Scanning Electron Microscopes (SEM)

Scanning electron microscopes or SEM's are microscopes that use a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. SEM's are one of the most versatile and widely used tools of modern science as they allow the study of both morphology and composition of biological and physical materials.
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Equipment
The Phenom G2 pure desktop scanning electron microscope (SEM) is an ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom G2 pure is equipped with the basic fundamentals for meeting imaging needs.
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical capability. The core of MERLIN is the enhanced GEMINI II column which, with its double condenser system, achieves an image resolution of 0.8 nanometers. A sample current of up to 300 nanoamperes is available for analytical purposes such as energy and wavelength dispersive X-ray spectroscopy (EDS and WDS), diffraction analysis of backscattered electrons (EBSD) or the generation of cathodoluminescence.
The AutoProbe™ 200 is Omniprobe's most popular nano-manipulator system. It is a fully automated, multi-purpose nano-positioning system capable of in-situ lift-out, electrical measurements, nano-mechanical testing and charge neutralization in the FIB, Auger or SEM. The computer controlled system offers high throughput, high accuracy (100nm standard, 10nm optional) and a field-proven excellent success rate for all tasks.
The FEI Quanta 50 series provides flexibility and versatility to handle the challenges of today's wide ranging research needs. View any sample and get all the data - surface and compositional images can be combined with accessories for determining material properties and elemental composition.
The world of microscopy just changed. The Carl Zeiss SMT ORION® PLUS Helium-ion-microscope just broke the world record for resolution. The ORION® PLUS microscope now delivers TEM-like resolution, on bulk samples, with SEM-like ease-of-use. This breakthrough in resolution truly puts the ORION® PLUS in a class of its own, providing an opportunity to see things you've never before seen.
The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.
The Agilent 8500 Field Emission Scanning Electron Microscope FE-SEM is a compact system that offers researchers a field emission scanning electron microscope that is easy to use and does not require special facilities. About the size of a laser printer, the 8500 FE-SEM provides convenient plug-and-play performance. No dedicated facilities are required, only an AC power outlet.
The OmniGIS™ is Omniprobe's new multiple gas injection system for the FIB or SEM. It provides programmable feedback control of three on-board gas sources and an additional external purge/carrier gas source while occupying only a single GIS port! The user can create and recall complex process flows.
Now in its third generation, the PSEM eXplorer is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible.
It's simplicity enables all users, even those new to Electron Microscopy (EM), to image their samples and to obtain high quality, high resolution images within minutes. No special sample preparation such as coating with metal films is required for hydrated, oily or non-conducting samples, and TM3000 is easy to use like a digital camera.
Carl Zeiss offers shuttle & find which is designed for determining the structures or cells that are required. They are imaged, and the specimen is transferred to scanning electron microscope (SEM) using a specifically designed holder.
Phenom-World is focused on giving you the opportunity to process ever-smaller samples and increase your productivity, while bringing down the costs of analysis. The Phenom G2 pro is the most effective, versatile and fastest desktop SEM available. Its unique design makes it suitable for use in a large variety of applications and markets.
The EVO® HD features a new electron source technology facilitating unmatched low-kV resolution. This makes the EVO® HD the premier choice for challenging specimens, the imaging of surface detail or for beam-sensitive materials. The resolution improvements at higher probe currents provide enhanced analytical accuracy.
The SIGMA, featuring GEMINI® technology provides outstanding imaging and analytical results from a field emission microscope. The ÓIGMA is now available with variable pressure (VP) technology for exceptional imaging and analysis of non-conductive specimen. It is compatible with a wealth of accessories including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior materials contrast and SE imaging in VP.
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