Authors demonstrated a new approach to using a "tip-on-chip" probe by employing three steps: tuning-fork rebalancing, refurbished holder-sensor fixation, and electrode reconfiguration, obtaining unmatched levels of sensitivity.
Researchers review recent atomic force microscopy (AFM) investigations of halloysite nanotube (HNT) nanocomposites and HNTs to determine the feasibility of using the AFM technique for nanomaterial characterization.
Researchers demonstrated the effect of moire interlayer modulation on the van der Waals (vdW) potential of twisted, layered materials (LMs). Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride
Authors prepared cubic and walnut-shaped light-driven hematite/platinum (Pt) microrobots, followed by their transformation into Janus structures by Pt deposition.
Researchers have developed an effective nanomaterial for surface-assisted laser desorption/ionization (SALDI) mass spectrometry imaging (MSI).
Park Systems, world leading manufacturer of Atomic Force Microscopes announced the launch of Park NX-Hybrid WLI, the first fully integrated system that combines Atomic Force Microscope (AFM) with White Light Interferometer (WLI) profilometry.
Bruker today announced the release of the large-sample Dimension IconIR™ nanoscale infrared spectroscopy and chemical imaging system.
AXT have a strong commitment to the microscopy community and are always looking out for new and innovative products that can enhance microscopy research and workflows.
A team of scientists led by the Department of Applied Physics at Osaka University, the Department of Physics and Electronics at Osaka Prefecture University, and the Department of Materials Chemistry at Nagoya University used photoinduced force microscopy to map out the forces acting on quantum dots in three dimensions
Covalent Metrology and Digital Surf will collaborate to advance software-enabled analysis, data visualization and more for research and industry.