Scanning Electron Microscope (SEM) Accessories RSS Feed - Scanning Electron Microscope (SEM) Accessories

Scanning electron microscopes or SEM's are microscopes that use a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. SEM's are one of the most versatile and widely used tools of modern science as they allow the study of both morphology and composition of biological and physical materials.
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5% Off SEM, TEM, FIB or Dual Beam
Equipment
Agar Scientific offers a wide range of SEM specimen stubs and mounts for Focused Ion Beam (FIB) applications. The stubs measure 12.5mm in diameter and 10mm in height, and are supplied individually.
Agar Scientific offers a range of calibration specimens for assessing the image quality of high resolution SEMs.
Agar Scientific offers latex particles for scanning electron microscope (SEM) calibration. Polystyrene latex particles are suitable for SEM calibration purposes. An internal standard of size can be obtained by mixing an appropriate concentration of these particles with the particles of unknown size being examined.
Agar Scientific offers standard grade grids that are available in gold, nickel, copper, or in copper with one side coated with palladium for identification purposes.
The OmniGIS™ is Omniprobe's new multiple gas injection system for the FIB or SEM. It provides programmable feedback control of three on-board gas sources and an additional external purge/carrier gas source while occupying only a single GIS port! The user can create and recall complex process flows.
The SC7620 from Quorum Technologies is an economic, compact sputter coater for SEM samples. In combination with the optional carbon attachment SC7620-CF, it makes an ideal low-cost SEM sputtering and carbon coating system package.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.
The external Short-Cut™ tool is an important component of the AutoProbe™ 300 integrated solution. The Short-Cut™ accomplishes fast and easy ex-situ attachment of the lift-out sample to a TEM grid. This step greatly improves FIB utilization since the former in-situ grid attach step is eliminated. The Short-Cut™ ex-situ sample attach process is simple and reliable.
Omniprobe was the first company to offer tools specifically tailored for TEM sample preparation inside the FIB and drove the revolutionary process now known as in-situ lift-out across the industry. Two Sample Transfer Systems are offered by Omniprobe. The Sensitive Sample Transfer (SST) is an integrated system used to transfer environmentally sensitive samples from the FIB to any other analytical instrument. The Generic Load Lock (GLL™) is an integrated system used to transfer samples into and out of the FIB or SEM.
Agar Scientific offers a series of compact vacuum coating systems that provide a wide range of options to suit all sputter coating requirements needed in TEM and SEM applications. Built to high specification, these bench-top coating systems integrate microprocessor technology.
The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.
The Quorum Q300TD is a free-standing, fully automatic sputter coater ideal for thin film applications and for conductive coating of scanning electron microscopy (SEM) specimens.
Agar Scientific offers a complete range of nano tool systems that can be incorporated into most SEMs and FIBs available in the market.
The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM.
The AutoProbe™ 200 is Omniprobe's most popular nano-manipulator system. It is a fully automated, multi-purpose nano-positioning system capable of in-situ lift-out, electrical measurements, nano-mechanical testing and charge neutralization in the FIB, Auger or SEM. The computer controlled system offers high throughput, high accuracy (100nm standard, 10nm optional) and a field-proven excellent success rate for all tasks.
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