Carl Zeiss SMT, a leading global provider of electron- and ion-beam imaging and analysis equipment, last night was honoured with a coveted R&D 100 Award for one of the 100 most technologically significant new products in 2007. R&D Magazine recognized Carl Zeiss SMT's newest Scanning Transmission Electron Microscope (STEM) for its ability to advance the field of materials science and research.
Using a unique combination of design features, this powerful, advanced version of the Carl Zeiss LIBRA 200 STEM enables scientists and researchers to analyze materials at the atomic level. Nanostructures can be viewed with imaging resolutions and analytical capabilities never before possible in one single instrument.
The 45th annual technology competition run by R&D Magazine evaluated entries from various companies and industry players, research organizations and universities around the world. The magazine's editors and a panel of outside experts served as judges, evaluating each entry in terms of its importance to the world of science and research.
According to Tim Studt, editor-in-chief of R&D Magazine, "winning an R&D 100 Award provides a mark of excellence known to industry, government, and academia as proof that the product is one of the most innovative ideas of the year. Our congratulations go out to Carl Zeiss SMT, an organization that is clearly a global leader in the creation of technology-based products that make a difference in how we live and work."
Daniel McGee, vice president sales and service for Carl Zeiss SMT, said, "Enabling the Nano-Age World is our purpose at Carl Zeiss SMT - a purpose that shapes everything we do. Having our efforts recognized by an industry-leading technical journal like R&D Magazine is a great honour for our organization and its efforts in fulfilling our commitment."
The awards presentation took place at Chicago's Navy Pier, and featured a public exhibition where the winning technologies could be examined and explored. Following an evening reception and awards dinner, the awards were presented during a formal ceremony.