Atomic Force Microscopes News

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Even New AFM Tips are Not as Clean as You Think!

Even New AFM Tips are Not as Clean as You Think!

14 Mar 2018

Park Systems Announces the Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute

6 Nov 2017
Park Systems Introduces Park NX12 for Unsurpassed Affordable High Resolution NanoScale Imaging Required for Advanced Analytical Chemistry, Materials Research, and Multi-User Facility

Park Systems Introduces Park NX12 for Unsurpassed Affordable High Resolution NanoScale Imaging Required for Advanced Analytical Chemistry, Materials Research, and Multi-User Facility

From Park Systems Inc 6 Jun 2017

Catholic University of Rome Uses the JPK NanoWizard® AFM & CellHesion® Systems to Understand How Cells Sense and Respond to Mechanical Stimuli

From JPK Instruments AG - Scanning Probe Technologies 13 Apr 2017

Conference-Review: 13th Confocal Raman Imaging Symposium

19 Oct 2016
Bruker Introduces Complete Commercial AFM-Based SECM Solution

Bruker Introduces Complete Commercial AFM-Based SECM Solution

From Bruker Nano Surfaces 21 Sep 2016
Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements

Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements

From Asylum Research - An Oxford Instruments Company 20 Sep 2016

Park Systems, World Leading Manufacturer of Atomic Force Microscopes Receives Frost & Sullivan 2016 Global Enabling Technology Leadership Award

27 Jul 2016

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

From Thermo Scientific – Electron Microscopy Solutions 26 Jul 2016
Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

11 May 2016

A Graphene FET (GFET) Ready for Immediate Functionalization

Graphenea are known for pushing the barriers of graphene research. They have recently developed a Graphene FET (GFET) which is ready for immediate functionalization. This will save valuable research time and eliminate human error, making graphene research simpler and more efficient.

A Graphene FET (GFET) Ready for Immediate Functionalization
VASCO KIN Particle Size Analyzer

VASCO KIN Particle Size Analyzer

In a continuation of their development of advanced nanomaterials characterization technologies, Cordouan has developed the VASCO KIN™ Time-Resolved instrument. This next-generation equipment is designed to monitor in Real Time nanoparticles synthesis, agglomeration or the stability of suspensions, using accurate kinetic analyses combined within an in situ and contactless remote optical head.

From Cordouan Technologies