With a new microscopy technique that uses blue light to measure electrons in semiconductors and other nanoscale materials, a team of Brown University researchers is opening a new realm of possibilities in the study of these critical components, which can help power devices like mobile phones and laptops.
TAGARNO, a leading provider of digital microscopes, has developed three simple questions to help customers pick the right microscope for their needs.
CrestOptics S.p.A., a manufacturer of high-end microscopy solutions and advanced systems for fluorescence microscopy and diagnostic applications, today announced the launch of its new spinning disk confocal microscope system, CICERO.
TAGARNO, a leading provider of digital microscopes, has developed a new ‘how to’ guide for implementing digital microscopes for soldering and PCB inspection.
This study is led by Prof. Dong Su (Institute of Physics, Chinese Academy of Sciences). Li ion imaging by transmission electron microscopy (TEM) is the “holy grail” in the study of Li ion battery (LIB) materials.
Recently, researchers at Ludwig-Maximilians-Universität München, Germany, have developed a super-resolution microscopy method that can rapidly differentiate molecular structures in 3D. This study is available in Light Science and Applications.
Just some years ago, a resolution limit in optical microscopy that appeared essential was broken, which resulted in the award of the Nobel Prize in Chemistry in 2014.
A recent study published in the Science Bulletin details the use of a highly sensitive scanning superconducting quantum interference device (SQUID) microscope to investigate the behavior of the ferromagnetic material ABC-stacked CrBr3 in the absence of a magnetic field.
The DOE Early Career Research Program Award allowed me to form a team of passionate scientists and engineers. Together we developed the novel synchrotron X-ray scanning tunneling microscopy (SX-STM) technique and constructed a one-of-a-kind microscope.
TAGARNO’s new FRONT digital microscopes solves a common problem for microscope operators: interference from nearby vibrations.