Posted in | X-Ray Diffractometers

X’Pert³ MRD XL from PANalytical

The X’Pert³ MRD XL system supplied by PANalytical has been developed to meet the needs of laboratories focused on materials research and development. This X-ray diffractometer is one of the most flexible systems available on the market and can be used to carry out X-ray diffraction studies on advanced materials science and nanotechnology and also for metrologic characterization in semiconductor process development.

The X’Pert³ MRD XL shares the same design and functionality as the X’Pert³ MRD system, but is larger in size and features a rugged cradle to support samples that are large and heavy. In addition, self-centring wafer holders in the MRD XL enable mounting and alignment of wafers measuring 300mm in diameter.

Key Features

The main features of the X’Pert³ MRD XL are:

  • Flexible
  • Complete mapping of wafers up to 200mm
  • Automatic wafer loader option
  • Self-centring wafer holders
  • Robust cradle built to support large and heavy samples
  • Suitable for high-throughput environments


The applications of the X’Pert³ MRD XL are:

  • Thin film analysis
  • Stress and texture analysis
  • wafer mapping
  • Nanomaterials
  • Compound and silicon based semiconductors
Ask A Question

Do you have a question you'd like to ask the manufacturer of this equipment or can you provide feedback regarding your use of this equipment?

Leave your feedback
Other Equipment by this Supplier
Other Equipment