Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy".
Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:
- Correction tools for creating the most accurate presentation of the "true" surface
- Automated analysis techniques assuring high accuracy, quality and cost efficiency
- Visualization and reporting tools enabling convincing and impressive communication of results
This mission is fulfilled by development of our main product the Scanning Probe Image Processor, SPIP™. SPIP™ supports a wide variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes and profilers.
Image Metrology is a highly innovative company constantly developing new solutions meeting the demands from our high-tech customers. Image Metrology is supplying its products directly to the end users or via our distribution network, and having an export rate of 98%.