Nanosurf offers NaioAFM, an all-in-one atomic force microscope that is specifically designed for small sample measurements and nanoeducation. The high-performance AFM system is easy to handle and affordably-priced. It is compact enough to fit into any place.
The product features of the NaioAFM atomic force microscope are:
- Top view camera of high resolution as well as side view sample observation are integrated
- Integrated controller, vibration isolation, airflow shielding, and XY-table (12 mm)
- All standard operating modes are available
- Easy cantilever exchange: detector or laser adjustment is not needed
- Easy-to-use software wizards instantly prepare measurement parameters
- System setup is not required; simply plug into the computer and start the software