The importance of characterizing electrical functionality on nanometer length scales continues to grow as devices shrink and new nanomaterials emerge. The inherent spatial resolution and high force sensitivity of the atomic force microscope (AFM) make it a powerful tool for nanoscale electrical properties, including current, surface charge and potential, dielectric breakdown, conductivity, electrical characterization.
To this effect, Oxford Instruments Asylum Research has just released an informative new application note, “AFM Tools for Nanoscale Electrical Characterization”. The application note discusses the most recent nanoelectrical characterization techniques, as well as the benefits and exclusive modes that the Asylum Research Cypher™ and MFP-3D™ AFMs offer. Researchers will learn more about evaluating local electrical properties, including current, surface charge and potential, dielectric breakdown, conductivity, and permittivity. The application note can be downloaded at www.oxford-instruments.com/electrical-characterization.
Asylum Research AFMs are being used by leading researchers around the globe for characterizing nanoelectrical properties. A variety of their publications can be found at: https://www.oxford-instruments.com/businesses/nanotechnology-tools/asylum-research/landing-page/afm-tools-for-electrical-characterization
Not only do the dimensions of silicon-based devices keep shrinking to a few nanometers, but also next-generation processes with nanoscale components like nanotubes, graphene, and molecular building blocks are emerging. Understanding physical processes that control electrical behavior increasingly requires AFM measurements on smaller length scales. This application note is a great reference for scientists new to AFM as well as those currently working in the field.
Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher™ and MFP-3D™ AFM product lines span a wide range of performance and budgets. Asylum Research also offers its exclusive SurfRider™ AFM probes among a comprehensive selection of AFM probes, accessories, and consumables. Sales, applications and service offices are located in the United States, Germany, United Kingdom, Japan, France, India, China and Taiwan, with distributor offices in other global regions.