Scanning Electron Microscopes (SEM) RSS Feed - Scanning Electron Microscopes (SEM)

Scanning electron microscopes or SEM's are microscopes that use a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. SEM's are one of the most versatile and widely used tools of modern science as they allow the study of both morphology and composition of biological and physical materials.
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The Delphi Microscope is a comprehensive solution, the first of its kind, enabling quick correlative microscopy with unique overlay precision.
The SIGMA, featuring GEMINI® technology provides outstanding imaging and analytical results from a field emission microscope. The ÓIGMA is now available with variable pressure (VP) technology for exceptional imaging and analysis of non-conductive specimen. It is compatible with a wealth of accessories including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior materials contrast and SE imaging in VP.
The FIB-SIMS instrument is used for imaging surfaces with secondary ions at a nano-scale lateral resolution, sub 100nm.
The Micro-CT from Bruker is a unique 3D imaging device that provides a better understanding of the internal microstructures of specimens easily and nondestructively.
The Phenom Pro is Phenom-World’s high-end imaging desktop SEM. In combination with a large range of sample-holders and automated system software, it can be tailored to suit a multitude of applications.
The HITACHI NB5000 FIB-SEM combines a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM.
The SU3500 scanning electron microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance.
The QUANTAX EBSD analysis system from Bruker is a comprehensive, easy to use tool for users of all levels.
The EVO 50 offers excellent results from a versatile analytical microscope with a very large specimen chamber.
WITec has introduced RISE microscope, the world's first fully-integrated Raman imaging and scanning electron microscope (SEM). Through RISE microscopy, ultra-structural surface properties can be connected to molecular compound information.
The Phenom Pure desktop SEM is an ideal tool for the transition from light optical to electron microscopes. It is the most economical solution for high-resolution imaging, providing the best imaging results in its class.
DB235 is small stage system combining a Hexalens electron column and a Magnum ion column for failure analysis and high-end sample preparation.
The SU6600 is Hitachi's high-resolution analytical field emission SEM with variable pressure technology enabling observation and analysis of any type of oily, wet or dirty sample.
The world of microscopy just changed. The Carl Zeiss SMT ORION® PLUS Helium-ion-microscope just broke the world record for resolution. The ORION® PLUS microscope now delivers TEM-like resolution, on bulk samples, with SEM-like ease-of-use. This breakthrough in resolution truly puts the ORION® PLUS in a class of its own, providing an opportunity to see things you've never before seen.
The SU1510 is a medium size chamber variable pressure SEM with the same performance and features as the S-3400N and S-3700N models. Quad Bias gun electronics greatly enhances low voltage performance and increases beam current well suited for today's SDD X-ray detectors.
Hitachi S-5200 Nano SEM has the highest resolution SEM. The magnification range is from 100X to 2,000,000X.
Now in its third generation, the PSEM eXplorer is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible.
A scanning electron microscope’s tightly focused electron beam behaves like a radiating dipole source at the electron impact position.
The EVO® HD features a new electron source technology facilitating unmatched low-kV resolution. This makes the EVO® HD the premier choice for challenging specimens, the imaging of surface detail or for beam-sensitive materials. The resolution improvements at higher probe currents provide enhanced analytical accuracy.
The Phenom ProX desktop SEM is the ultimate all-in-one imaging and X-ray analysis system. With the ProX, sample structures can be physically examined and their elemental composition determined.
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical capability. The core of MERLIN is the enhanced GEMINI II column which, with its double condenser system, achieves an image resolution of 0.8 nanometers. A sample current of up to 300 nanoamperes is available for analytical purposes such as energy and wavelength dispersive X-ray spectroscopy (EDS and WDS), diffraction analysis of backscattered electrons (EBSD) or the generation of cathodoluminescence.
The QUANTAX WDS features the compact XSense WD spectrometer. This precision instrument includes highly advanced detector technology and offers a number of excellent benefits.
Phenom World’s Delphi is a tool developed specifically for fast correlative microscopy with excellent overlay precision. It is considered as the first fully integrated solution in the world for the purpose of correlative microscopy.
The Merlin FEG SEM from Technical Sales Solutions is the flagship FESEM of the Zeiss product line. The system has excellent high-resolution SEM imaging and high-end analytical work using EDS and EBSD.
This latest SEM from Hitachi High Technologies can perform ultra-high resolution imaging along with several other analytical functions. This is in order to meet the demands of a new market trend which increasingly requires image observation at ultra-high resolution and a wide variety of analytical work together in one SEM.
The Tecnai G2 F30 is a highly sophisticated 300 kV scanning transmission electron microscope (S/TEM) with a unsurpassed task oriented user interface.
Carl Zeiss offers shuttle & find which is designed for determining the structures or cells that are required. They are imaged, and the specimen is transferred to scanning electron microscope (SEM) using a specifically designed holder.
The most recently launched generation of QUANTAX EDS features a broad range of active areas and slim line technology for the XFlash® 6 detector series.
The SECOM platform can be used for easily and quickly combining electron and light microscopy.
QUANTAX Micro-XRF with the XTrace micro-spot X-ray source enhances a SEM with the capabilities of a Micro-X-ray fluorescence spectrometer.
Hitachi’s advanced cold field emission SEM offers unmatched low-voltage imaging and comprehensive analytical microanalysis with the uncompromised performance of CFE.
The SU9000 is HITACHI's premium UHR FE-SEM. It characterizes unique electron optics with the sample positioned inside a gap of the split objective lens pole piece.
The FEI Quanta family includes six variable-pressure and environmental scanning electron microscopes (ESEM), all of which can accommodate multiple sample and imaging requirements for industrial process control labs, materials science labs and life science labs.