In an article published in the journal ACS Applied Energy Materials, the nanomechanical and morphological changes were investigated in Ni-Al-n LDH nanosheets by utilizing in situ electrochemical atomic force microscopy during potential cycling.
Prior's motorized objective changer nosepieces are the latest addition to the OpenStand product family to provide customers with additional automation for OEM optical solutions and one-off custom microscopes.
Oxford Instruments Asylum Research today announced the launch of the new Cypher L atomic force microscope (AFM). Based on the acclaimed high-performance Cypher AFM platform, the Cypher L is designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage.
Researchers employed atomic force microscopy (AFM) and molecular dynamics (MD) simulations to reveal the structural details of the chitin nanocrystal (chitin NC)-water interface at the molecular level.
Authors demonstrated a new approach to using a "tip-on-chip" probe by employing three steps: tuning-fork rebalancing, refurbished holder-sensor fixation, and electrode reconfiguration, obtaining unmatched levels of sensitivity.
Researchers review recent atomic force microscopy (AFM) investigations of halloysite nanotube (HNT) nanocomposites and HNTs to determine the feasibility of using the AFM technique for nanomaterial characterization.
Researchers demonstrated the effect of moire interlayer modulation on the van der Waals (vdW) potential of twisted, layered materials (LMs). Moiré Modulation of Van Der Waals Potential in Twisted Hexagonal Boron Nitride
Authors prepared cubic and walnut-shaped light-driven hematite/platinum (Pt) microrobots, followed by their transformation into Janus structures by Pt deposition.
Researchers have developed an effective nanomaterial for surface-assisted laser desorption/ionization (SALDI) mass spectrometry imaging (MSI).
Park Systems, world leading manufacturer of Atomic Force Microscopes announced the launch of Park NX-Hybrid WLI, the first fully integrated system that combines Atomic Force Microscope (AFM) with White Light Interferometer (WLI) profilometry.