elongation. Image Credit: Bettersize Instruments Ltd.
The spatter particles exhibit a higher average circularity and are expected to possess a lower shape anisotropy than the fresh powders. Image Credit: Bettersize Instruments Ltd.
3. Oversized Particle Detection
Oversized grains, agglomerates, air bubbles, and other particles that are statistically underrepresented in a widely spread sample can be sensitively detected using laser diffraction in conjunction with image analysis.
Below is an illustration of an off-specification abrasive. By displaying images of overly coarse particles and a size peak at around 120 μm, the Bettersizer S3 Plus verifies the existence of oversized particles.
Image Credit: Bettersize Instruments Ltd.
4. Analysis of Samples with Extremely Broad Distributions
The Bettersizer S3 Plus’s combined measurement is the best way to obtain precise quantitative findings from samples. Below is an example of how a soil sample that was returned from the moon was measured.
According to geotechnical standards, the lunar sample is considered well-graded based on the complete size and shape results. (Adapted from Science China Physics, Mechanics & Astronomy by Zhang, Hui, et al.)
Lunar size analyzed by the Bettersizer S3 Plus. Image Credit: Bettersize Instruments Ltd.
Size Characterization
The particle size distribution in the range of 0.3-516 μm is quite wide. There is a gradual rise in the size range of 1-10 μm, indicating the presence of a significant amount of fine dust.
Image Credit: Bettersize Instruments Ltd.
Shape Characterization
Based on particle images, the circularity of individual particles in the lunar sample is assessed. Due to their great circularity, the majority of lunar regolith particles have rather uniform shapes.
Image Credit: Bettersize Instruments Ltd.
Technology
Image Analysis. Image Credit: Bettersize Instruments Ltd.
Laser Diffraction. Image Credit: Bettersize Instruments Ltd.
Specification
Source: Bettersize Instruments Ltd.
| Bettersizer S3 Plus |
| Parameter Measured |
| Particle size distribution |
Suspension, emulsion, dry powders |
| Particle shape |
| General |
| Principle |
Laser diffraction and dynamic image technologies |
| Analysis |
Mie scattering theory and Fraunhofer diffraction theory |
| Typical measurement time |
Less than 10 seconds |
| Measurement Performance |
| Measuring range |
0.01 - 3500 μm (Laser System)
2 - 3500 μm (Image System) |
| Accuracy |
<0.5% (NIST certified standards) |
| Repeatability |
<0.5% (NIST certified standards) |
| Number of size classes |
≤100 (adjustable) |
| Feeding mode |
Automatic circulation or semi-automatic circulation |
| Special functions |
Refractive index measurement, SOP settings |
| Image recognition |
Up to 120 fps, up to 10,000 particles per min |
| Main Device |
| Optical system |
Patented DLOI (Dual Lenses & Oblique Incidence) System |
| Laser |
Polarized light-pumped solid-state laser (10 mW / 532 nm) |
| Detector |
96 detectors (forward, lateral and backward arrangements) |
| Measuring angle |
0.02 - 165° |
| CCD cameras |
0.5x and 10x * |
| Image analysis |
1.2 megapixels |
| Dispersion Module |
| Circulation speed |
300 - 2500 r/min |
| Circulation flow rate |
3000 - 8000 mL/min |
| Untrasonication |
Dry run protection, Max 50 W (adjustable) |
| Circulation tank capacity |
600 mL |
| Software |
| Conformity |
21 CFR Part 11, ISO 13320, ISO 13322, USP <429>, CE |
| Report |
Customizable reporting |
| System Parameters |
| Dimensions (L x W x H) |
820 × 610 × 290 mm |
| Weight |
48 kg |
| Voltage |
DC 24 V, 50 / 60 Hz, 20 W |
| Computer Configuration (Recommended) |
| Computer interface |
At least one high-speed USB 2.0 or USB 3.0 port required |
| Operating system |
Windows 7 / Windows 10 |
| Hardware specification |
Intel Core i7, 8GB RAM, 500GB HD, two PCI-E X16 interfaces |
* The Bettersizer S3 Plus is also available in a single camera (0.5x) model.
Accessory
BT-A60 Autosampler
Introduction
The BT-A60 is a reliable, automated, and high-throughput sampling system. It provides maximal laboratory automation for sample measurements, lowering labor costs while increasing productivity and efficiency.
The small design saves bench space while measuring up to 60 samples in a single run. The BT-A60, which is compatible with the Bettersizer S3 Plus and Bettersizer 2600, provides 24/7 completely automated sample analysis for a variety of analytical applications.
Features
- Precise sample identification
- Effective ultrasonic cleaning
- Up to 60 samples in one click
- Measurement automation
- Small footprint
Image Credit: Bettersize Instruments Ltd.
Benefits
Source: Bettersize Instruments Ltd.
| Manual Insertion vs Measurement Automation |
| Skilled operator required |
Save labor costs |
| Potential risk of human error |
Independent of human error |
| Risk of cros-contamination |
No risk of cross-contamination |
| Messy workbench |
Well-organized workbench |
| Longer sample-to-sample run times |
Shorter sample-to-sample run times |