Thin Film and Coating Thickness Measurement Tools RSS Feed - Thin Film and Coating Thickness Measurement Tools

Coatings and thin films are applied to the surface of materials to alter their properties. Being able to measure the thickness and uniformity of these thin films is important as variations can effect the properties and performance of the final device.
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Equipment
ThinFilmID for the in-situ measurement of composition and thickness of thin films down to 1nm in the SEM. ThinFilmID uses Energy Dispersive X-ray Spectrometry (EDS) to measure the composition and thickness of layers in a thin film structure. This technique has a unique combination of advantages that offer real benefits to customers both in terms of speed, optimisation of methods and ease of use.
The MSP100 Microspectrophotometer and Thin Film Measurement System is used to characterize optical properties of thin films, thick coatings over a micron region area.
The SR300 Spectroscopic Reflectometer & Film Thickness Measurement System can be used to measure the film thickness, refractive index, reflection, transmission and absorption spectra of thin films and coatings.
The Optical NanoGauge C10178-01 available from Hamamatsu is a film thickness measurement system that uses spectral interferometry. Using white light illumination, film thickness is recorded instantly and non-destructively.
The SRM100 Film Thickness Mapping Measurement System can measure the film thickness and refractive index across samples as big as 300x300mm. Features and applications are provided herein.
The Thick-800 is a non-destructive testing solution for organizations that need accurate quality control of printed circuit boards and electronics. Testing capabilities include multi-layer thickness measurements and RoHS testing of solder joint. The Thick-800 is specifically developed for coating thickness measurements
For routine measurements of thin film thickness and refractive index, the alpha-SE® is a great solution. Designed for ease-of-use: simply mount a sample, choose the model that matches your film, and press measure. You have results within seconds.
The Aleris 8500 film metrology tool provides engineers with the film thickness and composition information required to qualify, integrate and monitor advanced films, including nitrided gate layers, high-k dielectrics, and ultra-thin multi-layer stacks.
The SRM100 Film Thickness Mapping Measurement System can measure the film thickness and refractive index across samples as big as 300x300mm.
The Spectroscopic Ellipsometer SE200BA Film Thickness Measurement System is a powerful instruments used to precisely measure thin film thickness, determine optical constants, investigate surface and interface phenomenon and many other physical, chemical and optical properties of materials.
The 20/30 PV™ microspectrophotometer is for taking spectra and images of microscopic samples by UV-visible-NIR absorbance, reflectance, Raman, polarization and fluorescence.
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