EDAX APEX™ EBSD is a user-friendly software platform that enables the characterization of electron cackscatter diffraction (EBSD) patterns.
Users can simply, quickly, and reliably collect high-quality data using strong pattern analysis and an accessible UI. APEX improves user productivity and provides the best option for microstructural characterization when combined with EDAX hardware.
Image Credit: Gatan
Ease of use
- Intuitive operation for beginners and skilled users
- Automatic optimization of EBSD detector and data collection parameters
- Application tabs for analysis modes are set up, and each tab contains logical sets of suitable functions
- Graphical ribbon bar permits rapid access to functions and features
APEX EBSD ribbon bar. Image Credit: Gatan
Adjustable layouts
- The ability to rearrange and resize data view windows as desired by the user
- Each application tab has a variety of layouts that display the appropriate view windows for the selected action
- Users can choose from a variety of color schemes to suit their tastes or the scanning electron microscope (SEM) interface
- Users can store and utilize customized layouts
Context-sensitive layout selection. Image Credit: Gatan
User customization
- Windows® Authentication for login if required
- Single- or multi-user modes
- Individual settings saved for each user
Features
Triplet Indexing engine
- Sensitivity to rogue band detection is decreased by the novel three-bands (triplets) indexing technique
- With Triplet Indexing, users can obtain excellent indexing success rates even at the fastest EDAX Velocity™ EBSD detector speeds
- The patented Confidence Index value provides a quantifiable evaluation of the quality of the crystallographic indexing solution
- Improve band detection options on the dedicated Hough page to guarantee that all crystal structures are effectively indexed
- Generate high-quality indexing results using real-world samples
Triplet Indexing resolves overlapping patterns for better indexing. Image Credit: Gatan
Comprehensive EBSD data collection
- Automatic detector optimization for application-specific EBSD data collection
- Automatic step size recommendations for efficient scanning
- Multiple scan modes
- Quickly gather each EBSD pattern or a comprehensive scan
- Line scan acquisition
- Hexagonal grid sampling for enhanced data sampling
Dynamic scanning
- Data statistics summary
- Hough band detection
- Crystal unit cell display
- Feedback gives users information on collection quality
- During each scan, users can track and assess data collected in real-time with numerical and visual feedback
- Combine grayscale and color maps to comprehend the results better
- Grayscale maps incorporate image quality, SEM signal, and PRIAS™ (optional)
- Color maps include IPF, Confidence Index, phase, and EDS elements
- EBSD pattern and indexing display
Multiple scanning modes available. Image Credit: Gatan
Montage large area mapping
- Scans wide areas with stage motions to collect data from multiple domains of study
- Data is automatically stitched into a single file for thorough examination
- Oversampling is possible to improve field matching
EBSD mapping example from a high entropy alloy weld. Image Credit: Gatan
Batch scanning
- Compiles a sequence of scans into a single batch operation
- Defines standard free-form, Montage, and line scans for a batch
- Defines the batch’s simultaneous EDS, magnification, step size, scan area, and stage position
- Enables the effective use of SEM for studying a variety of samples or locations
Data management
- Default names within the project tree for rapid collection with the option to rename if needed
- Can specify file name and location to match user requirements
- HDF file well-matched with APEX Review for EDS analysis and EDAX OIM Analysis™ for EBSD examination
- Project tree structure for the seamless organization of data
- HDF file format for data portability and management
- 64-bit software architecture for managing big data
- Single file for both EBSD and EDS collection
Project tree data organization. Image Credit: Gatan
Integrated EDS-EBSD
- Complete integration of energy dispersive x-ray spectroscopy (EDS/EDX) and EBSD for thorough material characterization
- Make use of the cutting-edge EDS quant engine, which has been optimized for high-tilt EBSD geometries
- Correlation of structural and chemical information using an integrated EDS spectrum and EBSD pattern collection
- Compatible with ChI-Scan™ processing for simultaneous EDS-EBSD scanning for increased multi-phase analysis
Advanced reporting
- Report production that is customizable based on OIM Analysis user templates
- Template files with default design templates contain user-defined report content
- Personalized report layout with Report Designer tool
- Use reporting with batch scanning capability
- Users can generate reports using the APEX EBSD or OIM Analysis software
