Pittcon 2009 Video Interviews Videos

Pittcon 2009 Video Interviews Videos
Mike Wolfe from Nikon Instruments, the distributor for the JEOL Neoscope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.
Lumencor was formed to design lighting technology for life science applications. Claudia Jaffe from Lumencor introduces us to their Light Engine which is an all-in-one device that combines: power; durability; discreetness, spectral cleanliness; long life; cool operating temperature; small footprint and; cost effectiveness.
Michael Haschke from Bruker AXS shows us thorugh their new range of Micro XRF (X-Ray Fluorescence) instruments. He shows us 3 instruments that vary in chamber size, with the largest able to take samples 30cm in diameter and offering vacuum analysis and a motorized stage for line scans and area analysis.
The WITec microscopy series features scanning probe as well as high resolution optical and Raman microscopy techniques in either a single instrument or combined system configurations for the highest flexibility throughout a wide range of microscopy applications.
The Zetasizer range uses light scattering techniques to measure hydrodynamic size, zeta potential and molecular weight of proteins and nanoparticles.
In this exclusive interview with Barbara Foster from the Microscopy and Imaging Place or The MIP conducted at Pttcon 2009, we learn about a new market report. It is in fact the first ever global report on the AFM market place using feedback from AFM users themselves.
David Coler from PANalytical shows us through the AXIOS XRF (x-ray fluorescence) instrument that performs elemental analysis. It is suited to applications including industrial process control, in the cement, steel and petroleum industries, as well as research and development applications in both industry and academia.
The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a single, optimized set - up. The combination of the NANOS AFM / SPM and a high power optical microscope on a highly rigid granite stand makes the N8 NEOS a highly effective and exceptionally versatile inspection system.
Nanosight have developed a unique technique for detecting and viewing nanoparticles in real time using laser light. Jeremy Warren explains how it work and the key components to their system
Janie Dubois from Malvern Instruments takes us for a tour of the Morphologi G3 particle characterization system. The Morphologi G3 is a microscope based system that analyzes particles based on actual images.
Tim Drake from Aspex Corp shows us the main features of the Personal Scanning Electron Microscope, PSEM eXpress, which is designed for rapid sample analysis. In particular, this compact benchtop SEM features a large sample chamber and easy loading mechanism.
The DT-1200 Acoustic & ElectroAcoustic Spectrometer characterizes both particle size and zeta potential of concentrated suspensions. The measuring chamber of the DT-1200 contains both acoustic and electroacoustic sensors.
Aspex Corp's Tim Drake takes a few minutes to point out the the key features of their Personal Scanning Electron Microscope, PSEM eXplorer, which is an integrated SEM/EDX system designed for rapid automated particle analysis. Some of the main features include large sample chamber and silicon drift detector.
Ulf Nobbmann from Malvern Instruments shows us through the Zetasizer Nano, which uses dynamic light scattering to determine particle size, as well as being able to determine zeta potential.