Sputtered Neutral Mass Spectrometry is perfect for analyzing thin metal films where composition, thickness and interface condition can be determined.
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A Hiden HPR-60 inlet system with an EQP 1000 series mass analyzer gauge was utilised for atmospheric plasma analysis.
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By minimizing the pressure differential between a plasma reactor and an attached mass spectrometer such as the Hiden mass spectrometer allows direct detection of metastable species produced in the plasma if these have long life-times and considerable internal energy.
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Secondary Ion Mass Spectrometry (SIMS) and Sputtered Neutral Mass Spectrometry (SNMS) are both surface analysis methods in which the specimen is bombarded by an ion beam and the sputtered particles are detected by a mass spectrometer. The techniques are compared and contrasted and used together.
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Graphene oxide (GO) films are a few hundred nanometers thick semi-transparent films which have recently become commercially available. GO, used to make the films, is the oxidized form of graphene which can be visualized as a graphene sheet with its basal plane decorated by oxygen-containing groups.
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Transmission Electron Microscopy (TEM) is a technique which has proven indispensible in a range of scientific fields, including cancer research, materials science, virology, and semiconductor research. TEM, which has been around since 1931, allows users to examine specimen at a higher resolution than light microscopes.
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Graphene is a member of the class of two-dimensional materials discovered by Professor Andre Geim’s research group at the University of Manchester.
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Thermodynamic relations may be regarded as the motor driving chemical processes (while chemical kinetics represents the brakes). In order to operate, the relations need to be powered with the fuel of values for the thermodynamic quantities concerned, such as enthalpies, entropies, heat capacities, Gibbs and Helmholtz energies, and so forth.
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Graphene, a sheet of carbon atoms arranged in a hexagonal lattice structure, is viewed as the next big thing in high-tech.
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The statement that a materials functionality is controlled by defects is perhaps the most recognized paradigm of materials science, solid state electrochemistry, and condensed physics alike.
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