Scanning Electron Microscope (SEM) Accessories RSS Feed - Scanning Electron Microscope (SEM) Accessories

Scanning electron microscopes or SEM's are microscopes that use a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. SEM's are one of the most versatile and widely used tools of modern science as they allow the study of both morphology and composition of biological and physical materials.
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Teneo VS™ SEM is a novel Serial Block Face Imaging solution that combines mechanical sectioning with virtual sectioning using FEI's proprietary Multi-Energy Deconvolution to facilitate automated acquisition of large sample volumes at isotropic resolution.
Agar Scientific offers a complete range of nano tool systems that can be incorporated into most SEMs and FIBs available in the market.
The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM.
Agar Scientific offers a range of calibration specimens for assessing the image quality of high resolution SEMs.
Agar Scientific offers a wide range of SEM specimen stubs and mounts for Focused Ion Beam (FIB) applications. The stubs measure 12.5mm in diameter and 10mm in height, and are supplied individually.
The Phenom XL is a compact scanning electron microscope (SEM) that provides the same ease-of-use and fast time-to-image features as other Phenom systems. The system includes a chamber that aids in analyzing large samples of up to 100x 100mm.
The SC7620 from Quorum Technologies is an economic, compact sputter coater for SEM samples. In combination with the optional carbon attachment SC7620-CF, it makes an ideal low-cost SEM sputtering and carbon coating system package.
Imina Technologies offers Nanoprobing, a unique SEM accessory package developed for nanomanipulation and characterization of electrical devices and sophisticated materials at the nanometer scale.
The PP3006 CoolLok is a device capable of providing fast transfer and cryo temperature observation of specimens for FIB/SEM, SEM, beamline or other vacuum units.
The remarkably compact Keysight 8500B field-emission scanning electron microscope (FE-SEM) has been optimized for low-voltage imaging, extremely high surface contrast, and resolution.
The Vulcan Cathodoluminescence Detector is designed for nano-scale characterization of luminescence properties of materials. It is used in the transmission electron microscope for collecting, detecting and analyzing cathodoluminescence.
The miBot™ BT-11 from Imina Technologies is the world’s smallest nanometer resolution manipulator available on the market.
The Quorum Q300TD is a free-standing, fully automatic sputter coater ideal for thin film applications and for conductive coating of scanning electron microscopy (SEM) specimens.
Agar Scientific offers a series of compact vacuum coating systems that provide a wide range of options to suit all sputter coating requirements needed in TEM and SEM applications. Built to high specification, these bench-top coating systems integrate microprocessor technology.
Gatan’s in-situ heating and tensile testing stages enable dynamic microstructural observations, and provide a better understanding of materials research.
The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.
Agar Scientific offers latex particles for scanning electron microscope (SEM) calibration. Polystyrene latex particles are suitable for SEM calibration purposes. An internal standard of size can be obtained by mixing an appropriate concentration of these particles with the particles of unknown size being examined.
Agar Scientific offers standard grade grids that are available in gold, nickel, copper, or in copper with one side coated with palladium for identification purposes.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.