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Results 91 - 100 of 1246 for Sample characterization
  • Nanolyse Technologies
    Supplier Profile
    Creating ground-breaking innovations in analytical science is our mission. Nanolyse creates simple, low-cost chemical measurement and testing sensor technologies to address global needs across...
  • Cambridge Innovation Consulting
    Supplier Profile
    With access to 10,000s of researchers at the world’s top universities, CamIn is able to match the clients’ specific needs with the right experts’ abilities. The Problem CamIn...
  • Talga Resources Limited
    Supplier Profile
    In a global resources environment where the choice of mineral commodity, project location, operational factors and the right management skill sets is increasingly borderless, Australian exploration...
  • FUJIFILM Dimatix
    Supplier Profile
    FUJIFILM Dimatix, Inc., the world's leading supplier of drop-on-demand inkjet printheads for industrial applications, is driving a revolution in inkjet technology to support a new generation of...
  • Queensgate Instruments Ltd
    Supplier Profile
    Queensgate Instruments was founded in 1979 and span out from a ground-breaking research programme at Imperial College, London. Queensgate Instruments quite literally "wrote the book" on...
  • Dept. of Chemistry, Michigan State University
    Supplier Profile
    Research in our group is at the crossroads of electrochemistry, material science and chemical analysis. The growth, characterization and application of electrically conducting diamond thin films...
  • Sigma Aldrich
    Supplier Profile
    Sigma-Aldrich® is a leading high-technology company. Through our Materials Chemistry Centers of Excellence in research and manufacturing we develop advanced, enabling materials for your...
  • Cheap Tubes Inc.
    Supplier Profile
    Located in Vermont, Cheap Tubes is a leading supplier of Carbon Nanotubes & Graphene products.  We will soon enter the Silver Nanowire and ITO alternative ink markets. Every order we receive...
  • Bruker Introduces Scanning Microwave Impedance Microscopy for Dimension Icon AFMs
    News - 18 May 2016
    PeakForce sMIM Mode Provides Enhanced Nanoscale Mapping of Permittivity and Conductivity Bruker’s Nano Surfaces Division today announced the release of scanning microwave impedance microscopy...
  • Gold Nanoparticles on Modified Glass Surface as Height Calibration Standard for Atomic Force Microscopy Operating in Contact and Tapping Mode
    Article - 11 Nov 2005
    A standard sample of gold colloids suitably immobilized on glass has been shown to be suitable for for Atomic Force Microscopy calibration at the nanoscale, operating in Contact Mode (CM) and Tapping...

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