Optical Characterization Systems

Optical Characterization refers to the use of optical techniques to study of solid-state and biological phenomena at the nanoscale.
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Equipment
Navitar designs and manufactures custom microscope objective lenses that are ideal for OEMS and researchers who demand optimized solutions for complex applications, which otherwise cannot be solved using standard microscope objective lenses.
The SARFUS Mapping Station is a complete system dedicated to the observation of nano-objects in real-time and the measurement of ultra-thin film optical thickness in dry and in liquid. Each component of this product has been carefully chosen to ensure the image quality of your samples as well as the accuracy of the nanometric measurement.
Surfs slides are a new generation of microscope slides with unique contrast-enhanced properties allowing the direct characterization of nanometric samples (down to 0.1nm) from a conventional optical microscope. They are used as a direct replacement for glass slides, and can be used in different environments (air, water, etc) and with many different optical microscope setups.
Marked Surfs Slides enable you to quickly and accurately locate your nano-objects prior to high resolution imaging, mapping, local physical measurements, surface elemental/chemical analysis by SPM/AFM, microRaman, microFTIR, XPS, SIMS etc
The Video ZFL Scopes available from Navitar are micro- and macro-fluorescence vision system that employ internal focus and interchangeable professional fluorescence cubes to generate images.
Hamamatsu offers a precision optical laser beam profiler called LEPAS-12, which is an important tool for configuring an optical beam measurement system.
Reflection spectroscopy is a powerfull tool for the investigation of orientation, association, adsorption and chemical change of chromophores in monlayers at the air water interface. The variable angle RefSpec2 VA features precision motorized angle-of-incidence adjustments and a motorized polarizer and analyzer
SARFUS Mapping Lite is a hardware-free plug-in that renders your existing optical setup (i.e. an upright reflected light microscope associated with a colour camera) capable of measuring the optical thickness of thin transparent films in air up to 60 nm in thickness.
The C10178-03 Optical NanoGauge available from Hamamatsu is a film thickness measurement system that uses spectral interferometry. With the help of white light illumination, film thickness is recorded instantly and non-destructively.
The nanofilm_ultrabam is used to visualize Langmuir monolayers or adsorbate films at the air/water interface. Due to itLs unique imaging optics, fully focused images at 20-35 frames per second are provided.
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