X-Ray Diffractometers RSS Feed - X-Ray Diffractometers

An x-ray diffractometer illuminates a sample of material with x-rays of known wavelength, moving the sample and detector in order to measure the intensity of the diffracted radiation as a function of beam and sample orientation. From the resulting intensity versus angle plot much can be inferred about the structure of the material.
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Featured Equipment
Empyrean is a true multi-purpose research x-ray diffractometer. Like no other system available, the Empyrean platform is designed for now, and for years to come. It is PANalytical’s answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project.
Other Equipment
Rigaku’s new nano3DX X-ray microscope features high-resolution optics and high-power rotating anode combined with sub-micron CCD technology.
The MinFlex series of benchtop X-ray Diffraction Analyzers is a general purpose X-ray diffractometer that can perform quantitative and qualitative analysis of polycrystalline materials.
The RAPID II is a highly versatile X-ray area detector in the history of materials analysis.
The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
The X'Pert PRO MRD XL is an enlarged and improved version of PANalytical’s proven X'Pert PRO MRD XRD system. By facilitating X-ray analysis during the process development stage, the X'Pert PRO MRD XL represents the logical 'next step' in advanced materials analysis. it is suited to the analysis is semiconductors and advanced materials.
The Ultima IV symbolizes advanced X-ray diffraction (XRD) systems.The system includes Rigaku’s patented cross beam optics (CBO) technology for permanently aligned, mounted, and user-selectable parallel and focusing geometries.
The TTRAX III is the world’s most powerful diffractometer. This diffractometer uses an 18 kW rotating anode X-ray source in a q/q geometry offering the ideal system for challenging applications.
PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for advanced materials science and nanotechnology and metrologic characterization in semiconductor process development.
CubiX3 delivers exceptional analysis speed, reliability and reproducibility. Introducing new features such as high-intensity data collection and extra flexibility in sample handling for automated environments, CubiX3 can be set up for fully automated, push-button operation. Its initial investment is rapidly earned back because of the ease of operation, the independency of operators and the safety for the users, when compared to traditional methods like wet-chemical process control or microscopy methods.
The SmartLab is a highly innovative, high-resolution diffractometer. Its key feature is the SmartLab Guidance Software that offers the user an intelligent interface, which guides one through the minutest details of each experiment.
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