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Park NX10 – High Accuracy, Non-Contact Research AFM

Park NX10 – High Accuracy, Non-Contact Research AFM

Park NX10 provides consistent data that can be replicated and published at the highest nano resolution. It features the world’s true non-contact AFM that increases tip life while prolonging the sample and flexure based independent XY and Z scanner for unparalleled accuracy and resolution.

Key Features

The key features of the Park NX10 are:

  • Industry leading XYZ scan linearity with two independent flexure scanners for sample and tip
  • Excellent out-of-plane motion of below 1 nm over the entire XY scan range
  • Z scanner linearity of less than 0.015%
  • Reduced XY scanner ringing by forward sine-scan algorithm
  • Industry leading Z-scanner bandwidth of more than 9 kHz, or Z-servo speed of more than 62 mm/sec tip velocity
  • Fastest scan speed in non-contact mode imaging
  • Less tip wear for prolonged high-quality scans
  • Minimized sample damage or modification
  • Sample topography measured by industry leading low noise Z detector
  • Industry leading, small forward and backward scan gap of less than 0.15%
  • Minimized system drift and hysteresis by thermally matched components
  • Active temperature control of acoustic enclosure
  • Easy tip exchange with wide open side access to the tip and sample
  • Easy, intuitive laser alignment with pre-aligned tip mount and patented on-axis, top down view
  • Fast automatic tip approach to sample surface within 10 seconds
  • 24 bit digital electronics with three internal lock-ins, Q-control, and spring constant calibration

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