Scanning Electron Microscope (SEM) Accessories RSS Feed - Scanning Electron Microscope (SEM) Accessories

Scanning electron microscopes or SEM's are microscopes that use a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. SEM's are one of the most versatile and widely used tools of modern science as they allow the study of both morphology and composition of biological and physical materials.
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The Quorum Q300TD is a free-standing, fully automatic sputter coater ideal for thin film applications and for conductive coating of scanning electron microscopy (SEM) specimens.
Agar Scientific offers a range of calibration specimens for assessing the image quality of high resolution SEMs.
Agar Scientific offers a complete range of nano tool systems that can be incorporated into most SEMs and FIBs available in the market.
Agar Scientific offers a series of compact vacuum coating systems that provide a wide range of options to suit all sputter coating requirements needed in TEM and SEM applications. Built to high specification, these bench-top coating systems integrate microprocessor technology.
Agar Scientific offers latex particles for scanning electron microscope (SEM) calibration. Polystyrene latex particles are suitable for SEM calibration purposes. An internal standard of size can be obtained by mixing an appropriate concentration of these particles with the particles of unknown size being examined.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.
The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.
Agar Scientific offers a wide range of SEM specimen stubs and mounts for Focused Ion Beam (FIB) applications. The stubs measure 12.5mm in diameter and 10mm in height, and are supplied individually.
The SC7620 from Quorum Technologies is an economic, compact sputter coater for SEM samples. In combination with the optional carbon attachment SC7620-CF, it makes an ideal low-cost SEM sputtering and carbon coating system package.
Agar Scientific offers standard grade grids that are available in gold, nickel, copper, or in copper with one side coated with palladium for identification purposes.
The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM.