Nanotechnology Videos

Featured Nanotechnology Videos

Future Applications for Dip Pen Nanolithography (DPN)

This article looks at the future applications for DPN, Dip Pen Nanolithography

Diagnostic Imaging

Nanoparticles are being developed for diagnostic imaging, for the early detection of neurological disease, cardiovascular disease and cancer. The technology is based upon contrast nanoparticles which can be metallic, magnetic or polymeric in nature. These particles can be functionalised with a biological targeting agent such as an antibody and are generally between 10 and 100 nm in diameter.

Electron Microscope So Easy to Use a Child Could Do It

The Phenom from FEI is a high resolution desktop imaging tool with an optical camera for never-lost navigation and a high quality electron microscope for detailed imaging. Its innovative user interface and intuitive touch screen control produce superb quality images with minimal operator training. The video presentation perfectly illustrates the ease of use with young school children being given the chance to operate the microscope themselves and investigate the world of the supersmall.

Molecular Binding - Farfield Group Video Illustrating Measurement Capabilities of DPI Technology

This video shows the binding of Immunoglobulin G (IgG) protein molecules to BS3 adhering to the surface of an optical chip and the subsequent binding of another protein to the antigen binding sites on the arms of each IgG molecule. This is an excerpt from a video that iemedia solutions produced for the Scientific Instrumentation Division of the Farfield Group to illustrate the measurement capabilities of their Dual Polarisation Interferometry technology.

The Phenom - World's Fastest Desktop Electron Microscope

Introducing the new Phenom benchtop electron microscope from FEI. With today's industry requiring higher quality control and speed, the Phenom can produce high resolution images from submicron to nanoscale in seconds. It as easy as using a digital camera.

Racetrack Memory - How It Works and What are Its Benefits

Dr. Stuart Parkin from the IBM Almaden Research Center tells us about a new type of memory that is theoretically about a million times faster than current hard disk technologies, with very fast access times, but at the same time very cheap to produce, along with many of the benefits of solid state memory. Called racetrack memory, it uses nanowires and spintronics.

The AFM+ Platform from Anasys Instruments

At this year's MRS Fall meeting Anasys Instruments displayed their new AFM+ platform that combines an atomic force microscope and thermal analysis capabilities. This platform was designed to be upgraded to their NanoIR spec at a later date.

Formation of Lipid Bilayer - A Video by Farfield Group

This video shows the deposition of liposomes on to the surface of an optical chip and their subsequent rupture and merger to form a lipid bilayer. Protein molecules then embed and float in the surface of the bilayer. This is an excerpt from a video that iemedia solutions produced for the Scientific Instrumentation Division of the Farfield Group to illustrate the measurement capabilities of their Dual Polarisation Interferometry technology.

LM20 Nanoparticle Analysis System from Nanosight

Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system

Get Read, Publish with Springer

Claudia Barzen from Springer is encouraging potential authors not only publish journal articles, but also books. Springer has launched initiative to ensure books reach the widest possible audience. They are doing this by using 3 channels: the classical book, electronic books and; MyCopy

The NanoIR - AFM/IR Spectroscopy System from Anasys Instruments

Kevin Kjoller from Anasys Instruments shows us their NanoIR system which is a unique instrument that combines AFM and IR Spectroscopy. Kevin explains how the system works, how they have been able to integrate an atomic force microscope and infrared spectroscope to provide topographical, mechanical, thermal and chemical information.

The OmegaScope AFM-Raman from AIST-NT

AIST-NT's Alexander Yalovenko shows us their OmegaScope AFM-Raman instrument. Based on their proven fast scanning Smart-SPM, The OmegaScope includes either single or 3 laser Raman capabilities that can access the sample from the top or side. The OmegaScope alsoe featured objectiove lenses up 100x magnification.

eXplorer Personal Scanning Electron Microscope (PSEM) from Aspex Corp - Features and Applications

Aspex Corp's Tim Drake takes a few minutes to point out the the key features of their Personal Scanning Electron Microscope, PSEM eXplorer, which is an integrated SEM/EDX system designed for rapid automated particle analysis. Some of the main features include large sample chamber and silicon drift detector.

Nanotribometer from CSM Instruments - Features and Applications

Nicholas Randall from CSM Instruments introduces us to their latest nanotribometer which is a compact desktop model featuring improved applied load and tangential force sensors. It is suited to study tribology at the nanoscale.

Pulmonary Nanoparticle Delivery

A pulmonary delivery device, based on surface acoustic wave technology, is being developed for the delivery of drugs such as insulin, in the form of a liquid aerosol.

Researchers Using Nanoink's DPN Technology to Create New Materials

Researchers at Texas A&M University talk about how they are using Nanoink's Dip Pen Nanolithography (DPN) technology to create new materials and its vast potential to achieve what was previously impossible. They outline a new technology whereby DPN can be used to detect explosives.

Micro X-Ray Fluorescence (XRF) Product Range from Bruker AXS

Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments. He shows us 3 instruments that vary in chamber size, with the largest able to take samples 30cm in diameter and offering vacuum analysis and a motorized stage for line scans and area analysis.

The NTEGRA Life AFM for Biological Research Applications from NT-MDT

Stanislav Leesment from NT-MDT shows us their recently released NTEGRA Life AFM System. The system has been designed for biological research applications and includes an AFM mounted on an inverted microscope. Images can be obtained by both methods simultaneously.

The NHT2 Nanoindentation Tester and AFM from CSM Instruments

Nicholas Randall from CSM Instruments shows us the NHT2 Nanoindentation tester which combines a nanoindenter and AFM in one compact, affordable desktop unit. The unit has been re-designed and now features liquid compatibility, a wider load range and multi sample capability. It also does away with the need for an optical microscope by using two video cameras, proving a side view and a top view.

How Dip Pen Nanolithography (DPN) Works

How Dip Pen Nanolithography works

Asylum Research's Family of Atomic Force Microscopes (AFM)

A video clip from Asylum Research on their family of AFMs (atomic force microscopes). This briefly outlines their range of instruments and includes their latest addition the Cypher, which provides the most advanced AFM produced in the last decade.

The Dimension V AFM/Nanomechanical Tester from Veeco - Key Features and Operation

The Dimension V from Veeco combines an atomic force microscope (AFM) with a nanomechanical tester. This is achieved using a specifically designed probe. It is able to measure properties such as stiffness, adhesion and energy dissipation as well as provide the imaging capabilities of an AFM.

DT1200 Axoustic Spectrometer from Horiba - Features and Applications

The DT-1200 Acoustic & ElectroAcoustic Spectrometer characterizes both particle size and zeta potential of concentrated suspensions. The measuring chamber of the DT-1200 contains both acoustic and electroacoustic sensors.

Microanalysis Demonstration of X-Max Silicon Drift Detector SDD by Oxford Instruments

An instructional video illustrating the amazing results now achieveable with the X-Max SDD detector. The latest Oxford Instruments' energy dispersive x-ray spectrometer.

Electrochemical Strain Microscopy and the Cypher AFM from Asylum Research

Asylum Research introduced the Cypher AFM two years ago. They have now added a new technique called Electrochemical Strain Microscopy to its list of capabilities. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique can be used to characterize electrochemical phenomena at the nanoscale and Roger Proksch from Asylum Research demonstrates how the system produces data and its relevance to the field of battery materials.

Nanosurf easyScan2 FlexAFM - Introduction and Demonstration

Ola Modinger from Nanosurf gives us and introduction to the their easyScan2 FlexAFM that was released at the 2008 MRS Fall Meeting, where this interview was recorded. We then get a demonstration of how easy this instrument is to operate.

Tour of the SOLVER NEXT SPM from NT-MDT

Nikolay Novozhilov from NT-MDT takes us for a tour of their SOLVER NEXT AFM/SPM. he shows us how easy it is to change from AFM to SPM, as well as demonstrating the software control system and how easy it is to scan a sample.

Transdermal Delivery

A MicroArray Patch technology is being developed for the transdermal delivery of large molecule drugs, without the use of injections.

The Beneq TFS 200 Thin Film System for Atomic Layer Deposition (ALD)

The Beneq TFS 200 Thin Film System for atomic layer deposition (ALD) is the most flexible and upgradable ALD system on the market. Some of its features include:

The NX10 AFM from Park Systems - The World's Most Accurate Atomic Force Microscope

Mark Cyffka from Park Systems shows us their all new NX10 AFM (atomic force microscope) which went on show for the first time at the 2011 MRS Fall Meeting in Boston. The NX10 is the most accurate AFM in the world and Mark points out the main features that have contributed to this.

alpha300 Raman/AFM/SNOM from WITec - Features and Applications

The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.

Capabilities and Key Features of the Park Systems XE-NSOM AFM

The key features and capabilities of the Park Systems XE-NSOM, atomic force microscope incorporating near-field scanning optical microscopy are demonstrated and a details explanation of its operation is provided.

The Veeco Bioscope Catalyst - AFM with Inverted Optical Microscope

Mickael Febvre from Veeco takes us for a tour of the Bioscope Catalyst, which is an atomic force microscope with an inverted optical microscope. The system is suited to biological applications.

The Dimension Fastscan from Bruker - The Fastest AFM on the Market

John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM. This instruments' claim to fame is that it is the fastest AFM on the market. It's speed and ability to scan samples at a rapid rate without sacrificing resolution, combined with 300mm sample chuck, make it ideally suited production environments.

The Accusizer 780 Laser Diffraction Particle Size Analyzer from Agilent Technologies

The Agilent Technologies AccuSizer 780 is a laser diffraction particle size analyzer that measures the size of individual particle to produce high accuracy particle size distributions

The DPN5000 Dip Pen Nanolithography System from Nanoink - Features and Applications

The DPN5000 is aimed at researchers and developers. It can use up to 55,000 tips to write over an area of 1 square centimeter. It also includes full AFM capabilities and incorporates a completely new scanner design compared to previous models and comes in an environmental chamber.

The Veeco Dimension Icon Atomic Force Microscope

Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres.

PANalytical AXIOS X-Ray Fluorescence (XRF) Spectrometer - Features and Applications

David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.

The Multiview AFM/Raman System from Nanonics Imaging

David Lewis from Nanonics Imaging Ltd shows us their Multiview Series of AFM/Raman systems that can be supplied with Renishaw or Horiba Raman systems. Nanonics can also supply the Multiview systems as upgrades to existing Raman systems of total systems.

The Smart SPM/AFM from AIST-NT - Ease of Use Demonstration

Marshall Bates and Andrey Krayev from AIST-NT demonstrate the ease of use of the AIST SmartSPM/AFM. From loading a sample to starting to take measurements can be completed in 1-2 minutes, at atomic resolutions

The NLP2000 Dip Pen Nanolithography System from Nanoink - Features

Tom Levesque from Nanoink takes us for a tour of the latest dip pen nanolithography system from Nanoink. The NLP2000 was launched at Pittcon 2009.

The SOLVER Nano Atomic Force microscope from NT-MDT

As has been their tradition, NT-MDT have launched another new product at the MRS Fall Meeting held in Boston. This year they launched the SOLVER Nano AFM (atomic force microscope).

New Zetasizer Product Range from Malvern Instruments

The Zetasizer range uses light scattering techniques to measure hydrodynamic size, zeta potential and molecular weight of proteins and nanoparticles.

Key Features of easyScan2 FlexAFM from Nanosurf

Ola Modinger from Nanosurf points out some of the key features of their easyScan2 FlexAFM that was released at the 2008 MRS Fall Meeting, where this interview was recorded.

Demonstration of ContourGT Optical Profiler with AcuityXR Technology from Bruker

Chris Orsulak from Bruker shows us the ContourGT Optical Profiler, which is a white light interferometric optical profiler. He indicates the main features of the system and briefly explains the operating principal. He also demonstrates how fast the system can take produce results and how the new AcuityXR measurement mode (introduced at the 2010 MRS Fall Meeting) can produce improved results due to the increased lateral resolution.

Customised Nanoparticles and Dispersions from Nanograde

If you are looking for nanoparticles or nanoparticle dispersions to suit a particular requirement, you should consider speaking to Sam Halim, CEO of Nanograde. As you will see in this interview, they can prepare customised nanomaterials to your specifications and ship them wherever you are in the world

Horiba SZ-100 Nanoparticle Characterization System

The brand new SZ-100, nanoparticle size analyzer/characterization system was on show at Pittcon 2011. Mark Bumiller from Horiba introduces us to the latest addition to their particle size analyzer lineup.

Malvern Instruments Zetasizer Nano Particle Characterization System

Ulf Nobbmann from Malvern Instruments shows us through the Zetasizer Nano, which uses dynamic light scattering to determine particle size, as well as being able to determine zeta potential.

VESTA Localized Thermal Analysis System from Anasys Instruments - Video Demonstration

Kevin Kjoller, Vice President of Product Development at Anasys Instruments demonstrates how easy the VESTA localized thermal analysis system is to use.

The New LensAFM from Nanosurf - For Optical Microscopes and Profilers

David Faddis from Nanosurf takes us for a tour of their new LensAFM. The LensAFM has been designed for users who want to add extra capabilities to their optical microscopes and profilers and is easily adaptable to these systems. Switching between AFM and optical microscopy/profiler modes is easy as is demonstrated in this video.

The CSM TTX Table Top Nanoindentation Tester - Operation and Applications

The TTX Table Top Nanoindentation Tester from CSM Instruments is a compamct desktop nanoindenation tester. It is a simplified device suited to quality control in industrial applications and retails for under $100k.

Delong America's LVEM5 Benchtop TEM

Jared Lapkovsky from Delong America shows us the LVEM5, which is the only benchtop TEM on the market. Further increasing its versatility, it can also be used as a benchtop FE-SEM, an STM and an optical microscope. The user can easily access each modes using the software.

The FluidFM by Nanosurf

The FluidFM is a new product from Nanosurf based on their Flex AFM system. It is a new technology designed for life science and pharmaceutical applications. It uses nanofluidic cantilevers with a channel, which allows the user to to extract or inject fluids.

Neos AFM from Bruker AXS - Features and Applications

The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up. The combination of the NANOS AFM / SPM and a high power optical microscope on a highly rigid granite stand makes the N8 NEOS a highly effective and exceptionally versatile inspection system.

NeoScope JCM-5000 Benchtop Scanning Electron Microscope (SEM) from JEOL

Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.

The IBIS Nanoindentation System from Fischer-Cripps Laboratories

Tony Fischer-Cripps explains what nanoindentation is and shows us the IBIS Nanoindentation system. During the explanation of the technique he also talks about typical applications such as testing of coatings, scratch testing, mineral analysis and semiconductor testing. It can determine such properties as friction co-efficients, Young's modulus and properties of thin films.

The Asylum Cypher High Resolution AFM - Key Features

You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher(TM) AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with striking ease of use.

Mountains Map 6 Software for Texture and Roughness Analysis from Digital Surf

Digital Surf have released the latest version of the texture and roughness analysis software, Mountains Map 6. This software package is suited to instruments such as optical profilometers, confocal microscopes, scanning probe and atomic force microscopes and can deal with samples as large as automotive panels down to AFM size of just a few microns. The latest version of Mountain Map has new features such as phase overlay and 64-bit compatibility for accelerated analysis.

Materials Characterization with the NanoIR from Analsys Instruments

Curt Marcott from Light Light Solutions tells us how the NanoIR from Anasys Instruments has opened up new possibilities in materials characterization. Combining AFM and IR spectroscopy provides spatial resolution an order of magnitude better than conventional IR, which enables researchers to do such things as examine nanoparticles in a matrix, or analyze for compositions differences across in interface.

The Bruker Innova-IRIS AFM-Raman System

Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste. This instrument combines the Bruker AFM platform with Renishaw's raman confocal microscope and allows the user to correlate chemical and topographical information at the same time.

Introduction and Demonstration of the XE-70 Research AFM from Park Systems

Joe McGuire, Director of National Sales for Park Systems introduces us to the XE-70 Research AFM. He outlines the key features and attributes of this atomic force microscope, including hardware and software

Malvern Instruments Morphologi G3 Particle Characterization System - Features and Demonstration

Janie Dubois from Malvern Instruments takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.

Agilent G200 Nano Indenter - Features and Capabilities

Nano Indenter G200 is the most advanced platform for exploring material properties at the nano and micro scales. Its state of the art motion system speeds sample throughput without sacrificing accuracy. It also conforms to ISO 14577 - 1, 2 & 3; delivering confidence in test accuracy and repeatability.

Perfusate pH Changes from Acidic to Alkaline Triggering Conformational Change in BSA - A Video by Farfield Group

This video shows Bovine Serum Albumin (BSA) molecules binding to BS3 molecules adhering to the surface of an optical chip. The BSA molecules then undergo a conformational change as the pH of the perfusate changes from acid to alkaline. This is an excerpt from a video that iemedia solutions produced for the Scientific Instrumentation Division of the Farfield Group to illustrate the measurement capabilities of their Dual Polarisation Interferometry technology.