alpha300 Raman/AFM/SNOM from WITec - Features and Applications
Jo Koenen from WITec
shows us through the alpha300 Raman/AFM/SNOM from WITec.
The WITec microscopy series features scanning probe as well as high resolution
optical and Raman microscopy techniques in either a single instrument or combined
system configurations for the highest flexibility throughout a wide range of
microscopy applications.
For example, it is possible to start with Confocal Raman Microscopy and upgrade
later to Atomic Force Microscopy or vice versa. With such a combined instrument,
chemical information can be directly linked to structural AFM information from
the same sample area using only one instrument. For high-resolution optical
information, the system can even be equipped with SNOM capabilities.
Run time: 8.36 mins