Atomic Force Microscopes News

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Even New AFM Tips are Not as Clean as You Think!

Atomic probe microscopy (AFM) tips are supposed to be chemically inert and should not interfere with measurements.

14 Mar 2018

Park Systems Announces the Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute

The Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute will be held Nov. 10, 2017, at 2p.m. and will include a ribbon cutting ceremony, followed by a featured talk from Park Systems’ founder...

6 Nov 2017

Park Systems Introduces Park NX12 for Unsurpassed Affordable High Resolution NanoScale Imaging Required for Advanced Analytical Chemistry, Materials Research, and Multi-User Facility

Park Systems, World-leading manufacturer of Atomic Force Microscopes (AFM) just announced new Park NX12, an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities.

From Park Systems 6 Jun 2017

Catholic University of Rome Uses the JPK NanoWizard® AFM & CellHesion® Systems to Understand How Cells Sense and Respond to Mechanical Stimuli

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the work of Professor Marco De Spirito's research group at the Catholic University of Rome. The group uses a NanoWizard® AFM and CellHesion® module to study how cells sense and respond to mechanical stimuli.

From JPK Instruments AG - Scanning Probe Technologies 13 Apr 2017

Conference-Review: 13th Confocal Raman Imaging Symposium

“One of the most informative and interactive symposia of recent years", said WITec CEO Dr. Joachim Koenen about the 13th Confocal Raman Imaging Symposium held from September 26th to the 28th in Ulm, Germany. ...

19 Oct 2016

Bruker Introduces Complete Commercial AFM-Based SECM Solution

PeakForce SECM mode enables previously unobtainable electrochemical information.

From Bruker Nano Surfaces 21 Sep 2016

Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements

Get ready to surf your sample with new economical atomic force microscope (AFM) probes. “Econo Board™ Probes” are the first group of probes released from Asylum Research’s new line of SurfRider™ Probes.

From Asylum Research - An Oxford Instruments Company 20 Sep 2016

Park Systems, World Leading Manufacturer of Atomic Force Microscopes Receives Frost & Sullivan 2016 Global Enabling Technology Leadership Award

Frost & Sullivan announced today that Park Systems, the leading manufacturer of Atomic Force Microscopes is the recipient of its2016 Global Enabling Technology Leadership Award. Each year, Frost & Sulliva...

27 Jul 2016

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Speed, sensitivity and dynamic range will enable multichannel atomic-scale imaging and analysis of material properties such as electric and magnetic fields. FEI (NASDAQ: FEIC) and Cornell University have entered an ag...

From Thermo Scientific – Electron Microscopy Solutions 26 Jul 2016

Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

To the surprise of chemists, a new technique for taking snapshots of molecules with atomic precision is turning up chemicals they shouldn’t be able to see.

11 May 2016

Atomic Force Microscopes News

Even New AFM Tips are Not as Clean as You Think!

Park Systems Announces the Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute

Park Systems Introduces Park NX12 for Unsurpassed Affordable High Resolution NanoScale Imaging Required for Advanced Analytical Chemistry, Materials Research, and Multi-User Facility

Catholic University of Rome Uses the JPK NanoWizard® AFM & CellHesion® Systems to Understand How Cells Sense and Respond to Mechanical Stimuli

Conference-Review: 13th Confocal Raman Imaging Symposium

Bruker Introduces Complete Commercial AFM-Based SECM Solution

Oxford Instruments Asylum Research Announces New SurfRider Econo Board Probes for Routine AFM Measurements

Park Systems, World Leading Manufacturer of Atomic Force Microscopes Receives Frost & Sullivan 2016 Global Enabling Technology Leadership Award

FEI and Cornell University Collaborate to Commercialize New EMPAD Detector

Atomic Force Microscopy Takes Snapshots of Two Molecules Reacting on Surface of Catalyst

How Graphite Can Help to Get the Most Energy Out of Your Battery?

Why Negative-Stiffness Vibration Isolation is the Preferred Solution for Nanotechnology Applications

The Future of Graphene

Bruker’s Hysitron TI 950 TriboIndenter Nanomechanical Test Instrument

Plasma Treatment Equipment for Semiconductor Manufacturing

Tribometer for Load Control, High Speed, and High Force - T2000

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Atomic Force Microscopes News

1 New Flatland Material: Physicists Obtain Quasi-2D Gold

2 Surface Acoustic Waves-Based Spray Dryer Produces Additive-Free Amorphous Nanoparticles

3 Researchers Develop New Method to Observe Single Nanoparticles Before, During, and After Electrochemical Reaction

4 Fighting Counterfeit with Carbon Nanotubes

5 Cube-Shaped Nanoparticles with Thick Shells of DNA Assemble in Rare 3D “Zigzag” Pattern

6 Novel 3D Printed Metamaterials Possess Extraordinary Optical Properties

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