EDAX OIM Analysis™ is the premier microstructural visualization and analysis tool for interrogating and understanding electron backscatter diffraction (EBSD) mapping data. Analysis options include comprehensive grayscale and color mapping tools to display orientations, grain boundaries, phases, energy dispersive x-ray spectroscopy (EDS/EDX) information, and local deformation.
Most analysis results can be displayed in colorful, meaningful maps and quantified in charts and texture calculations. As all points in the data displays are linked to their measurement location in the map, interactive highlighting allows specific microstructural features to be investigated by displaying selected points in all other representations.
Significant new functionality has been introduced into the software, including:
- Multithreading optimization to allow users to take advantage of modern computer technology
- EBSD pattern reindexing to improve indexing performance away from the scanning electron microscope (SEM) with EDAX’s Triplet Indexing, ChI-Scan™, and NPAR™ technologies
- OIM Matrix™ dynamic pattern simulation for dictionary indexing and structure file optimization
- Anti-grain analysis for characterization of non-indexed datapoints
- Correlation plots for understanding the relationship between different EBSD measurements metrics
Features and benefits
Multithreaded operations
- Optimized code to take advantage of modern multi-core CPUs for faster map rendering, highlighting, and characterization calculations
EBSD pattern indexing
- Ability to reindex points within an OIM mapping dataset
- Reindexing by a point, a partition, or a complete dataset
- ChI-Scan and NPAR indexing capability available
- Batch reindexing for analysis of multiple datasets (3D and in-situ experiments)
Anti-grains analysis
- Formation of ‘anti-grains’ from measurement points that are not included in traditional grain determination algorithm
- Anti-grain size and shape can then be analyzed
- Anti-grains can be correlated with porosity or amorphous phases
OIM Matrix
- Dynamic diffraction-based EBSD pattern simulation
- Dictionary indexing capability
- Structure file and multi-phase background optimization
HDF5 support
- Data and patterns stored in HDF5 format for improved data portability and management
Correlative microscopy
- Import of spatially-specific measurements for visualization and correlative analysis
