Scanning Probe Microscopes (SPM)

Scanning probe microscopes (SPM) is a branch of microscopy that creates images of surfaces using a physical probe that scans a specimen. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the probe-surface interaction as a function of position. Scanning probe microscopes allow scientists to image, characterize and even manipulate material structures at exceedingly small scales including features of atomic proportions.

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Featured Equipment

Scanning Probe Microscope (SPM) - Innova from Bruker

The Innova atomic force microscope from Bruker provides more performance and flexibility at a greater value than any other SPM. The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from sub-micron levels up to 90 microns.

The MultiView 2000 from SBS Equipment

The MultiView 2000TM series is a premium ultra-sensitive scanned probe microscope with a variety of modes of AFM/SPM/NSOM imaging.

Other Equipment

Agilent 5420 Atomic Force Microscope (AFM)

The 5420 AFM has been engineered by Agilent Technologies to provide lower noise, enhanced performance, and greater versatility. Featuring a new ergonomic design, this scientific-grade microscope delivers atomic-scale resolution at a remarkably affordable price.

NT-MDT NanoEducator Platform

We believe that future scientific breakthroughs have their origins in the present. Following that truth, we have developed a special student-orientated product: NanoEducator. More than a simple SPM, NanoEducator opens the door to nanotechnology education. We've designed it to be cost effective enough to equip a classroom with SPMs, complete with e-teach software, handbooks, and descriptive laboratory exercises - all the materials necessary to teach students crucial skills in nanotechnology.

AIST-NT SmartSPM 1000 Atomic Force Microscope

The 100% automated SmartSPM system from AIST-NT offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nano scale in all AFM and STM modes.

DME Ultra-High Vacuum SPM

In high-end research AFM, performance and flexibility are the top design criteria. Common UHV SPMs are very specialized and far behind the ease of use of today’s standard AFMs or SPMs. With the DME UHV SPM, we bring flexibility and usability into ultra high vacuum applications: Use the variety of standard AFM cantilevers for your UHV experiments and jump over the limitation of necessarity for specialized tips.

DME ScanTool SPM Software

The new DME ScanTool SPM Software combines in itself the experience of decades of software design and SPM development.

Nanonics MultiView 4000

SPM Systems with more than one probe that can image independently have always been a dream. This dream has become a reality with the MultiView 4000™ with its AFM, NSOM and SPM multiprobe capabilites and it's optical and electron optical compatibility.

Nanosurf NaioSTM - All-in-One Scanning Tunnelling Microscope

Based on the popular Easyscan 2 STM tool, the NaioSTM is integrated with controller and scan head in a single device for convenient use, installation, and transportation. The entire setup is resistant to vibrations and can be employed in regular classroom situations.

DME Igloo Stage for the DualScope 95 SPM

The DME Igloo Stage offers outstanding stability and easy handling at an affordable price level. A handling and performance optimized design makes it the optimal system for everyday measurement routines on small samples.

AIST-NT OmegaScope 1000 Scanning Probe Microscope

AIST-NT's OmegaScope™ 1000 AFM has been designed to be easily integrated with optical instruments such as Raman spectrometers, UV-VIS adsorption spectrometers etc. Open design of the AFM head makes it possible to have the high quality optical access from the top (100X, 0.70 NA), side (20X, 0.42 NA) or bottom (using any commercially available objective, including immersion objectives).

NT-MDT NTEGRA Prima Scanning Probe Microscope

NTEGRA Prima is capable of performing more than 40 measuring methods, what allows analyzing physical and chemical properties of the surface with high precision and resolution. It is possible to carry out experiments in air, as well as in liquids and in controlled environment. The new generation electronics provides operations in high-frequency (up to 5MHz) modes. This feature appears to be principal for the work with high-frequency AFM modes and using high-frequency cantilevers.

Nanosurf Acoustic Enclosure 300/500 for STM or AFM

The Acoustic Enclosure 300/500, available from Nanosurf, has been specifically designed for high-resolution measurements in noisy environments. The system provides excellent acoustic protection for Nanosurf STM or AFM system, and also protects them from electricity, light and air flow disturbances.

NT-MDT Solver NEXT Scanning Probe Microscope

The Solver Next is the first to offer a new concept in general purpose SPM. This new design offers "on-board expertise" opening the way for all user levels to acquire quality SPM images in a short amount of time. The hassle of manual setup has been eliminated. Intuitive automation guides you through the setup, adjustment and samples measurements.

AIST-NT CombiScope 1000 Scanning Probe Microscope

The CombiScope 1000 from AIST-NT is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics. If you work with transparent samples either in air or in liquid towards nano-scale structures and (near-field) nano-optical properties investigation, the CombiScope 1000 is the right solution for you.

DME ProberStation 150 for the DualScope 95 SPM

The DME ProberStation 150 is the ultimate stage for SPM on large samples. Its long range XY translators allow the investigation of 150 mm samples at all positions and up to 300 mm on specific sample areas.

Cypher AFM from Asylum Research

You've been expecting something genuinely new from the AFM/SPM industry, but for many years you've only seen tweaks to old technology. Now Asylum Research introduces the Cypher™ AFM, the first totally new small sample AFM/SPM in over a decade. More capability, more control, more functionality, more modularity, and more resolution - all with >20X faster scanning and striking ease of use.

DME Navigator 220 for the DualScope 95 SPM

The DME DS 95 Navigator 220™ enables to investigate one and the same area again even after removing the sample from the AFM. Based on reference structures the system finds the area of interest with a precision better then 250nm.

Agilent 5500 Atomic Force Microscope (AFM)

The Agilent 5500 AFM offers numerous unique features, such as patented top-down scanning and unrivaled environmental and temperature control, while providing maximum flexibility and modularity. The universal microscope base permits easy integration with an environmental chamber or an inverted optical microscope. Sample preparation is made easy with Agilent Technologies’ unique sample plates, which have been designed for many different applications, including imaging in fluids.

Nanosurf Easyscan 2 Modular SPM

The Nanosurf Easyscan 2 is a modular SPM tool that is specifically designed for industrial and scientific research. This surface analysis tool is affordably-priced and can be upgraded to meet future requirements, thus removing the need for off-the-shelf solutions.

Agilent 6000ILM Atomic Force Microscope (AFM)

The Agilent 6000ILM AFM seamlessly integrates the capabilities of an atomic force microscope with those of an inverted light microscope or a confocal microscope, letting life science researchers go beyond the optical diffraction limit to achieve nanoscale resolution without any special sample preparation. It is ideal for studying cell membranes, the surface structure of cells, single DNA/RNA strands, individual proteins, single molecules, and biopolymers.

DME Granite Stage for the DualScope 95 SPM

The DME small granite stage provides the possibility of investigating nearly all samples by SPM. From a splitter of a coated wafer to a whole nanocoated surgical implant, the small granite stage will suprise you with its flexibility.

Nanonics AFM Raman & Tip Enhanced TERS Solutions

By placing a Nanonics AFM NSOM microscope with its free optical axis, onto a standard Raman microscope, for the first time it is possible to integrate the separate worlds of Raman and AFM. The integration of the Nanonics MultiView system with the Renishaw RM Series Raman Microscope marks the beginning of a new era in high-resolution Raman spectroscopy.