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Results 11 - 20 of 216 for Metrology
  • Nano-Positioning System Based On Motion Control via Magnetic Levitation
    Article - 15 Nov 2023
    This article talks about nanopositioning motion system based on magnetic levitation.
  • New Solutions in Semiconductor Metrology
    Article - 7 Nov 2023
    KLA Instruments™, a division of KLA Corporation, has expanded its defect inspection and metrology portfolio in 2023 to include new systems for semiconductor process development and control, including...
  • A New Home For Europe's Semiconductor Metrology
    Article - 2 Aug 2023
    We discuss a newly developed collaboration of Applied Materials and the Fraunhofer Institute for Photonic Microsystems IPMS to create the largest technology hub for semiconductor metrology in Europe.
  • How Do Quantum Metrology and Optical Metrology Compare?
    Article - 2 Aug 2023
    Metrology concerns the science of measurement and is used in every branch of science and technology. Here, we compare quantum metrology and optical metrology.
  • Market Report: Atomic Force Microscopy (AFM) in Nanoscience
    Article - 2 Aug 2023
    As of 2021, the global AFM market was estimated at a value of over $480 million, and is projected to reach $806 million by 2031.
  • Applications of Industrial Metrology
    Article - 17 Jul 2023
    Industrial metrology ensures the conformity and validity of production in any industry to meet global standards. This article demystifies the concept of industrial metrology and delves into its...
  • What is Metrology?
    Article - 20 Jun 2023
    This article provides an overview of metrology, exploring its historical roots, diverse techniques, and profound impact on shaping industries and enabling accuracy and precision in various fields.
  • Nanotechnology: Accelerating a Quantum Society
    Article - 11 May 2023
    This article delves into the latest developments in crucial areas of quantum research, leveraging the enabling capabilities of nanotechnology while providing insight into what the future holds.
  • Errors in Semiconductor Manufacturing
    Article - 22 Feb 2023
    In this article, the most common errors occurring at different stages of the semiconductor fabrication process and the strategies to mitigate them are discussed.
  • Taking Measurements at the Nanoscale with Optical Rulers
    Article - 6 Feb 2023
    The optical ruler is an electromagnetic analog of a traditional, physical ruler but the key difference is an optical ruler is capable of making measurements at the nanoscale.

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