Featured Nanotechnology Videos
Professor Phillip Withers from the University of Manchester talks to AZo.TV about the latest technology within the school of Materials Science. Along with Ali Golinia, Research Fellow & Experimental Officer, they discuss their new Titan S/TEM with ChemiSTEM Technology.
Nicholas Randall from CSM Instruments introduces us to their latest nanotribometer which is a compact desktop model featuring improved applied load and tangential force sensors. It is suited to study tribology at the nanoscale.
An animated video to explain why graphene matters from Bluestone Global Tech
An demonstration of the new NanoTest Vantage by Micro Materials Ltd. This video demonstrates the many advantages the Vantage system offers, including a complete range of nanomechanical and nanotribological tests in one flexible and user friendly instrument.
This great webinar by Professor Alexander Kotlyar from Tel Aviv University discusses the use of AFM techniques to analyze the structure of DNA and related structures.
Curt Marcott from Light Light Solutions tells us how the NanoIR from Anasys Instruments has opened up new possibilities in materials characterization. Combining AFM and IR spectroscopy provides spatial resolution an order of magnitude better than conventional IR, which enables researchers to do such things as examine nanoparticles in a matrix, or analyze for compositions differences across in interface.
Ben Garland from Zeta Instruments demonstrates their Zeta-20 Optical Profilometer which can measure surface and textural properties of materials such as solar cells, microfluidics, biologicals etc. It does this by taking image slices and creating a composite 3-D image featuring real color. Their software package allows easy analysis of surface features and the ability to produce statistical analyses.
Asylum Research introduced the Cypher AFM two years ago. They have now added a new technique called Electrochemical Strain Microscopy to its list of capabilities. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique can be used to characterize electrochemical phenomena at the nanoscale and Roger Proksch from Asylum Research demonstrates how the system produces data and its relevance to the field of battery materials.
The DME BRR microscope makes it possible to investigate surfaces of places one can never find with a conventional AFM + optical microscope combination.
Hartmut Statler from Bruker Nano Surfaces demonstrates the capabilities of the Dimension FastScan, with image refresh rates up to one frame per second or more.
The CETR-Apex system from Bruker is a nanomechanical testing system that features easily interchangeable heads allowing it to be able to used as a nano or micro indentation system. It also incorporates an optical microscope and atomic force microscope (AFM).
Nanotechnology instrument manufacturer Izon Science has released the first commercially available method to simultaneously measure the charge and size of nano- and submicron particles on a particle by particle basis.
An introduction to the new NanoTest Vantage by Micro Materials Ltd. Presented by Denise Hoban, this video demonstrates the many advantages the Vantage system offers, including a complete range of nanomechanical and nanotribological tests in one flexible and user friendly instrument.
Bruker's UMT Universal Mechanical Tester. The UMT is the "complete tribology lab" and provides macro, micro and nanoscale tests under real-world conditions. Talking to Bruker's Steve Shaffer and University of Sheffield's Mark Rainforth, they discuss the ease of use and the typical applications of the UMT.
In this video Stephan Boehm, Project Manager, Micro-XRF for SEM, Bruker Nano talks about the XTrace Micro-Spot X-Ray Source.
Thermo Scientific have launched the NanoDrop Lite, the smaller version of the NanoDrop 2000 system. The system uses a UV-Vis spectrophotomer is used for the quantification of nucleic acids, DNA/RNA samples, proteins etc.
Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.
On May 22nd 2013 - AZo.TV attended the Tribology and Mechanical Testing Workshop by Bruker Nano-Surfaces at the University of Sheffield. Taking part in workshops and seminars with such experts as Steve Shaffer, PhD - senior applications scientist.
Julie Chen from Malvern Instruments gives us a tour of the new Mastersizer 3000 particle size analyzer. She outlines the upgrades from the previous generation Mastersizer 2000.
This video clip, captured with Asylum's Cypher AFM, shows loosely bound molecules of bacteriorhodopsin moving around on a crystal surface.
In this video Wayne Buttermore, Central Regions Sales Manager at Leica Systems talks about the ergonomy of Leica cameras.
David Lewis from Nanonics Imaging Ltd shows us their Multiview Series of AFM/Raman systems that can be supplied with Renishaw or Horiba Raman systems. Nanonics can also supply the Multiview systems as upgrades to existing Raman systems of total systems.
John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM. This instruments' claim to fame is that it is the fastest AFM on the market. It's speed and ability to scan samples at a rapid rate without sacrificing resolution, combined with 300mm sample chuck, make it ideally suited production environments.
As has been their tradition, NT-MDT have launched another new product at the MRS Fall Meeting held in Boston. This year they launched the SOLVER Nano AFM (atomic force microscope).
The EM TIC 3X Milling System surpasses conventional slope cutting instruments. It can mill at high rates, cut broad and deep into the sample, and create smooth surfaces resulting in high-quality cross-sections of almost any material, quickly and easily.