MRS 2011 Fall Meeting Video Interviews Videos

MRS 2011 Fall Meeting Video Interviews Videos
Brian Crawford shows us the P-6 Profilometer by KLA Tencor and demonstrates its operation. The instrument features a 156mm sample stage that is motorized to move in x and y axes as well as rotation.
At this year's MRS Fall meeting Anasys Instruments displayed their new AFM+ platform that combines an atomic force microscope and thermal analysis capabilities. This platform was designed to be upgraded to their NanoIR spec at a later date.
Eric Rufe from Bruker Nano Surfaces shows us their ContourGT-X8 optical profiler. It is effectively a 3-dimensional microscope and features the 10th generation of this technology.
John Thornton from Bruker takes us for a tour of the Dimension Fastscan atomic force microscope AFM. This instruments' claim to fame is that it is the fastest AFM on the market. It's speed and ability to scan samples at a rapid rate without sacrificing resolution, combined with 300mm sample chuck, make it ideally suited production environments.
As has been their tradition, NT-MDT have launched another new product at the MRS Fall Meeting held in Boston. This year they launched the SOLVER Nano AFM (atomic force microscope).
The FluidFM is a new product from Nanosurf based on their Flex AFM system. It is a new technology designed for life science and pharmaceutical applications. It uses nanofluidic cantilevers with a channel, which allows the user to to extract or inject fluids.
The CETR-Apex system from Bruker is a nanomechanical testing system that features easily interchangeable heads allowing it to be able to used as a nano or micro indentation system. It also incorporates an optical microscope and atomic force microscope (AFM).
The DCM 3D surface metrology tool from Leica features a confocal microscope and interferometer with LED illumination and CCD detector. The interferometer and confocal microscope have resolutions of 0.1nm and 3.5nm respectively.
The NanoTest Vantage is Micro Materials latest nanomechanical testing system. It can perform a number of tests that are briefly described in this interview.
Mark Cyffka from Park Systems shows us their all new NX10 AFM (atomic force microscope) which went on show for the first time at the 2011 MRS Fall Meeting in Boston. The NX10 is the most accurate AFM in the world and Mark points out the main features that have contributed to this.
If you are looking for nanoparticles or nanoparticle dispersions to suit a particular requirement, you should consider speaking to Sam Halim, CEO of Nanograde. As you will see in this interview, they can prepare customised nanomaterials to your specifications and ship them wherever you are in the world
Jim Zobel from KLA Tencor demonstrates their MicroXAM 100 surface profilometer and white light optical interferometer. The MicroXam 100 features fast data acquisition rates that enable calculation of such things as surface roughness, step heights and other surface features.
Stefan Kaemmer from Bruker gave a tour of their new Innova-Iris syste. This instrument combines the Bruker AFM platform with Renishaw's raman confocal microscope and allows the user to correlate chemical and topographical information at the same time.
If you ned to manipulate samples, devices or biological materials in light microscopes, electron microscopes or FIB's, or if tweezers are not suitable, then you should consider miBots by Imina Technologies. These nanomanipulators can operate over large areas untethered and are to work under vacuum conditions.
Todd Perez from Leica shows us their sample preparation system that consists of 2 instruments, the TXP mechanical preparation system and the TIC 3X triple ion beam cutting system.
XEI Scientific manufacture the Evactron plasma decontamination systems. Tom Levesque explains how they can be used as a benchtop unit or on instruments such as scanning electron microscopes (SEM), transmission electron microscopes (TEM) or focused ion beam systems (FIB). In these applications they can be used to clean samples or chambers, removing organic contaminants or hydrocarbon residues.