Neos AFM from Bruker AXS - Features and Applications
Dave Sampson from Bruker
AXS shows us through the N8 NEOS atomic force microscope from Bruker AXS
The N8 NEOS combines optical microscopy and Scanning Probe Microscopy in a
single, optimized set - up. The combination of the NANOS AFM / SPM and a high
power optical microscope on a highly rigid granite stand makes the N8 NEOS a
highly effective and exceptionally versatile inspection system.
Due to its proprietary, sturdy design, the SPM performance reaches down to
an atomic resolution level. Using a strong, yet extremely precise vertical motion
stage allows to measure even on very heavy and large samples. The N8 NEOS can
be easily adapted to special requirements and customers wishes: from manually
positioning to high precision joystick automatization, from liquid cell observation
on biological tissue to the industrialized inspection in quality control. All
AFM/SPM modes and optical contrast techniques are available, making the N8 NEOS
the ideal inspection tool where the ultimate performance is required.
Run time: 2.48 mins