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Coatings and thin films are applied to the surface of materials to alter their properties. Being able to measure the thickness and uniformity of these thin films is important as variations can effect the properties and performance of the final device.
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Equipment
For routine measurements of thin film thickness and refractive index, the alpha-SE® is a great solution. Designed for ease-of-use: simply mount a sample, choose the model that matches your film, and press measure. You have results within seconds.
The Aleris 8500 film metrology tool provides engineers with the film thickness and composition information required to qualify, integrate and monitor advanced films, including nitrided gate layers, high-k dielectrics, and ultra-thin multi-layer stacks.
The Optical NanoGauge C10178-01 available from Hamamatsu is a film thickness measurement system that uses spectral interferometry. Using white light illumination, film thickness is recorded instantly and non-destructively.
The 20/30 PV™ microspectrophotometer is for taking spectra and images of microscopic samples by UV-visible-NIR absorbance, reflectance, Raman, polarization and fluorescence.
ThinFilmID for the in-situ measurement of composition and thickness of thin films down to 1nm in the SEM. ThinFilmID uses Energy Dispersive X-ray Spectrometry (EDS) to measure the composition and thickness of layers in a thin film structure. This technique has a unique combination of advantages that offer real benefits to customers both in terms of speed, optimisation of methods and ease of use.
The Thick-800 is a non-destructive testing solution for organizations that need accurate quality control of printed circuit boards and electronics. Testing capabilities include multi-layer thickness measurements and RoHS testing of solder joint. The Thick-800 is specifically developed for coating thickness measurements