Insights from Industry
'Insights from Industry', a dynamic series of interviews at the cutting edge of the nanotechnology industry. Every interviewee is a leader in their particular field and is hand-picked to give an informative and accessible insight into their chosen field. These interviews are guaranteed to keep you in the know in a rapidly changing industry.
DR. Madeline J. Dukes, an Application Scientist from Protochips talks to AZoNano about their range of products, that are pushing the boundaries for laboratories who in the past where challenged when it came to in situ TEM tools.
Mike Davies, International Sales and Applications Engineer at Micro Materials, talks to AZoNano about the NanoTest Xtreme and the benefits it offers user when performing indentation experiments under vacuum conditions.
We spoke to Markus Wimplinger, of the EV Group, about the new NIL center, the NILPhotonics™ Competence Centre, that the EV Group have recently opened and how they can guide manufacturers through the entire NIL process - from prototyping to developing a high volume manufacturing plan.
A new combined SPM ToF-SIMS system has been developed that significantly increases the throughput and accuracy of combined SPM ToF-SIMS experiments.
Warren Oliver, President of Nanomechanics talks to AZoNano about their range of revolutionizing Nanoindenters and Nanoindentation testing systems.
Dr. Neil Sarkar, President and Co-Founder of ICSPI and Duncan Strathearn, Director of Product Development at ICSPI talk to AZoNano about the world's first Mircroscopic Microscope, the new Single-Chip Atomic Force Microscope
Craig Wall, PhD, Director of Marketing, talks to AZoM.com about the new awarding winning PanScan Freedom Cryogen-Free LT AFM / STM and the high level performance it offers the SPM market.
Ray Morgan, Director of Outreach, SEMI Americas, talks to AZoNano about SEMICON West 2016.
FullScaleNANO are an emerging nanoanalysis start-up based in Florida. Their NanoMet software promises to automatically collect and collate vast amounts of accurate data from nanoscale images saving researchers from the time consuming (and often frustrating) task of manual measurement whilst removing human error from the equation.
Dr. Sang-Joon Cho, Director & Chief Scientist at Park Systems Corp., talks to AZoNano.com about the new SmartScan software and how it has removed the complicated operating systems typically associated with many AFMs.