Scanning Probe Microscopes (SPM) RSS Feed - Scanning Probe Microscopes (SPM)

Scanning probe microscopes (SPM) is a branch of microscopy that creates images of surfaces using a physical probe that scans a specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. Scanning probe microscopes allow scientists to image, characterize and even manipulate material structures at exceedingly small scales including features of atomic proportions.
If you'd like us to help you source a Quotation for Scanning Probe Microscopes (SPM) please click here. Once submitted, we will try and place you in contact with a suitable Scanning Probe Microscopes (SPM) supplier within 48 hours.
Featured Equipment
The P100 AFM from Ardic Instruments has a sub-nanometer Z-axis resolution, making it ideal for high resolution imaging and measurement. The intuitive control software means that users can complete experiments with minimal training.
The Innova atomic force microscope from Bruker provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns.
Other Equipment
The Nanosurf Easyscan 2 is a modular SPM tool that is specifically designed for industrial and scientific research. This surface analysis tool is affordably-priced and can be upgraded to meet future requirements, thus removing the need for off-the-shelf solutions.
Take the award-winning XE-100, shrink it such that it can be placed on top of the many popular inverted optical microscopes, and you have the versatile XE-120, an exceptional AFM with expanded sample and interactivity flexibility. The XE-120 is the research grade AFM with industry's only True Non-Contact mode imaging for both air and liquid imaging. Flexible configurations allow integration with other advanced optical measurement techniques such as Raman spectroscopy.
AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).
The XE-100 is our flagship AFM with reduced drift rate and the Step-and-Scan Automation that provides the ultimate AFM/SPM performance in Non-Contact nanoscale metrology. It is a mid-priced system for materials science, polymers, electrochemistry and other applications in nanoscience and engineering. It can adopt a wide range of optical coupling with its open side access.
The DME Igloo Stage offers outstanding stability and easy handling at an affordable price level. A handling and performance optimized design makes it the optimal system for everyday measurement routines on small samples.
Nanoscan's standalone SPM Controller features a modular design, which allows you to create a tailor-made solution for your UHV SPM system.
NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.
The 100% automated SmartSPM system from AIST-NT offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.
XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry's only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform.
Based on the popular Easyscan 2 STM tool, the NaioSTM is integrated with controller and scan head in a single device for convenient use, installation, and transportation. The entire setup is resistant to vibrations and can be employed in regular classroom situations. Integrated controller in the system saves valuable workbench space.
As a failure analysis engineer, results are expected. There is no room for error in data given by the instruments.
The Agilent 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Agilent Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.
The Solver Next is the first to offer a new concept in general purpose SPM. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time. The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements.
The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.
The CombiScope 1000 from AIST-NT is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you.
We believe that future scientific breakthroughs have their origins in the present. Following that truth, we have developed a special student-orientated product: NanoEducator. More than a simple SPM, NanoEducator opens the door to nanotechnology education. We've designed it to be cost effective enough to equip a classroom with SPMs, complete with e-teach software, handbooks, and descriptive laboratory exercises - all the materials necessary to teach students crucial skills in nanotechnology.
The Nanosurf Isostage is an advanced and compact active vibration isolation system that helps protect scans from vibration disturbances. It comes with Adapter Plates for Mobile S, Easyscan 2, and Nanite AFM systems, thus providing an ideal vibration isolation solution for all Nanosurf AFM systems.
In high-end research AFM, performance and flexibility are the top design criteria. Common UHV SPMs are very specialized and far behind the ease of use of today’s standard AFMs or SPMs. With the DME UHV SPM, we bring flexibility and usability into ultra high vacuum applications: Use the variety of standard AFM cantilevers for your UHV experiments and jump over the limitation of necessarity for specialized tips.
Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series' decoupled XY and Z scanning system, allows for characterization of undercut features as well as top surfaces. In using Park Systems' True Non-Contact mode, the XE-3DM can realize non-destructive imaging of soft photoresist structures at the same scanning speed as any other XE-series platform.
Park XE7 has all the sophisticated technology expected from Park Systems at an affordable price.
You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher™ AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with >20X faster scanning and striking ease of use.
The DME small granite stage provides the possibility of investigating nearly all samples by SPM. From a splitter of a coated wafer to a whole nanocoated surgical implant, the small granite stage will suprise you with its flexibility.
XE-70 is Park Systems' AFM solution for researchers with limited budget. XE-70 does not compromise any of the innovative technologies of the XE-series that sets it apart from conventional AFMs, supporting the same modes, options, and electronics as all other systems in the XE product line.
With the arrival of the XE-150, Park Systems' large sample AFM, Non-Contact AFM imaging has become the most feasible and practical way to scan your large samples with ultimate AFM resolution and reliability. The XY motorized sample stage is optimized for both small and large sample placement, 150 mm x 150 mm, and allows full travel over the entire sample. Also, the Step-and-Scan automated sample measurement greatly minimizes user's required presence during system operation
The DME ProberStation 150 is the ultimate stage for SPM on large samples. Its long range XY translators allow the investigation of 150 mm samples at all positions and up to 300 mm on specific sample areas.
The DME DS 95 Navigator 220™ enables to investigate one and the same area again even after removing the sample from the AFM. Based on reference structures the system finds the area of interest with a precision better then 250nm.
Park NX10 provides consistent data that can be replicated and published at the highest nano resolution.
Angstrom Advanced offers the AA3000 and AA5000 Scanning Probe Microscopes that are customized for research and industry applications. The instruments enable users to carry out fast and simple analysis and can be customized to measure large sample size.
XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput when compared with other methods of defect review.