Latest Nanotechnology Articles RSS Feed - Nanotechnology Articles

Using Nanoscale Infrared Spectroscopy on Light Harvesting Proteins, Amyloid Structures and Collagen Fibers

Using Nanoscale Infrared Spectroscopy on Light Harvesting Proteins, Amyloid Structures and Collagen Fibers

Atomic force microscopy (AFM) or scanning force microscopy (SFM) has a resolution 1,000 times greater than the optical diffraction limit. [More]
Using the Zeta 3D Optical Profiler from Zeta Instruments for Difficult Surface Metrology

Using the Zeta 3D Optical Profiler from Zeta Instruments for Difficult Surface Metrology

The Zeta 3D Optical Profiler from Zeta Instruments is an ideal tool for handling difficult surface metrology. The Zeta 3D includes a spectrometer, a true color profiler and an interferometer. [More]
The Advantages of Using the Zeta 3D Optical Profiler for Edge Inspection and Metrology

The Advantages of Using the Zeta 3D Optical Profiler for Edge Inspection and Metrology

The Zeta3D™ optical profiler is an ideal instrument (Figure 1) for edge inspection and metrology, with superior features such as XOD inspection, edge defect review edge trim step height and X-Y-è shift. It is a non-contact 3D optical profiler with an inspection option. [More]
The Advantages of Inspecting Defects in Glass and Silicon with the ZetaScan Tool

The Advantages of Inspecting Defects in Glass and Silicon with the ZetaScan Tool

The ZetaScan™ is an advanced defect inspection technology from Zeta Instruments. It is capable of inspecting the entire surface of glass substrates or wafers for surface defects such as bumps, pits and particles within seconds. [More]
Tutorial on Microstepping

Tutorial on Microstepping

Microstepping is a stepper motor drive technique in which the current passing through one of the two windings of a bipolar stepper motor is controlled to rotate the stepper motor. [More]
Measuring High-Resolution MFM while Simultaneously Measuring Topography of Samples using DP-MFM

Measuring High-Resolution MFM while Simultaneously Measuring Topography of Samples using DP-MFM

Dual-PLL magnetic force microscopy (DP-MFM) is an ideal instrument for measuring high-resolution MFM as well as concurrently measuring sample topography in a non-contact manner with the surface. This is mandatory for ensuring that the magnetic tip with high-aspect ratio retains its sharpness. [More]
Analyzing the Latest Generation Hard Disk Media

Analyzing the Latest Generation Hard Disk Media

The significant factors for the analysis of latest state-of-the-art hard disk media are magnetic image resolution and sensitivity. NanoScan’s PPMS®-AFM provides an exceptional one-inch magnetic force microscope, which is compatible with all basic measurement modes, such as the PLL-controlled true non-contact mode, contact mode and intermittent contact mode, and high-resolution MFM mode with a magnetic resolution of less than 15nm. [More]
Simultaneous Acquisition of Atomic Force Microscopy (AFM) and Piezo-Response Images

Simultaneous Acquisition of Atomic Force Microscopy (AFM) and Piezo-Response Images

With the aid of the piezo-response mode, imaging of ferroelectric domains is possible. The NanoScan PPMS®-AFM is capable of real-time acquisition of piezo-response images and atomic force microscopy (AFM) images. [More]
In-Situ Switching of Tip Magnetization for Ruling out Topographic Effects in Magnetic Force Microscopy Measurements

In-Situ Switching of Tip Magnetization for Ruling out Topographic Effects in Magnetic Force Microscopy Measurements

The article focuses on eliminating topographic effects in magnetic force microscopy (MFM) measurements by switching the tip magnetization in order to differentiate between magnetism and topography. [More]
Imaging Nanoparticles Using Hyperspectral Analysis

Imaging Nanoparticles Using Hyperspectral Analysis

Hyperspectral imaging accumulates and processes information from across the electromagnetic spectrum. Although only three bands are visible by the human eye (red, green and blue), the spectrum is divided into many more bands using hyperspectral imaging. [More]