Atomic Force Microscopes (AFM) RSS Feed - Atomic Force Microscopes (AFM)

Atomic force microscopes (AFM) are one of the most powerful tools for determining surface topography at subnanometer resolution. The technique involves imaging a sample through the use of a probe, or tip, with a radius of 20 nm. The tip is held several nanometers above the surface using a feedback mechanism that measures surface–tip interactions on the scale of nanoNewtons. Variations in tip height are recorded while the tip is scanned repeatedly across the sample, producing a topographic image of the surface.
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Featured Equipment
The Innova atomic force microscope from Bruker provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns.
The Dimension FastScan™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. Based upon the highly successful Dimension Icon® AFM architecture, the FastScan AFM is a tip-scanning system that provides measurements on both large and small size samples in air or fluids.
MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements.
The P100 AFM from Ardic Instruments has a sub-nanometer Z-axis resolution, making it ideal for high resolution imaging and measurement. The intuitive control software means that users can complete experiments with minimal training.
MFP Nanoindenter is a true instrumented indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism.
Other Equipment
CSM Instruments offers scanning probe microscopy or atomic force microscope, a technique designed for analysing surface topography on the nanoscale.
The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility.
Renishaw have developed optimised direct coupling technology making the inVia Raman microscope the perfect partner for coupling to a wide variety of SPM's, such as the NT-MDT NTEGRA offering Tip Enhanced Raman Spectroscopy (TERS), near-field techniques (SNOM, NSOM) and Raman-AFM capabilities.
The 100% automated SmartSPM system from AIST-NT offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.
The BRR microscope is a unification of a scanning electron microscope with an atomic force microscope. It unites the best of both worlds without making performance compromises for both components.
The MFP-3D Origin™ marks the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family.
The CombiScope 1000 from AIST-NT is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you.
Asylum Research introduces the Cypher ES, which adds full environmental control to the Cypher family.
Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and affordably-priced. It is compact enough to fit into any place.
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers streamlined access to top AFM performance, representing a new level of productivity and attainability for the most advanced nanoscale research. It leverages the many innovations of the Dimension® Icon® System to provide levels of performance and functionality only available from Bruker.
The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope with those of an inverted light microscope or a confocal microscope, letting life science researchers go beyond the optical diffraction limit to achieve nanoscale resolution without any special sample preparation. It is ideal for studying cell membranes, the surface structure of cells, single DNA/RNA strands, individual proteins, single molecules, and biopolymers.
XE-70 is Park Systems' AFM solution for researchers with limited budget. XE-70 does not compromise any of the innovative technologies of the XE-series that sets it apart from conventional AFMs, supporting the same modes, options, and electronics as all other systems in the XE product line.
The BioLyser from Triple-O is an innovative three-in-one modular microscope that combines all the features of a Scanning Near-Field Optical Microscope (SNOM), with an AFM and a conventional inverted optical microscope.
The 5420 AFM has been engineered by Agilent Technologies to provide lower noise, enhanced performance, and greater versatility. Featuring a new ergonomic design, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price.
The BioScope™ Catalyst™ Atomic Force Microscope (AFM) with ScanAsyst™ provides uncompromised high-resolution optical imaging capability and thermally limited force measurements and features numerous hardware and software features that make it easier than ever to realize the unique benefits of combining atomic force microscopy and light microscopy.
NTEGRA Life by NT-MDT is a NanoLaboratory, integrating Atomic Force Microscope and inverted optical microscope with NA 0.55 condensers. It is used for biological and medical researchers in physiological conditions.
The new Agilent 7500 AFM/SPM is versatile, features excellent performance, versatility and ease-of-use for nanoscale characterization, measurement and manipulation.
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of applications to be performed easily.
Park XE7 has all the sophisticated technology expected from Park Systems at an affordable price.
For unparalleled accuracy and precision – the kind needed for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features -- the InSight™ 3D Atomic Force Microscope (AFM) from Bruker is the clear choice.
Nanoscan PPMS-AFM is a high-resolution atomic force microscope (AFM) that provides unparalleled magnetic imaging. The instrument measures less than 25mm in diameter and fits within Quantum Design's PPMS® (Physical Property Measuring System).
With the arrival of the XE-150, Park Systems' large sample AFM, Non-Contact AFM imaging has become the most feasible and practical way to scan your large samples with ultimate AFM resolution and reliability. The XY motorized sample stage is optimized for both small and large sample placement, 150 mm x 150 mm, and allows full travel over the entire sample. Also, the Step-and-Scan automated sample measurement greatly minimizes user's required presence during system operation
Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series' decoupled XY and Z scanning system, allows for characterization of undercut features as well as top surfaces. In using Park Systems' True Non-Contact mode, the XE-3DM can realize non-destructive imaging of soft photoresist structures at the same scanning speed as any other XE-series platform.
WITec’s alpha300 A is a high-performance atomic force microscope (AFM) designed for life sciences, materials research, and nanotechnology.
The MultiMode® 8 Atomic Force Microscope (AFM) from Bruker is everything you would expect from the extraordinary MultiMode microscope platform that has set the standard for high-resolution atomic force microscopy imaging for over 15 years. Now, the latest MultiMode 8 AFM system incorporates surprising new features and accessories that take the distinguished MultiMode Atomic Force Microscope platform to even higher levels of performance, speed, and ease of use.
The NTEGRA SPECTRA is a unique integration of Scanning Probe Microscope and confocal microscopy/luminescence and Raman scattering spectroscopy. Owing to the effect of huge tip enhanced Raman scattering it allows carrying out Raman spectroscopy and obtaining images with resolution up to 50 nm.
Bruker’s Photoconductive Module for the Dimension Icon® Atomic Force Microscope (AFM) enables quantitative nanoscale electrical characterization of organic photovoltaics (OPVs) at the highest resolution.
The Nanosurf Isostage is an advanced and compact active vibration isolation system that helps protect scans from vibration disturbances. It comes with Adapter Plates for Mobile S, Easyscan 2, and Nanite AFM systems, thus providing an ideal vibration isolation solution for all Nanosurf AFM systems.
The NanoWizard® 3 BioScience AFM is the only AFM system on the market which is designed for optimal use in liquid and comes with a vapor barrier, encapsulated piezos and a variety of dedicated liquid cells for applications ranging from single molecules to living cells. Of course, one can use the system in air or controlled environment too.
The MFP-3D-BIO is a high-performance Atomic Force Microscope (AFM) designed specifi cally for biological applications. It is a versatile AFM that combines molecular resolution imaging and pN force-based measurements on an inverted optical microscope.
Fluid Force Microscope is a sophisticated tool that combines AFM and nanofluidics. It redefines control and application possibilities in single-cell micromanipulation and beyond by merging the distinct possibilities of nanofluidics by Cytosurge with the force sensitivity and positional precision of the atomic force microscope.
The DME DS 95 Navigator 220™ enables to investigate one and the same area again even after removing the sample from the AFM. Based on reference structures the system finds the area of interest with a precision better then 250nm.
XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput when compared with other methods of defect review.
You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher™ AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with >20X faster scanning and striking ease of use.
Nanoscan's standalone SPM Controller features a modular design, which allows you to create a tailor-made solution for your UHV SPM system.
Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry's only True Non-Contact mode imaging for both air and liquid imaging. Flexible configurations allow integration with other advanced optical measurement techniques such as Raman spectroscopy.
AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).
The Dimension FastScan Bio from Bruker Nano Surfaces features high-resolution and high-speed scanning providing the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.
Rtec Instruments has designed a combination system that can accommodate white light interferometer and AFM on the same platform.
ForceRobot®300 from JPK Instruments is a fully automated force spectroscope that allows the real-time study of molecular interactions and is built to perfectly address all the demands of a cutting edge force spectroscopy experiment. Using it overcomes the limitations of traditional force measurements. The automated setup and continuous adjustments provide high efficiency of data collection. Integration with optical techniques allows targeted measurements at the molecules of interest.
The NT-MDT Nanoeducator II is a semiprofessional atomic force microscope (AFM) system for training scientific laboratories both for investigation/problem solving and nanotechnology teaching.
Regardless of sample size, the Agilent 5600LS large-stage AFM is ready to deliver high-resolution results. This versatile instrument from Agilent Technologies is the world’s only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with a 9µm x 9µm AFM or STM scanner.
The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.
Park NX10 provides consistent data that can be replicated and published at the highest nano resolution.
As a failure analysis engineer, results are expected. There is no room for error in data given by the instruments.
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and engineering. It can adopt a wide range of optical coupling with its open side access.
The Nanosurf LensAFM is an atomic force microscope that can be used in place of a normal objective lens on almost any optical microscope or profilometer.
Bruker’s PeakForce KPFM™ module for the Dimension Icon® and MultiMode® 8 AFMs combines the complete set of KPFM detection mechanisms, including amplitude and frequency modulation, with both TappingMode™ and PeakForce Tapping™ to provide directly correlated quantitative nanomechanical data.
The Agilent 5500 inverted light microscope (ILM) system combines the power of a high-resolution atomic force microscope with the direct optical viewing capability of an inverted optical microscope. The system’s advanced design allows the AFM to sit on top of an inverted microscope and under the illumination pillar, resulting in better optical contrast for the images.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.
XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry's only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform.
The Agilent 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Agilent Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.
The unparalleled small footprint of the NaniteAFM scan head makes it the ideal atomic force microscope for integration into automated industrial environments.
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