NeoScope JCM-5000 Benchtop Scanning Electron Microscope (SEM) from JEOL

Mike Wolfe from Nikon Instruments, the distributor for the JEOL NeoScope JCM-5000 in North America and Canada demonstrates the capabilities if this compact benchtop scanning electron microscope (SEM), which is a natural extension from high end optical microscopes, but offers much better depth of field.

The NeoScope JCM-5000 is supplied as a turnkey solution incorporating rotary pump, computer and SEM with magnification from 10-20000 times. The unit can operate in either high or low vacuum modes and includes backscatter and secondary electron detectors.

Mike demonstrates how easy it is to load a sample and the user-friendly software interface that can be operated by users with limited SEM experience.

Run time - 7:39min

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