Optical Characterization Systems RSS Feed - Optical Characterization Systems

Optical Characterization refers to the use of optical techniques to study of solid-state and biological phenomena at the nanoscale.
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Equipment
Navitar designs and manufactures custom microscope objective lenses that are ideal for OEMS and researchers who demand optimized solutions for complex applications, which otherwise cannot be solved using standard microscope objective lenses.
The Video ZFL Scopes available from Navitar are micro- and macro-fluorescence vision system that employ internal focus and interchangeable professional fluorescence cubes to generate images.
The C10178-03 Optical NanoGauge available from Hamamatsu is a film thickness measurement system that uses spectral interferometry. With the help of white light illumination, film thickness is recorded instantly and non-destructively.
Izon’s design expertise and ability in nanoparticle analysis is applied by qMicro to measurement at the micron scale. This has caused an easy, robust and simple method to operate a bench top device highly accessible to a wide range of labs.
The SARFUS Mapping Station is a complete system dedicated to the observation of nano-objects in real-time using SEEC (Surface Enhanced Ellipsometric Contrast), and the measurement of ultra-thin film thickness in dry and in liquid.
Surfs slides are a new generation of microscope slides with unique contrast-enhanced properties allowing the direct characterization of nanometric samples (down to 0.1nm) from a conventional optical microscope. They are used as a direct replacement for glass slides, and can be used in different environments (air, water, etc) and with many different optical microscope setups.
Hamamatsu offers a precision optical laser beam profiler called LEPAS-12, which is an important tool for configuring an optical beam measurement system.
SARFUS Mapping Lite is a hardware-free plug-in that renders your existing optical setup (i.e. an upright reflected light microscope associated with a colour camera) capable of measuring the optical thickness of thin transparent films in air up to 60 nm in thickness.
Marked Surfs Slides enable you to quickly and accurately locate your nano-objects prior to high resolution imaging, mapping, local physical measurements, surface elemental/chemical analysis by SPM/AFM, microRaman, microFTIR, XPS, SIMS etc
Site Sponsors
  • Park Systems - Manufacturer of a complete range of AFM solutions
  • Strem Chemicals - Nanomaterials for R&D
  • Oxford Instruments Nanoanalysis - X-Max Large Area Analytical EDS SDD