Product Showcase

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Optical Tweezers
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Particle Size Analyzers
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Photoluminescence Mapper
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Piezo Actuators
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Plasma Cleaning Systems
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Plasma Etching Systems
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Profilometers
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Raman Spectrometers
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Sample Preparation Equipment
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Scanning Electron Microscope (SEM) Accessories
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Scanning Electron Microscopes (SEM)
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Scanning Near-Field Optical Microscopes (SNOM)
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Scanning Probe Microscopes (SPM)
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Scratch Testers
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Separation Membranes
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Spectrofluorometers
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Spectrometers
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Spectrophotometers
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Spectroscopic Ellipsometers
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Sputtering Systems
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Surface Area Analyzers
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TEM Sample Holders and Supplies
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Thermal Analysis Equipment
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Thermal Desorption Equipment
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Thin Film and Coating Thickness Measurement Tools
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Thin-Film Deposition Systems
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Transmission Electron Microscopes
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Tribometers - Friction and Wear Testers
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Vibration Isolation Systems
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Wafer Bonders
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X-Ray Cameras
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X-Ray Diffractometers
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X-Ray Fluorescence Analyzers
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Zeta Potential Analyzers

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Featured Equipment

Scanning Electron Microscope - Agilent 8500 FE-SEM

The Agilent 8500 Field Emission Scanning Electron Microscope FE-SEM is a compact system that offers researchers a field emission scanning electron microscope that is easy to use and does not require special facilities. About the size of a laser printer, the 8500 FE-SEM provides convenient plug-and-play performance. No dedicated facilities are required, only an AC power outlet.

Nanosurf FlexAFM

For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of applications to be performed easily.

Zetasizer Nano ZS Particle Characterization System from Malvern

The Zetasizer Nano ZS brings you the practicality of a maintenance-free system with the versatility of multi-parameter measurements in a single compact unit.

Hiden Analytical SIMS Workstation with MAXIM Analyser

The Hiden SIMS Workstation has been developed with strong interaction with those used to performing SIMS analyses for both contract service work and research in many fields of analysis. The philosophy of design has been simple, to produce a proper SIMS analysis instrument which combines high sensitivity, flexibility and ease of operation, but also to make it cost effective both in terms of capital and ongoing costs.

Multimode Atomic Force Microscope (AFM) - Multimode 8 from Bruker

The MultiMode® 8 Atomic Force Microscope (AFM) from Bruker is everything you would expect from the extraordinary MultiMode microscope platform that has set the standard for high-resolution atomic force microscopy imaging for over 15 years. Now, the latest MultiMode 8 AFM system incorporates surprising new features and accessories that take the distinguished MultiMode Atomic Force Microscope platform to even higher levels of performance, speed, and ease of use.

CSM Instruments Nano Tribometer (NTR)

The CSM Nano Tribometer is a unique instrument since its low load range down to 50µN. This instrument can perform both the linear reciprocating and rotating mode. One outstanding feature of all the CSM Tribometers is that the experiment stops automatically when the coefficient of friction reaches a threshold value or when a specified number of turns are reached.

Desktop Scanning Electron Microscope (SEM) - G2 Pro from Phenom-World

Phenom-World is focused on giving you the opportunity to process ever-smaller samples and increase your productivity, while bringing down the costs of analysis. The Phenom G2 pro is the most effective, versatile and fastest desktop SEM available. Its unique design makes it suitable for use in a large variety of applications and markets.

TFS 500 Atomic Layer Deposition System from Beneq

The TFS 500 is an ALD system designed for use in thin film coating applications. The unit incorporates leading edge design and technical solutions that enable superior quality coatings and results. In Beneq, we have approached ALD tool design with an open mind and innovative spirit. Our goal is to develop new applications and business opportunities by combining experience with invention. The TFS 500, our initial reactor model, has proven its case as a versatile tool adaptable to both in-depth thin film research and robust batch processing.

Nanoeducator II Atomic Force Microscope (AFM) from NT-MDT

The NT-MDT Nanoeducator II is a semiprofessional atomic force microscope (AFM) system for training scientific laboratories both for investigation/problem solving and nanotechnology teaching.