Posted in | Nanoanalysis

AIST-NT Demonstrate High-Speed TERS Imaging

For the first time, deep sub-diffraction-limit Tip Enhanced Raman (TERS) imaging has been demonstrated at a speed comparable to that of high-quality AFM imaging. The advanced AFM-Raman system jointly offered by AIST-NT and Horiba Scientific makes TERS a realistic analytical method for chemically specific imaging at the nano scale. The ease of use, high level of automation and dedicated TERS imaging modes open completely new possibilities for the application of TERS to real-world samples.

Demonstrated spatial resolution of hyperspectral imaging is better than 10nm.

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