A/S develops new technology for direct nano- and micro-scale electrical
characterization of materials.
A/S offer a versatile Microscopic
Four- and Twelve Point Probe (M4PP
for accurate micro-scale electrical tests.
technology and it's unique features have been integrated into state-of-the-art
Automatic and Semi Automatic metrology platforms for the thin film and semiconductor
is another unique tool from CAPRES
A/S developed especially for the MRAM and Read Head industries allowing
in plan and out of plane MR measurement. The CIPTech
features the unique capabilities of the M12PP
built into a state-of-the-art semi automatic platform.