Atomic Force Microscopes (AFM) RSS Feed - Atomic Force Microscopes (AFM)

Atomic force microscopes (AFM) are one of the most powerful tools for determining surface topography at subnanometer resolution. The technique involves imaging a sample through the use of a probe, or tip, with a radius of 20 nm. The tip is held several nanometers above the surface using a feedback mechanism that measures surface–tip interactions on the scale of nanoNewtons. Variations in tip height are recorded while the tip is scanned repeatedly across the sample, producing a topographic image of the surface.
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Featured Equipment
The P100 AFM from Ardic Instruments has a sub-nanometer Z-axis resolution, making it ideal for high resolution imaging and measurement. The intuitive control software means that users can complete experiments with minimal training.
MFP Nanoindenter is a true instrumented indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism.
The Innova atomic force microscope from Bruker provides high resolution imaging and a broad range of functionality for application flexibility at a moderate cost - ideal for research use in life sciences, materials, and physical studies.
Asylum Research offers MFP-3D Infinity, the latest and most advanced atomic force microscope (AFM) in the MFP-3D series.
The NTEGRA Spectra is a unique integration of Scanning Probe Microscope and confocal microscopy/luminescence and Raman scattering spectroscopy. Owing to the effect of huge tip enhanced Raman scattering it allows carrying out Raman spectroscopy and obtaining images with resolution up to 50 nm.
The Dimension FastScan™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs. Based upon the highly successful Dimension Icon® AFM architecture, the FastScan AFM is a tip-scanning system that provides measurements on both large and small size samples in air or fluids.
Other Equipment
EZ Temp - Nano-Observer AFM from CSI is a device primarily designed to provide accurate temperature control and imaging during temperature changes. The device is well-matched with all the AFM modes. A heating sample stage is provided to analyze phase alterations on materials, polymers, or biological samples.
As a failure analysis engineer, results are expected. There is no room for error in data given by the instruments.
A new and advanced plug-and-play retrofit solution is being offered by Nanosurf and Kleindiek. The combined functions of Scanning Electron Microscopes (SEM) and Atomic Force Microscopy (AFM) open up a new level of possibilities.
Fluid Force Microscope is a sophisticated tool that combines AFM and nanofluidics. It redefines control and application possibilities in single-cell micromanipulation and beyond by merging the distinct possibilities of nanofluidics by Cytosurge with the force sensitivity and positional precision of the atomic force microscope.
The DME DS 95 Navigator 220™ enables to investigate one and the same area again even after removing the sample from the AFM. Based on reference structures the system finds the area of interest with a precision better then 250nm.
Park Systems offers the XE15 atomic force microscope, which is suitable for researchers performing multi variant experiments, failure analysis engineers working on wafers, and shared labs handling a wide range of samples.
NT-MDT’s OPEN is a fully automated desktop atomic force microscope (AFM) specifically designed for science and technology applications.
Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and affordably-priced. It is compact enough to fit into any place.
Park NX10 provides consistent data that can be replicated and published at the highest nano resolution.
For unparalleled accuracy and precision – the kind needed for non-destructive, high-resolution 3D measurements of critical 45nm and 32nm semiconductor features -- the InSight™ 3D Atomic Force Microscope (AFM) from Bruker is the clear choice.
The 100% automated SmartSPM system from AIST-NT offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.
Nanoscan PPMS-AFM is a high-resolution atomic force microscope (AFM) that provides unparalleled magnetic imaging. The instrument measures less than 25mm in diameter and fits within Quantum Design's PPMS® (Physical Property Measuring System).
Bruker’s Photoconductive Module for the Dimension Icon® Atomic Force Microscope (AFM) enables quantitative nanoscale electrical characterization of organic photovoltaics (OPVs) at the highest resolution.
Bruker’s PeakForce KPFM™ module for the Dimension Icon® and MultiMode® 8 AFMs combines the complete set of KPFM detection mechanisms, including amplitude and frequency modulation, with both TappingMode™ and PeakForce Tapping™ to provide directly correlated quantitative nanomechanical data.
Anasys Instruments has introduced nanoIR2, a new AFM-based IR spectrometer that expands nanoscale IR to a wide range of real world samples.
XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry's only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform.
The Nanosurf LensAFM is an atomic force microscope that can be used in place of a normal objective lens on almost any optical microscope or profilometer.
Park XE7 has all the sophisticated technology expected from Park Systems at an affordable price.
CSI’s ResiScope II AFM is a unique dual measurement system that is capable of measuring resistance over 10 decades with a high resolution and sensitivity. It can be integrated with numerous dynamic modes as KFM single-pass (AC/MAC III) or MFM/EFM (AC/MAC mode) providing many sample characterization on the same scan area.
The MFP-3D-BIO is a high-performance Atomic Force Microscope (AFM) designed specifi cally for biological applications. It is a versatile AFM that combines molecular resolution imaging and pN force-based measurements on an inverted optical microscope.
The CombiScope 1000 from AIST-NT is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you.
The new Keysight 7500 AFM/SPM is versatile, features excellent performance, versatility and ease-of-use for nanoscale characterization, measurement and manipulation.
The NanoWizard® 3 BioScience AFM is the only AFM system on the market which is designed for optimal use in liquid and comes with a vapor barrier, encapsulated piezos and a variety of dedicated liquid cells for applications ranging from single molecules to living cells. Of course, one can use the system in air or controlled environment too.
NT-MDT offers a fully automated AFM-Raman-SNOM system called SPECTRUM. This instrument integrates AFM with multiple optical techniques such as SNOM, TERS and confocal Raman/fluorescence microscopy in a compact design.
WITec’s alpha300 A is a high-performance atomic force microscope (AFM) designed for life sciences, materials research, and nanotechnology.
NT-MDT has introduced Titanium, the first atomic force microscope (AFM) with a self-aligning, multiple probe cartridge for fast and automated tip exchange.
Nanoscan's standalone SPM Controller features a modular design, which allows you to create a tailor-made solution for your UHV SPM system.
MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements.
NTEGRA Aura from NT-MDT is an advanced scanning probe microscope specifically designed to conduct research in external magnetic fields, vacuum and controlled environment conditions.
For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand. By advancing key technologies and designs, Nanosurf has made the FlexAFM one of the most versatile and flexible atomic force microscopes ever, allowing a large variety of applications to be performed easily.
NTEGRA Life by NT-MDT is a NanoLaboratory, integrating Atomic Force Microscope and inverted optical microscope with NA 0.55 condensers. It is used for biological and medical researchers in physiological conditions.
XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput when compared with other methods of defect review.
NT-MDT’s NEXT is an easy-to-use atomic force microscope that allows multiple AFM and STM capabilities and delivers excellent performance.
Ardic Instruments’ P300 Atomic Force Microscope is a highly comprehensive instrument that can be used for a variety of nano- experimental needs. It offers the operator many scanner options and the flexibility of operation.
Asylum Research introduces the Cypher ES, which adds full environmental control to the Cypher family.
Regardless of sample size, the Keysight 5600LS large-stage AFM is ready to deliver high-resolution results. This versatile instrument from Agilent Technologies is the world’s only commercially available AFM that allows imaging of both large samples (in air) and small samples (in air, or in liquid under temperature control) with a 9µm x 9µm AFM or STM scanner.
NT-MDT's SOLVER Nano atomic force microscope (AFM) is specifically designed for research and education purposes.
Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series' decoupled XY and Z scanning system, allows for characterization of undercut features as well as top surfaces. In using Park Systems' True Non-Contact mode, the XE-3DM can realize non-destructive imaging of soft photoresist structures at the same scanning speed as any other XE-series platform.
The BRR microscope is a unification of a scanning electron microscope with an atomic force microscope. It unites the best of both worlds without making performance compromises for both components.
The PPMS® atomic force microscope (AFM) designed by NanoScan is suitable for superior MFM imaging. The AFM, a one inch high-resolution device, was developed for the Quantum Design Physical Property Measuring System (PPMS®).
The MultiMode® 8 Atomic Force Microscope (AFM) from Bruker is everything you would expect from the extraordinary MultiMode microscope platform that has set the standard for high-resolution atomic force microscopy imaging for over 15 years. Now, the latest MultiMode 8 AFM system incorporates surprising new features and accessories that take the distinguished MultiMode Atomic Force Microscope platform to even higher levels of performance, speed, and ease of use.
The Dimension® Icon® Atomic Force Microscope with ScanAsyst™ brings new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world's most utilized large-sample AFM platform, the latest Dimension system is the culmination of decades of technological innovation, customer feedback and industry-leading application flexibility.
The Nano-Observer’s design will enable the instrument to be adapted to even future developments, and additional modules can be created for more advanced analysis on the same sample.
Renishaw have developed optimised direct coupling technology making the inVia Raman microscope the perfect partner for coupling to a wide variety of SPM's, such as the NT-MDT NTEGRA offering Tip Enhanced Raman Spectroscopy (TERS), near-field techniques (SNOM, NSOM) and Raman-AFM capabilities.
AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).
Bruker’s Inspire™ system delivers high-resolution nanoscale chemical and properties mapping with unparalleled AFM performance.
You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher™ AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with >20X faster scanning and striking ease of use.
The Nanosurf Isostage is an advanced and compact active vibration isolation system that helps protect scans from vibration disturbances. It comes with Adapter Plates for Mobile S, Easyscan 2, and Nanite AFM systems, thus providing an ideal vibration isolation solution for all Nanosurf AFM systems.
The MFP-3D Origin™ marks the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family.
CSM Instruments offers scanning probe microscopy or atomic force microscope, a technique designed for analysing surface topography on the nanoscale.
ForceRobot®300 from JPK Instruments is a fully automated force spectroscope that allows the real-time study of molecular interactions and is built to perfectly address all the demands of a cutting edge force spectroscopy experiment. Using it overcomes the limitations of traditional force measurements. The automated setup and continuous adjustments provide high efficiency of data collection. Integration with optical techniques allows targeted measurements at the molecules of interest.
The Keysight 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Keysight Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.
The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.
The Dimension® Edge™ Atomic Force Microscope (AFM) System offers access to the highest performance, accessibility and functionality in its class, by incorporating Bruker's PeakForce Tapping® technology.
The Dimension FastScan Bio from Bruker Nano Surfaces features high-resolution and high-speed scanning providing the best available bio tool for the observation of molecules, proteins, DNA, RNA, living cell membranes and tissues, and many other dynamics studies.
Keysight Technologies has introduced the 7500 inverted light microscope (ILM) system which integrates the direct optical viewing capability of an inverted optical microscope with the power of a high-resolution atomic force microscope (AFM).
The BioLyser from Triple-O is an innovative three-in-one modular microscope that combines all the features of a Scanning Near-Field Optical Microscope (SNOM), with an AFM and a conventional inverted optical microscope.
CSI’s Nano-Observer is an advanced AFM microscope that is both powerful and flexible. It is built to provide both high level performance and easy usage with the aid of advanced technologies. The USB controller has a real integrated lock-in to enable improved measurement capability such as phase detection and piezo-response mode.
The BioScope Resolve™ atomic force microscope (AFM) available from Bruker is a next-generation system that provides new insights into mechanobiology research. It features high resolution AFM imaging and comes with complete cell mechanics capabilities for use with inverted optical microscopes.
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