X-Ray Diffractometers RSS Feed - X-Ray Diffractometers

An x-ray diffractometer illuminates a sample of material with x-rays of known wavelength, moving the sample and detector in order to measure the intensity of the diffracted radiation as a function of beam and sample orientation. From the resulting intensity versus angle plot much can be inferred about the structure of the material.
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Featured Equipment
Empyrean is a true multi-purpose research x-ray diffractometer. Like no other system available, the Empyrean platform is designed for now, and for years to come. It is PANalytical’s answer to the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project.
Other Equipment
STOE’s STADI P two circle goniometer is a modular system that is fast, precise and reliable, and forms a part of a wide range of x-ray powder diffraction products.
CubiX3 delivers exceptional analysis speed, reliability and reproducibility. Introducing new features such as high-intensity data collection and extra flexibility in sample handling for automated environments, CubiX3 can be set up for fully automated, push-button operation. Its initial investment is rapidly earned back because of the ease of operation, the independency of operators and the safety for the users, when compared to traditional methods like wet-chemical process control or microscopy methods.
The SmartLab is a highly innovative, high-resolution diffractometer. Its key feature is the SmartLab Guidance Software that offers the user an intelligent interface, which guides one through the minutest details of each experiment.
Now, Xenocs has introduced a new generation laboratory SAXS/WAXS system - Xeuss 2.0, a product of over 14 years of research.
Xenocs has launched the new Nano-inXider vertical SAXS/WAXS system designed for the characterization of nanomaterials. The system has a compact design and delivers excellent performance.
The X’Pert³ MRD XL system supplied by PANalytical has been developed to meet the needs of laboratories focused on materials research and development.
PANalytical's X'Pert PRO Materials Research Diffractometer is the most flexible system available for X-ray diffraction studies for advanced materials science and nanotechnology and metrologic characterization in semiconductor process development.
PANalytical offers X'Pert³ Powder, the latest multipurpose X-ray diffraction system built on the fully renewed X’Pert platform.
The RAPID II is a highly versatile X-ray area detector in the history of materials analysis.
The IPDS 2T dual-beam diffractometer from STOE offers the possibility of turning the entire goniometer around the È axis to an angle of 60°, producing up to 2Èmax of 137°.
PANalytical offers the ScatterX78 attachment specifically developed for the Empyrean X-ray diffraction system.
Rigaku’s new nano3DX X-ray microscope features high-resolution optics and high-power rotating anode combined with sub-micron CCD technology.
PANalytical has introduced X’Pert³ Powder, a new X-ray diffraction system based on the new, improved X’Pert platform. The system is eco-friendly, reliable and complies with strict X-ray and motion safety norms.
The Ultima IV symbolizes advanced X-ray diffraction (XRD) systems.The system includes Rigaku’s patented cross beam optics (CBO) technology for permanently aligned, mounted, and user-selectable parallel and focusing geometries.
The SmartLab high-resolution diffraction system represents the state of the art in fully automated modular XRD systems. The system incorporates a high resolution theta/theta closed loop goniometer drive system, CBO, an in-plane scattering arm, an optional 9.0 kW rotating anode generator, and a fully automated optical system to make advanced measurements possible for both expert and novice users of the system.
The X’Pert³ MRD X-Ray diffractometer available from PANalytical’s has been developed to meet the needs of current materials research and development laboratories.
The TTRAX III is the world’s most powerful diffractometer. This diffractometer uses an 18 kW rotating anode X-ray source in a q/q geometry offering the ideal system for challenging applications.
The MinFlex series of benchtop X-ray Diffraction Analyzers is a general purpose X-ray diffractometer that can perform quantitative and qualitative analysis of polycrystalline materials.
The STOE STADIVARI diffractometer can be used to explore reciprocal space in a fast and flexible way. It can be arranged in both vertical and horizontal position, and provides a versatile analysis of a wide range of materials.
The latest X-ray diffraction system from PANalytical is based on the totally renewed X’Pert platform.
STOE offers STADI MP, a multipurpose powder diffractometer that offers three geometries: Bragg-Brentano geometry, Transmission-/Debye-Scherrer geometry and a set-up for micro-diffraction (High Flux).
The X'Pert PRO MRD XL is an enlarged and improved version of PANalytical’s proven X'Pert PRO MRD XRD system. By facilitating X-ray analysis during the process development stage, the X'Pert PRO MRD XL represents the logical 'next step' in advanced materials analysis. it is suited to the analysis is semiconductors and advanced materials.
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