Great Deals on Metrology Instruments from LOT Oriel

LOT represent some of the top names in Metrology instrumentation such as KLA Tencor and Park Systems. We are currently offering the following promotions for a limited period.

Park XE-100 - Award-Winning Research-Grade AFM with Step-and-Scan Automation

LOT are now able to offer a limited number of brand new, factory delivered XE-100 AFMs at 20% off list price (includes 12 month warranty, delivery, installation and user training). These are current specification models. To view a typical specification please click here

The XE-100 is Park's flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and engineering. It can adopt a wide range of optical coupling with its open side access.

KLA-Tencor D-100 Stylus Surface Profiler

We are offering 20% off the list price (including 12 month warranty, delivery, installation and user training for a limited period.

The AlphaStep D-100 profilometer rapidly and quantitatively measures the 2D topography of surfaces. The AlphaStep D-100 profilometer measurement systems includes an 800 micron (optional 1.2 millimeter) Z range, sub-angstrom resolution, 6 angstrom step height repeatability, manual x-y theta sample positioning stage, and many other features. To view a typical specification please click here

KLA-Tencor MicroXAM-100 Optical Surface Profiler

We are offering 25% off the list price (including 12 month warranty, delivery, installation and user training for a limited period.

The MicroXAM -100 3D surface profiler can measure fields of view from 100 X 100 microns to 2.0 X 2.0 millimeters (dependent on the objective lens used). The MicroXAM 100 optical interferometer quickly and accurately measures the 3D topography of surfaces at the nanometer level with a z-scan range of 250 microns (or up to 10 mm with Z-Stitching). With the new 3D image stitching capabilities, multiple images can be stitched together to produce an extended fields of view. To view a typical specification please click here

For further information please contact Heath Young on 01372 378822, e-mail [email protected]

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