Atomic Force Microscopes (AFM)

Atomic force microscopes (AFM) are one of the most powerful tools for determining surface topography at subnanometer resolution. The technique involves imaging a sample through the use of a probe, or tip, with a radius of 20 nm. The tip is held several nanometers above the surface using a feedback mechanism that measures surface–tip interactions on the scale of nanoNewtons. Variations in tip height are recorded while the tip is scanned repeatedly across the sample, producing a topographic image of the surface.

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Featured Equipment

MFP-3D™ Stand Alone AFM from Asylum research

MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements.

Scanning Probe Microscope (SPM) - Innova from Bruker

The Innova atomic force microscope from Bruker provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns.

World's Fastest Atomic Force Microscope - Dimension FastScan AFM from Bruker

The Dimension FastScan™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. Based upon the highly successful Dimension Icon® AFM architecture, the FastScan AFM is a tip-scanning system that provides measurements on both large and small size samples in air or fluids.

Other Equipment

AIST-NT CombiScope 1000 Scanning Probe Microscope

The CombiScope 1000 from AIST-NT is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you.

Multimode Atomic Force Microscope (AFM) - Multimode 8 from Bruker

The MultiMode® 8 Atomic Force Microscope (AFM) from Bruker is everything you would expect from the extraordinary MultiMode microscope platform that has set the standard for high-resolution atomic force microscopy imaging for over 15 years. Now, the latest MultiMode 8 AFM system incorporates surprising new features and accessories that take the distinguished MultiMode Atomic Force Microscope platform to even higher levels of performance, speed, and ease of use.

Nanosurf Isostage - Isolation Stage for AFM

The Nanosurf Isostage is an advanced and compact active vibration isolation system that helps protect scans from vibration disturbances. It comes with Adapter Plates for Mobile S, Easyscan 2, and Nanite AFM systems, thus providing an ideal vibration isolation solution for all Nanosurf AFM systems.

Dimension Edge Atomic Force Microscope (AFM) from Bruker

The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension® Icon® System to provide levels of performance and functionality only available from Bruker.

Nanosurf Acoustic Enclosure 300/500 for STM or AFM

The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.

Atomic Force Microscope - 5500 ILM from Agilent

The Agilent 5500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope with the direct optical viewing capability of an inverted optical microscope. The systemâ€™s advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images.

Fully Automated Force Spectroscope - ForceRobot 300 from JPK Instruments

ForceRobot®300 from JPK Instruments is a fully automated force spectroscope that allows the real-time study of molecular interactions and is built to perfectly address all the demands of a cutting edge force spectroscopy experiment. Using it overcomes the limitations of traditional force measurements. The automated setup and continuous adjustments provide high efficiency of data collection. Integration with optical techniques allows targeted measurements at the molecules of interest.

Asylum Research MFP-3D-BIO Atomic Force Microscope System

The MFP-3D-BIO is a high-performance Atomic Force Microscope (AFM) designed specifi cally for biological applications. It is a versatile AFM that combines molecular resolution imaging and pN force-based measurements on an inverted optical microscope.

MFP-3D Origin™ - Affordable Atomic Force Microscope (AFM) from Asylum Research

The MFP-3D Origin™ marks the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family.

Agilent 5600LS Atomic Force Microscope (AFM)

Regardless of sample size, the Agilent 5600LS large-stage AFM is ready to deliver high-resolution results. This versatile instrument from Agilent Technologies is the world’s only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with a 9µm x 9µm AFM or STM scanner.

AIST-NT SmartSPM 1000 Atomic Force Microscope

The 100% automated SmartSPM system from AIST-NT offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.

Park Systems XE-70 Atomic Force Microscope

XE-70 is Park Systems' AFM solution for researchers with limited budget. XE-70 does not compromise any of the innovative technologies of the XE-series that sets it apart from conventional AFMs, supporting the same modes, options, and electronics as all other systems in the XE product line.

Park Systems XE-100 Atomic Force Microscope with Step-and-Scan Automation

The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and engineering. It can adopt a wide range of optical coupling with its open side access.

AIST-NT OmegaScope 1000 Scanning Probe Microscope

AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).

Nanonics MultiView 4000

SPM Systems with more than one probe that can image independently have always been a dream. This dream has become a reality with the MultiView 4000™ with its AFM, NSOM and SPM multiprobe capabilites and it's optical and electron optical compatibility.

Combined AFM-SEM-FIB System from Nanonics Imaging

For the first time ever, Nanonics Imaging Ltd. in its drive for integrated microscopic solutions has now been able to fully and transparently integrate atomic force microscopy (AFM) and scanning electron microscopy (SEM).

Park Systems XE-3DM Atomic Force Microscope

Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series' decoupled XY and Z scanning system, allows for characterization of undercut features as well as top surfaces. In using Park Systems' True Non-Contact mode, the XE-3DM can realize non-destructive imaging of soft photoresist structures at the same scanning speed as any other XE-series platform.

Park Systems XE-120 Atomic Force Microscope

Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry's only True Non-Contact mode imaging for both air and liquid imaging. Flexible configurations allow integration with other advanced optical measurement techniques such as Raman spectroscopy.

Agilent 5500 Atomic Force Microscope (AFM)

The Agilent 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Agilent Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.

PeakForce Kelvin Force Probe Microscopy (KPFM) Module for Atomic Force Microscopes from Bruker

Bruker’s PeakForce KPFM™ module for the Dimension Icon® and MultiMode® 8 AFMs combines the complete set of KPFM detection mechanisms, including amplitude and frequency modulation, with both TappingMode™ and PeakForce Tapping™ to provide directly correlated quantitative nanomechanical data.

Cypher AFM from Asylum Research

You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher™ AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with >20X faster scanning and striking ease of use.

Park Systems XE-150 Cross-Functional Atomic Force Microscope with Motorized Sample Stage

With the arrival of the XE-150, Park Systems' large sample AFM, Non-Contact AFM imaging has become the most feasible and practical way to scan your large samples with ultimate AFM resolution and reliability. The XY motorized sample stage is optimized for both small and large sample placement, 150 mm x 150 mm, and allows full travel over the entire sample. Also, the Step-and-Scan automated sample measurement greatly minimizes user's required presence during system operation

Agilent 6000ILM Atomic Force Microscope (AFM)

The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope with those of an inverted light microscope or a confocal microscope, letting life science researchers go beyond the optical diffraction limit to achieve nanoscale resolution without any special sample preparation. It is ideal for studying cell membranes, the surface structure of cells, single DNA/RNA strands, individual proteins, single molecules, and biopolymers.

Dimension Icon Atomic Force Microscope (AFM) from Bruker

The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility.

Nanoeducator II Atomic Force Microscope (AFM) from NT-MDT

The NT-MDT Nanoeducator II is a semiprofessional atomic force microscope (AFM) system for training scientific laboratories both for investigation/problem solving and nanotechnology teaching.

Park Systems XE-HDM Automatic Defect Review Atomic Force Microscope

XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput when compared with other methods of defect review.

Photoconductive AFM (pcAFM) Module for Dimension Icon Atomic Force Microscope from Bruker

Bruker’s Photoconductive Module for the Dimension Icon® Atomic Force Microscope (AFM) enables quantitative nanoscale electrical characterization of organic photovoltaics (OPVs) at the highest resolution.

3D Atomic Force microscope (AFM) - InSight from Bruker

For unparalleled accuracy and precision – the kind needed for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features -- the InSight™ 3D Atomic Force Microscope (AFM) from Bruker is the clear choice.

BioScope Catalyst Atomic Force Microscope (AFM) from Bruker

The BioScope™ Catalyst™ Atomic Force Microscope (AFM) with ScanAsyst™ provides uncompromised high-resolution optical imaging capability and thermally limited force measurements and features numerous hardware and software features that make it easier than ever to realize the unique benefits of combining atomic force microscopy and light microscopy.

JPK Instruments NanoWizard 3 BioAFM

The NanoWizard® 3 BioScience AFM is the only AFM system on the market which is designed for optimal use in liquid and comes with a vapor barrier, encapsulated piezos and a variety of dedicated liquid cells for applications ranging from single molecules to living cells. Of course, one can use the system in air or controlled environment too.

Nanosurf FluidFM Fluid Force Microscope

Fluid Force Microscope is a sophisticated tool that combines AFM and nanofluidics. It redefines control and application possibilities in single-cell micromanipulation and beyond by merging the distinct possibilities of nanofluidics by Cytosurge with the force sensitivity and positional precision of the atomic force microscope.

NTEGRA Spectra - AFM / Confocal Raman & Fluorescence / SNOM / TERS from NT-MDT

The NTEGRA SPECTRA is a unique integration of Scanning Probe Microscope and confocal microscopy/luminescence and Raman scattering spectroscopy. Owing to the effect of huge tip enhanced Raman scattering it allows carrying out Raman spectroscopy and obtaining images with resolution up to 50 nm.

Nanosurf LensAFM

The Nanosurf LensAFM is an atomic force microscope that can be used in place of a normal objective lens on almost any optical microscope or profilometer.

CSM Instruments Atomic Force Microscope

CSM Instruments offers scanning probe microscopy or atomic force microscope, a technique designed for analysing surface topography on the nanoscale.

Fast Scanning Atomic Force Microscope for Biological Systems - Dimension FastScan Bio from Bruker Nano Surfaces

The Dimension FastScan Bio from Bruker Nano Surfaces features high-resolution and high-speed scanning providing the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.

Park Systems XE-BIO Atomic Force Microscope

XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry's only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform.

Nanosurf FlexAFM

For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of applications to be performed easily.

DME BRR Microscope - Hybrid SEM/AFM

The BRR microscope is a unification of a scanning electron microscope with an atomic force microscope. It unites the best of both worlds without making performance compromises for both components.

BioLyser Scanning Near-Field Optical Microscope SNOM from Triple-O

The BioLyser from Triple-O is an innovative three-in-one modular microscope that combines all the features of a Scanning Near-Field Optical Microscope (SNOM), with an AFM and a conventional inverted optical microscope.

NTEGRA Life Atomic Force Microscope (AFM) for Biological and Medical Applications by NT-MDT

NTEGRA Life by NT-MDT is a NanoLaboratory, integrating Atomic Force Microscope and inverted optical microscope with NA 0.55 condensers. It is used for biological and medical researchers in physiological conditions.

Nanosurf & Kleindiek AFM for SEM - Combined Scanning Electron and Atomic Force Microscopy

A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.

Agilent 5420 Atomic Force Microscope (AFM)

The 5420 AFM has been engineered by Agilent Technologies to provide lower noise, enhanced performance, and greater versatility. Featuring a new ergonomic design, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price.

Nanosurf NaniteAFM

The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments.

5100 Atomic Force Microscope (AFM) From Agilent

The Agilent 5100 AFM/SPM microscope is a high-resolution system that provides excellent imaging capabilities in an easy-to-upgrade package. The 5100 offers researchers many of the same features as Agilent’s sophisticated 5500 AFM/SPM microscope at an entry-level price. It is ideal for polymer, general surface characterization and materials applications

Renishaw Raman with Fully Integrated AFM

Renishaw have developed optimised direct coupling technology making the inVia Raman microscope the perfect partner for coupling to a wide variety of SPM's, such as the NT-MDT NTEGRA offering Tip Enhanced Raman Spectroscopy (TERS), near-field techniques (SNOM, NSOM) and Raman-AFM capabilities.

Nanonics AFM Raman & Tip Enhanced TERS Solutions

By placing a Nanonics AFM NSOM microscope with its free optical axis, onto a standard Raman microscope, for the first time it is possible to integrate the separate worlds of Raman and AFM. The integration of the Nanonics MultiView system with the Renishaw RM Series Raman Microscope marks the beginning of a new era in high-resolution Raman spectroscopy.

Nanosurf NaioAFM - All-in-One Atomic Force Microscope

Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and affordably-priced. It is compact enough to fit into any place.