Bruker today announced the release of the Dektak XTL Stylus Profiler, extending its industry-leading stylus profilometry capabilities to 200 and 300 millimeter semiconductor wafer fabs and next-generation touch panel manufacturers.
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The Nanoshell from Mantis Deposition is designed to aid in the production of core-shell nanoclusters. The ability to construct a shell of one element or compound around a core of another opens up a range of possibilities not accessible to simpler structures.
This webinar from Oxford Instruments Nanoanalysis will discuss the requirements and configurations for fast-acquisition in-situ EBSD experiments, for observations of phase transitions and other phenomena.
Carbon Design Innovations, Inc. (C|D|I), the leading manufacturer of carbon nanotube (CNT) probes for Atomic Force Microscopy (AFM), today announced its new Performance Family of CNT Probes for AFM imaging.
Asylum Research announces Scanning Microwave Impedance Microscopy (sMIM), an atomic force microscopy (AFM) technique that enables nanoscale mapping of permittivity and conductivity.
In this interview, Dr. Mark R. Munch, president of Bruker Nano Surfaces and Bruker MAT Group, talks to AZoNano about the strategy behind the recent acquisition of Prairie Technologies.
Dr. Sang-il Park, CEO and chairman of Park Systems, talks about the benefits of Park AFMs for industrial manufacturing and semiconductor failure analysis laboratories.
In this Insights from Industry interview, Samuel Halim, CEO and founder of Nanograde, talks to AZoNano about their custom nanoparticles and "off-the-shelf" nanoparticle inks for printed electronics.
Stephen Coulson, CTO of P2i, talks to AZoNano about the benefits of using liquid repellent coatings across a wide range of applications, especially mass produced electronic devices.
Kris Walker talks to Travis Earles from Lockheed Martin discussing future innovations within nanotechnology as well as the advanced research being undertaken at Lockheed Martin.
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