Scanning Electron Microscope (SEM) Accessories

Scanning electron microscopes or SEM's are microscopes that use a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. SEM's are one of the most versatile and widely used tools of modern science as they allow the study of both morphology and composition of biological and physical materials.

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Equipment

Cryo-SEM Preparation System - The PP3010T from Quorum Technologies

The PP3010T is a highly automated, easy to use, column-mounted, gas-cooled cryo preparation system suitable for most makes and models of SEM, FE-SEM and FIB/SEM.

SST™ and GLL™ Sample Transfer Systems from Omniprobe

Omniprobe was the first company to offer tools specifically tailored for TEM sample preparation inside the FIB and drove the revolutionary process now known as in-situ lift-out across the industry. Two Sample Transfer Systems are offered by Omniprobe. The Sensitive Sample Transfer (SST) is an integrated system used to transfer environmentally sensitive samples from the FIB to any other analytical instrument. The Generic Load Lock (GLL™) is an integrated system used to transfer samples into and out of the FIB or SEM.

AutoProbe 200 Nano-Manipulator System from Omniprobe

The AutoProbe™ 200 is Omniprobe's most popular nano-manipulator system. It is a fully automated, multi-purpose nano-positioning system capable of in-situ lift-out, electrical measurements, nano-mechanical testing and charge neutralization in the FIB, Auger or SEM. The computer controlled system offers high throughput, high accuracy (100nm standard, 10nm optional) and a field-proven excellent success rate for all tasks.

ShortCut™ Sample Preparation System from Omniprobe

The external Short-Cut™ tool is an important component of the AutoProbe™ 300 integrated solution. The Short-Cut™ accomplishes fast and easy ex-situ attachment of the lift-out sample to a TEM grid. This step greatly improves FIB utilization since the former in-situ grid attach step is eliminated. The Short-Cut™ ex-situ sample attach process is simple and reliable.

Combined AFM-SEM-FIB System from Nanonics Imaging

For the first time ever, Nanonics Imaging Ltd. in its drive for integrated microscopic solutions has now been able to fully and transparently integrate atomic force microscopy (AFM) and scanning electron microscopy (SEM).

OmniGIS Gas Injection System from Omniprobe

The OmniGIS™ is Omniprobe's new multiple gas injection system for the FIB or SEM. It provides programmable feedback control of three on-board gas sources and an additional external purge/carrier gas source while occupying only a single GIS port! The user can create and recall complex process flows.

SEM-Raman System from Renishaw

The Renishaw structural and chemical analyser (SCA) unites two well-established technologies, scanning electron microscopy (SEM) and Raman spectroscopy, resulting in a powerful and unique technique which allows morphological, elemental, chemical, physical, and electronic analysis without moving the sample between instruments.

Nanosurf & Kleindiek AFM for SEM - Combined Scanning Electron and Atomic Force Microscopy

A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.