Atomic Force Microscopes Videos

Atomic Force Microscopes Videos
Dr Mark Munch, President of Bruker Nano Surfaces, talks to Will Soutter about the challenges and opportunities for AFM research at the Seeing at the Nanoscale event in Bristol.
Point defects on calcite, imaged in water by the Cypher AFM from Asylum Research.
This video presentation discusses about the powerful diversity of the AFM (atomic force microscopy) probe from Bruker Nano Surfaces.
This video (Part 2 of 3) shows the software user interface of the TT-AFM from AFM Workshop.
In this demonstration the Cypher AFM from Asylum Research scans a sample of Celgard which is used as a battery separator. This material is best scanned in tapping mode due to its fibrous/porous, irregular surface.
High aspect ratio AFM tips allow investigation of deep trenches or holes. Anyway, investigating such structures is very challenging for the AFM as well as for the tip, because the Z axis of the AFM needs to react very fast in order not to cause any tip damages. This video shows an example of scanning a structure with deep holes using a NanoWorld AR5-NCHR tip.
This video shows the Dimension Edge atomic force microscope (AFM) system from Bruker AXS. This AFM provides the highest levels of functionality, performance, accessibility and attainability by incorporating the company's latest technology.
The CETR-Apex system from Bruker is a nanomechanical testing system that features easily interchangeable heads allowing it to be able to used as a nano or micro indentation system. It also incorporates an optical microscope and atomic force microscope (AFM).
This video (Part 3 of 3) provides a demonstration of the TT-AFM from AFM Workshop. It shows the entire process from loading a sample to obtaining results.
This video shows the time-lapse AFM (atomic force microscopy) images of DOPC/DPPC (dioleoylphosphatidylcholine/dipalmitoylphosphatidylcholine) supported planar lipid bilayers.
This video shows the application of Dimension FastScan Bio™ Atomic Force Microscope (AFM) from Bruker Nano.
Digital Surf have released the latest version of the texture and roughness analysis software, Mountains Map 6. This software package is suited to instruments such as optical profilometers, confocal microscopes, scanning probe and atomic force microscopes and can deal with samples as large as automotive panels down to AFM size of just a few microns. The latest version of Mountain Map has new features such as phase overlay and 64-bit compatibility for accelerated analysis.
This video shows a 2 µm x 2 µm, 512 pixel x 512 pixel image of Polysilicon obtained using Bruker’s Dimension FastScan atomic force microscope (AFM).
Curt Marcott from Light Light Solutions tells us about recently introduced polarization control technology that is available on the nanoIR system from Anasys Instruments. While nanoIR technology, a combination if IR spectroscopy and AFM extends the limits of IR spectroscopy, polarization control technology provides information about molecular orientation.
The new "Shuttle & Find" solution from Carl Zeiss is a correlative interface for light (LM) and electron (EM) microscopes for use in materials analysis. It consists of specially designed sample holders, adapter and AxioVision based correlative software modules.
Claudia Barzen from Springer is encouraging potential authors not only publish journal articles, but also books. Springer has launched initiative to ensure books reach the widest possible audience. They are doing this by using 3 channels: the classical book, electronic books and; MyCopy
David Faddis from Nanosurf shows us through the FlexAFM, a full featured atomic force microscope designed for research applications. It features a modular design and flexure stage which minimizes background movement. The design also includes a decoupled z-piezo and a unique interchangeable nose cone allowing it to be used in either air or liquid media for biological samples.
Fabrication of a quantum dot by writing oxide lines on a semiconductor heterostructure, using the tip of an atomic force microscope.
This video clip, captured with Asylum's Cypher AFM, shows loosely bound molecules of bacteriorhodopsin moving around on a crystal surface.
This exclusive video features a presentation about the latest advances in atomic force microscopy (AFM)-based nanoscale thermal analysis. Quantitative nanoscale property information of polymer-based samples with statistically meaningful sampling can be provided using the AFM.
The FluidFM is a new product from Nanosurf based on their Flex AFM system. It is a new technology designed for life science and pharmaceutical applications. It uses nanofluidic cantilevers with a channel, which allows the user to to extract or inject fluids.
This video describes the components and working of FlexAFM System from Nanosurf.
This video describes the Nano Letters paper on the high speed atomic force miscroscopy (AFM) imaging and mechanical mapping of purple-membrane (bacteriorhodopsin) with Bruker’s Dimension FastScan and ultra low amplitude Peak Force Tapping.
In this video David Faddis from Nanosurf shows the FluidFM System. This system is a powerful new tool that combines nanofluidics and AFM.
This webinar illustrates how nano surfaces solutions from Bruker combine to meet high-brightness light emitting diode (HB-LED) metrology capabilities in a highly cost-effective manner.
Frank Laukien, President and CEO of Bruker Corporation welcomes the Veeco Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments to the Bruker family. Mark Munch, President of the Bruker Nano Surfaces Business also speaks of how the Veeco products, staff and clients will benefit from the new organization and resources.
This playlist contains all of AZoTV's interviews with exhibitors at the MRS Fall Meeting 2012 at the Hynes Convention Center in Boston, Massachusetts. These videos give a fantastic overview of the impressive array of equipment on show at the exhibit from some of the top names in materials science.
This video demonstrates a 1 µm, 23 Hz, scan of freshly prepared Celgard with perpendicular mesh orientation using Bruker’s Dimension FastScan atomic force microscope (AFM).
In this video Samuel Lesko, European Applications Lab Manager, demonstrates the unmatched speed and versatility of Dimension FastScan atomic force microscope from Bruker.
This video engages students with a demonstration of how an Atomic Force Microscope (AFM) is used to image the surface of a DVD.
This short video provides detailed information about Asylum Research’s webinar on “Introduction and Innovations in High Speed, Quantitative Nanomechanical Imaging”, presented by Asylum Research co-founder, Dr. Roger Proksch on March 23, 2012.
This video shows the performance of AFM probe under normal environmental conditions. Interferometry technique is used to image AFM probe.
Asylum Research introduced the Cypher AFM two years ago. They have now added a new technique called Electrochemical Strain Microscopy to its list of capabilities. Sergei Kalinin from Oak Ridge National Laboratory explains how this technique can be used to characterize electrochemical phenomena at the nanoscale and Roger Proksch from Asylum Research demonstrates how the system produces data and its relevance to the field of battery materials.
This video from Bruker shows the recent advances in AFM instrumentation on DNA. The visualization of helical characteristics of DNA is now possible with Bruker's PeakForce Tapping mode in AFM.
A "nanohand" is a small gripper, small enough to manipulate nanotubes and nanofibres. This video shows how to pick and place nanofibres using a nanohand, to construct a nanodevice: a super-probe for atomic force microscopy.
Mark Cyffka from Park Systems shows us their all new NX10 AFM (atomic force microscope) which went on show for the first time at the 2011 MRS Fall Meeting in Boston. The NX10 is the most accurate AFM in the world and Mark points out the main features that have contributed to this.
This animation is a scientific illustration of the operation of NASA's Phoenix Mars Lander's Atomic Force Microscope, or AFM. The AFM is part of Phoenix's Microscopy, Electrochemistry, and Conductivity Analyzer, or MECA.
Jeremy Levy, Professor in the Department of Physics and Astronomy at the University of Pittsburgh experienced a moment of inspiration that evolved into multi-million dollar quantum computing concept. He calls his technology "Etch-A-Sketch nanoelectronics" in which an AFM is used like an Etch-A-Sketch toy to create nano-sized electronic circuits. In his work, Jeremy uses a Cypher AFM from Asylum Research.
Nikolay Novozhilov from NT-MDT takes us for a tour of their SOLVER NEXT AFM/SPM. he shows us how easy it is to change from AFM to SPM, as well as demonstrating the software control system and how easy it is to scan a sample.
Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste. This instrument combines the Bruker AFM platform with Renishaw's raman confocal microscope and allows the user to correlate chemical and topographical information at the same time.
This great webinar by Professor Alexander Kotlyar from Tel Aviv University discusses the use of AFM techniques to analyze the structure of DNA and related structures.
This presentation discusses the latest advancements in Bruker’s atomic force microscopy (AFM) modes, techniques and technology for novel microbiological research.
This demonstration video shows the working of easyScan2 FlexAFM from Nanosurf.
This video shows the fast scanning AFM imaging of atomic steps on HF-etched Mica using the Cypher high resolution AFM from Asylum Research.
David Faddis from Nanosurf takes us for a tour of their new LensAFM. The LensAFM has been designed for users who want to add extra capabilities to their optical microscopes and profilers and is easily adaptable to these systems. Switching between AFM and optical microscopy/profiler modes is easy as is demonstrated in this video.
This presentation discusses the world’s fastest atomic force microscope (AFM) from Bruker AXS. The dimensional FastScan AFM delivers high imaging speed without the loss of force control, loss of resolution, additional operating costs or added complexity.
Curt Marcott from Light Light Solutions tells us how the NanoIR from Anasys Instruments has opened up new possibilities in materials characterization. Combining AFM and IR spectroscopy provides spatial resolution an order of magnitude better than conventional IR, which enables researchers to do such things as examine nanoparticles in a matrix, or analyze for compositions differences across in interface.
John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM. This instruments' claim to fame is that it is the fastest AFM on the market. It's speed and ability to scan samples at a rapid rate without sacrificing resolution, combined with 300mm sample chuck, make it ideally suited production environments.
Pittcon is the world's largest annual conference for laboratory science. The 2012 event will attract over 950 equipment manufacturers, distributors and service providers from 30 countries. The technical program will also include over 2000 sessions covering over 60 topics.
This video shows how cantilever exchange is performed on the Nanosurf NaioAFM.
This video engages students with a demonstration of how an Atomic Force Microscope AFM is used to image the surface of a DVD.
AZo.TV visited the Bruker Nano Surfaces headquarters in Karlsruhe, Germany, for the grand opening of their new European Customer Care Centre and Application Centre.
Mickael Febvre from Veeco takes us for a tour of the Bioscope Catalyst, which is an atomic force microscope with an inverted optical microscope. The system is suited to biological applications.
This video shows how Bruker maximizes AFM performance with the industry's best probes. Bruker is the performance leader in AFM probes and it designs AFM and probes with optimal performance in mind.
Hartmut Statler from Bruker Nano Surfaces demonstrates the capabilities of the Dimension FastScan, with image refresh rates up to one frame per second or more.
As has been their tradition, NT-MDT have launched another new product at the MRS Fall Meeting held in Boston. This year they launched the SOLVER Nano AFM (atomic force microscope).
Kevin Kjoller from Anasys Instruments shows us their NanoIR system which is a unique instrument that combines AFM and IR Spectroscopy. Kevin explains how the system works, how they have been able to integrate an atomic force microscope and infrared spectroscope to provide topographical, mechanical, thermal and chemical information.
This video shows the ScanAsyst atomic force microscopy (AFM) imaging mode from Bruker AXS. The ScanAsyst is the world's first imaging mode with automatic image-optimization technology.
In this video Katherine Kellersberg, Product Specialist talks about MALDI molecular imaging from Bruker.
Klaus Pross, Sales manager for Germany, Austria and Switzerland at Bruker Nano Surfaces talks to AZo.TV about the new European Application Center in Karlsruhe.
Scientists at the University of Bristol are turning to nature in their attempts to further their research into Nano-science and at University of Bath they're applying Nano-science to investigate new lighting technology.
This video shows high speed functional PFM (piezoresponse force microscopy) imaging of AR-PPLN (Asylum Research-periodically poled lithium niobate) test sample. The PPLN consists of a 0.5mm thick LiNbO3 transparent die which measures 3x3mm.
This webinar from Nano Surfaces Division, Bruker, examines the applications of co-localized atomic force microscopy (AFM) and Raman spectroscopy. It also covers the tip enhanced Raman scattering (TERS).
This video shows Dr. Irène Revenko, a staff scientist at Asylum Research Applications, giving a short demonstration on how to use the AFM for biological applications.
A Molecular Dynamics Simulation of an Atomic Force Microscope by Ivan K. Schuller from UCSD
This video features a presentation by Bruker that discusses the recent advances and applications of the electrochemical atomic force microscopy (AFM) techniques.
This video shows the sublimation process of the anthracene single crystal taken by the Cypher AFM from Asylum Research.
Joe McGuire, Director of National Sales for Park Systems introduces us to the XE-70 Research AFM. He outlines the key features and attributes of this atomic force microscope, including hardware and software
This video provides an overview of the features and general handling of the Nanosurf NaioAFM.
The key features and capabilities of the Park Systems XE-NSOM, atomic force microscope incorporating near-field scanning optical microscopy are demonstrated and a details explanation of its operation is provided.
The use of high-speed scanning on a Celgard sample (15Hz).
This video shows how the Cypher AFM from Asylum Research quickly scans a Celgard sample. This unique material is made by stretching isotactic polypropylene and is best scanned in tapping mode.
This video (Part 1 of 3) shows all the main components of the TT-AFM from AFM Workshop. These include the E-box, video microscope and AFM stage.
This video shows the behavior of a newly cleaved calcite crystal that reconstructs when exposed to air. The Cypher AFM from Asylum Research captures this action by rapidly scanning the surface of the sample.
A video clip from Asylum Research on their family of AFMs (atomic force microscopes). This briefly outlines their range of instruments and includes their latest addition the Cypher, which provides the most advanced AFM produced in the last decade.
This short video from Nanosurf explains the benefits of nanoscale surface analysis with atomic force microscopy (AFM).
In this video we learn about the SmartSPM from AIST-NT. We see a demonstration of how easy the SmartSPM is to set up, and in the space of a few minutes have even taken a series of measurements.
This Bruker video illustrates the latest advances in electron microscopic techniques that provide a highly productive non-imaging workflow with AFM.
This video shows the DNA image taken in the tapping mode in the fluid at a rate of 1 frame per second using the Dimension FastScan atomic force microscope (AFM) from Bruker.
This video gives insight into a common phenomenon observed when imaging DNA. A loosely bound DNA sample on mica is imaged using the Cypher high resolution AFM from Asylum Research.
This video shows the consecutive AFM (atomic force microscopy) height images (image size = 3µm; z-scale = 3.2nm) of the lipid bilayer captured at 0.5 f/s with 20x50 frames using TappingMode and Dimension FastScan Bio AFM from Bruker Nano Surfaces.
Stanislav Leesment from NT-MDT shows us their recently released NTEGRA Life AFM System. The system has been designed for biological research applications and includes an AFM mounted on an inverted microscope. Images can be obtained by both methods simultaneously.
David Lewis from Nanonics Imaging Ltd shows us their Multiview Series of AFM/Raman systems that can be supplied with Renishaw or Horiba Raman systems. Nanonics can also supply the Multiview systems as upgrades to existing Raman systems of total systems.
Venkata Reddy Mukku, Service Manager for Europe, the Middle East and Africa at Bruker Nano Surfaces, talks to AZo.TV about the new European Customer Care Center in Karlsruhe.
This movie was taken on the Cypher ES Environmental AFM from Asylum Instruments using blueDrive photothermal excitation.
This interesting video shows the behaviour of freshly cleaved calcite which reconstructs upon exposure to humid air. The action was captured with a Cypher AFM from Asylum Research that rapidly scans the surface of the sample.
This video shows the ScanAsyst atomic force microscopy (AFM) imaging mode with automatic image optimization technology for use in Bruker’s premium AFM microscopes.
The DME BRR microscope makes it possible to investigate surfaces of places one can never find with a conventional AFM + optical microscope combination.
The key features and capabilities of the XE-Bio AFM (atomic force microscope) are described. These include the unique scanning ion conductance microscopy (SICM) technology that allows imaging of living cells in liquid media.
Near field optical microscopy using AFM in combination with laser to produce high resolution images at the nanoscale on samples ranging from quantum dots to biological samples. The focus is on imaging various biological systems.
This video is a brief overview of what Jordan Gerton's lab at the University of Utah researches. Included is a brief description of fluorescence and atomic force microscopy and the future uses of it
This video from Carl Zeiss shows the AFM system, which is ready in a matter of minutes to provide atomic surface topographical resolution in 3D.
Micro Art: Science and Technology united with art. What you are seeing here is not CGI or Photoshop... These are real, beautiful images of things as they appear under powerful electron and atomic force microscopes.
In this webinar Dr.Chunzeng Li from Bruker explains how AFM works and also shows some of the many things it can do.
Dr. Sang-il Park, the CEO of Park Systems shows us their XE-100 series general purpose AFMs. He explains how the use of a x-y scanner and decoupled z scanner produces very flat scans and how their system can operate in a true non-contact mode to produce accurate, high resolution images, with excellent reproducibility. The XE-100 series AFMs can be adapted to measure electrical, magnetic, mechanical and optical properties in addition to topographical properties. Scanning Ion Conductance Microscopy (SICM) technology is also explained.
This video Thomas Mueller of Bruker Nano Surfaces highlights the features and benefits of Bruker's Innova-IRIS AFM-Raman solution.
This video presentation from Bruker Nano Surfaces shows the possible AFM (atomic force microscopy) modes and their nanomedicine applications.
This webinar investigates the advantages and usage of AFM on studying the mechanics of soft materials from Bruker.
This video shows the features and general handling of NaioAFM from Nanosurf.
Are you looking for a way to effectively combine imaging and analytical methods of light and electron microscopy? Would you like to link functional and dynamic information about your specimens with ultra-structural details?
This video shows the characterization of flattening of stem cell sing Dimension FastScan AFM and FastScan-Bio Cantilevers from Bruker.
The cantilever tip is coated with a magnetic strip and is being used to locate the the magnetic region of the garnet film.
This video shows the high speed performance of the atomic force microscope (AFM) from Bruker on the three qualification samples. The tip-check, Celgard and calibration grating are the three standard samples.
This demonstration shows the Cypher AFM from Asylum Research scanning atomic steps on an etched mica sample. The real time video shows how fast the Cypher is able to scan the sample. In this case the scan area starts off as 2.35µm and then changes to smaller areas as the operator selects new zones to investigate.
Chris Gregory, Sales Engineer from Bruker Nano Surfaces, gives a demo of Peak Force Tapping AFM Imaging mode and the ScanAsyst and ScanAsyst HR modes, using the Multimode 8 AFM From Bruker.
This video shows the time series of CM15 antimicrobial activity on live E. coli cells. The images were recorded every 18s at a resolution of 1024 x 256 pixels. Every seventh image in the time series is shown once the effects of CM15 were first observed at ~7.5min.
At this year's MRS Fall meeting Anasys Instruments displayed their new AFM+ platform that combines an atomic force microscope and thermal analysis capabilities. This platform was designed to be upgraded to their NanoIR spec at a later date.
The video provides an excellent introduction to Carbon Nanotubes including an outline of how an AFM probe operates.
Nicholas Randall from CSM Instruments shows us the NHT2 Nanoindentation tester which combines a nanoindenter and AFM in one compact, affordable desktop unit. The unit has been re-designed and now features liquid compatibility, a wider load range and multi sample capability. It also does away with the need for an optical microscope by using two video cameras, proving a side view and a top view.
This video shows the CM15 antimicrobial activity on the nanoscale structure of E. coli bacterial cell membrane. The images were captured every 8s at a resolution of 1024 x 256 pixels using Dimension FastScan Bio AFM (atomic force microscopy) from Bruker Nano Surfaces.
The Dimension FastScan™ Atomic Force Microscope (AFM) from Bruker is currently the world's fastest AFM. It extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. See how it compares to traditional AFMs.
This video illustrates the key features of the Easyscan2 FlexAFM from Nanosurf.
Jim Flach, Director of European Sales at Bruker Nano Surfaces, talks to AZo.TV about the new European Applications Center in Karlsruhe.
This video from Bruker illustrates the working principle of the Dimension FastScan atomic force microscope (AFM) with ScanAsyst and unattended high-speed imaging on a variety of samples.
The Innova-IRIS system integrates a high-stability AFM platform with a top-of-the-line Raman spectrometer, allowing chemical or crystallographic information to be correlated with AFM topography.
In this video a loosely bound DNA sample on mica is imaged using the Cypher AFM from Asylum Research. The interesting feature of this video is that the DNA strand appears to break during the scan. However, upon closer examination, what really happens is that the DNA actually remains undamaged and the apparent breaks are a consequence of taking still images of a dynamic process.
In this exclusive interview with Barbara Foster from the Microscopy and Imaging Place or The MIP conducted at Pttcon 2009, we learn about a new market report. It is in fact the first ever global report on the AFM market place using feedback from AFM users themselves.
This video features Bruker’s unique IRIS TERS probes. The features of these probes are high resolution AFM, High performance Raman spectroscopy and it takes to the ultimate step to TERS.
This video provides details on the “Smaller and Quieter: Ultra-High Resolution AFM Imaging” webinar presented on February 22, 2012 by Asylum Research co-founder, Dr. Jason Cleveland.
John L. Trahan, VP of Global Technical Support for Bruker Nano Surfaces talks to AZo.TV about the new European Customer Care Center in Karlsruhe, Germany.
Mickael Febvre shows us the Veeco Dimension Icon high performance atomic force microscope (AFM). With large sample stage it can perform measurements in a variety of atmospheres.
This webinar from Bruker shows an overview of the living biological samples that can be imaged using the PeakForce QNM (quantitative nanomechanical property mapping) atomic force microscopy (AFM) imaging mode.
Hartmut Statler from Bruker shows us the BioScope™ Catalyst™ AFM. The Catalyst is designed to be integrated with a wide range of inverted optical microscopes, making it perfect for life science applications.
This video illustrates a 180 nm, 30 µm, 11 Hz, scan of diffraction grating taken with Bruker’s Dimension FastScan atomic force microscope (AFM).
AIST-NT's Alexander Yalovenko shows us their OmegaScope AFM-Raman instrument. Based on their proven fast scanning Smart-SPM, The OmegaScope includes either single or 3 laser Raman capabilities that can access the sample from the top or side. The OmegaScope alsoe featured objectiove lenses up 100x magnification.
This video shows the typical topographic images of DPPC/DOPC (dipalmitoylphosphatidylcholine/dioleoylphosphatidylcholine) supported lipid bilayers.