Thin Film and Coating Thickness Measurement Tools

Coatings and thin films are applied to the surface of materials to alter their properties. Being able to measure the thickness and uniformity of these thin films is important as variations can effect the properties and performance of the final device.

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Equipment

Film Thickness Measurement Device - C10178-01 Optical NanoGauge from Hamamatsu

The Optical NanoGauge C10178-01 available from Hamamatsu is a film thickness measurement system that uses spectral interferometry. Using white light illumination, film thickness is recorded instantly and non-destructively.

SRM100 Film Thickness Mapping Measurement System from Angstrom Sun Technologies

The SRM100 Film Thickness Mapping Measurement System can measure the film thickness and refractive index across samples as big as 300x300mm. Features and applications are provided herein.

SE200BA Spectroscopic Ellipsometer for Film Thickness Measurement from Angstom Sun Technologies

The Spectroscopic Ellipsometer SE200BA Film Thickness Measurement System is a powerful instruments used to precisely measure thin film thickness, determine optical constants, investigate surface and interface phenomenon and many other physical, chemical and optical properties of materials.

Oxford Instruments ThinFilmID Thin Film Inspection and Dimension

ThinFilmID for the in-situ measurement of composition and thickness of thin films down to 1nm in the SEM. ThinFilmID uses Energy Dispersive X-ray Spectrometry (EDS) to measure the composition and thickness of layers in a thin film structure. This technique has a unique combination of advantages that offer real benefits to customers both in terms of speed, optimisation of methods and ease of use.

Aleris 8500 from KLA Tencor - Film Thickness and Composition Measurement

The Aleris 8500 film metrology tool provides engineers with the film thickness and composition information required to qualify, integrate and monitor advanced films, including nitrided gate layers, high-k dielectrics, and ultra-thin multi-layer stacks.

Skyray XRF Thick-800 XRF Analyzer

The Thick-800 is a non-destructive testing solution for organizations that need accurate quality control of printed circuit boards and electronics. Testing capabilities include multi-layer thickness measurements and RoHS testing of solder joint. The Thick-800 is specifically developed for coating thickness measurements

Ultra Precision 3D Optical Profiler - CCI HD from Taylor Hobson

The new CCI HD Optical profiler with thin & thick film measurement capability merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology.

UV-Visible-NIR Transmission, Reflectance and Fluorescence Spectroscopy and Imaging of Microscopic Sample Features with the 20/20 PV™

The 20/20 PV™ is for taking spectra and images of microscopic samples by UV-visible-NIR, Raman and fluorescence spectroscopy.

J.A. Woollam alpha-SE Spectroscopic Ellipsometer

For routine measurements of thin film thickness and refractive index, the alpha-SE® is a great solution. Designed for ease-of-use: simply mount a sample, choose the model that matches your film, and press measure. You have results within seconds.

In-Line Film Thickness Monitoring with Spectroscopic Reflectometer from Angstrom Sun Technologies

The SRM100 Film Thickness Mapping Measurement System can measure the film thickness and refractive index across samples as big as 300x300mm.

Microspectrophotometer and Film Thickness Measurement MSP100 from Angstrom Sun Technologies

The MSP100 Microspectrophotometer and Thin Film Measurement System is used to characterize optical properties of thin films, thick coatings over a micron region area.

Spectroscopic Imaging Ellipsometer - nanofilm_ep3se from Accurion

Imaging ellipsometry overcomes the limits of classical ellipsometers by determining film thickness and optical properties with a combination of nulling ellipsometry and microscopy. Ellipsometric high contrast images from the surface with a lateral resolution down to 1 ìm are achieved. Spectroscopic ellipsometry enables you to study complex materials like polymer surfaces, graphene flakes, monolayers, biosensors, protein adsorption and many more.

SR300 Spectroscopic Reflectometer and Film Thickness Measurement System from Angstrom Sun Technologies

The SR300 Spectroscopic Reflectometer & Film Thickness Measurement System can be used to measure the film thickness, refractive index, reflection, transmission and absorption spectra of thin films and coatings.