HVA150 – High Voltage Accessory for Jupiter XR, Large Sample Atomic Force Microscope

Oxford Instruments Asylum Research announces the release of the HVA150 – high voltage accessory for the Jupiter XR atomic force microscope (AFM). HVA150 expands the bias range that can be used during AFM experiments up to ±150 V, allowing for advanced AFM characterization of piezoelectric & ferroelectrics materials, 2D materials and thin films. “The HVA150 is quick to set-up, safe and the results are impressive. It is a great addition to the suite of accessories for the Jupiter XR AFM,” commented Dr. Jason Li, Applications Scientist manager at Oxford Instruments Asylum Research.

Image Credit: Asylum Research - An Oxford Instruments Company

Asylum Research AFMs are widely used across many different industrial and academic research fields including energy storage, polymers, semiconductors and 2D materials. The Jupiter XR is a large-sample AFM that can accommodate samples up to 200 millimeters in diameter and inspect areas up to 100×100 microns while still delivering ultra-high resolution and high throughput, with typical images requiring <1 minute to acquire.

Source: https://afm.oxinst.com/

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