Site Sponsors
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD
  • Strem Chemicals - Nanomaterials for R&D

Use of AIST-NT AFM High-Speed Scanning of a Celgard Sample (10Hz)

This video shows the use of AIST-NT AFM high-speed scanning of a Celgard sample.

Run time - 1:01 mins.

Tell Us What You Think

Do you have a review, update or anything you would like to add to this video content?

Leave your feedback
Submit
Other Videos by this Supplier
Nanotechnology Videos by Subject Matter