Scanning Probe Microscopes (SPM) RSS Feed - Scanning Probe Microscopes (SPM)

Scanning probe microscopes (SPM) is a branch of microscopy that creates images of surfaces using a physical probe that scans a specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. Scanning probe microscopes allow scientists to image, characterize and even manipulate material structures at exceedingly small scales including features of atomic proportions.
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Featured Equipment
The P100 AFM from Ardic Instruments has a sub-nanometer Z-axis resolution, making it ideal for high resolution imaging and measurement. The intuitive control software means that users can complete experiments with minimal training.
The Innova atomic force microscope from Bruker provides high resolution imaging and a broad range of functionality for application flexibility at a moderate cost - ideal for research use in life sciences, materials, and physical studies.
Other Equipment
XE-HDM is an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned, and analyzed. The new XE-HDM significantly increases throughput for the defect review process; test runs with real defects demonstrate over 500 - 800% gain in throughput when compared with other methods of defect review.
Park XE7 has all the sophisticated technology expected from Park Systems at an affordable price.
The DME small granite stage provides the possibility of investigating nearly all samples by SPM. From a splitter of a coated wafer to a whole nanocoated surgical implant, the small granite stage will suprise you with its flexibility.
Nanoscan's standalone SPM Controller features a modular design, which allows you to create a tailor-made solution for your UHV SPM system.
NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.
As a failure analysis engineer, results are expected. There is no room for error in data given by the instruments.
Angstrom Advanced offers the AA3000 and AA5000 Scanning Probe Microscopes that are customized for research and industry applications. The instruments enable users to carry out fast and simple analysis and can be customized to measure large sample size.
The Nanosurf Isostage is an advanced and compact active vibration isolation system that helps protect scans from vibration disturbances. It comes with Adapter Plates for Mobile S, Easyscan 2, and Nanite AFM systems, thus providing an ideal vibration isolation solution for all Nanosurf AFM systems.
The DME ProberStation 150 is the ultimate stage for SPM on large samples. Its long range XY translators allow the investigation of 150 mm samples at all positions and up to 300 mm on specific sample areas.
The 100% automated SmartSPM system from AIST-NT offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.
AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).
NanoScan’s SPM software is an advanced software designed to separate the control of the scanning probe microscope into a Windows-based user interface and a real-time crash-safe operating unit.
The Keysight 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Keysight Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.
Park Systems has revolutionized the AFM with the introduction of the XE-3DM, the fully automated AFM system designed for overhang and trench profiles, sidewall roughness and imaging, and critical angle measurements. The unique design of the XE-3DM, made possible by the XE-series' decoupled XY and Z scanning system, allows for characterization of undercut features as well as top surfaces. In using Park Systems' True Non-Contact mode, the XE-3DM can realize non-destructive imaging of soft photoresist structures at the same scanning speed as any other XE-series platform.
The DME Igloo Stage offers outstanding stability and easy handling at an affordable price level. A handling and performance optimized design makes it the optimal system for everyday measurement routines on small samples.
Park NX10 provides consistent data that can be replicated and published at the highest nano resolution.
In high-end research AFM, performance and flexibility are the top design criteria. Common UHV SPMs are very specialized and far behind the ease of use of today’s standard AFMs or SPMs. With the DME UHV SPM, we bring flexibility and usability into ultra high vacuum applications: Use the variety of standard AFM cantilevers for your UHV experiments and jump over the limitation of necessarity for specialized tips.
Based on the popular Easyscan 2 STM tool, the NaioSTM is integrated with controller and scan head in a single device for convenient use, installation, and transportation. The entire setup is resistant to vibrations and can be employed in regular classroom situations. Integrated controller in the system saves valuable workbench space.
The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.
You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher™ AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with >20X faster scanning and striking ease of use.
NanoScan’s VLS-80 high-precision scanning force microscope is designed to handle high-accuracy calibrated stage motion. The scan range for the device is 80 × 80 × 10µm3 with closed-loop operation. Its scan linearity is better than 0.1%.
The CombiScope 1000 from AIST-NT is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you.
The DME DS 95 Navigator 220™ enables to investigate one and the same area again even after removing the sample from the AFM. Based on reference structures the system finds the area of interest with a precision better then 250nm.
XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines industry's only True Non-Contact AFM with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform.