Scanning Electron Microscopes (SEM) RSS Feed - Scanning Electron Microscopes (SEM)

Scanning electron microscopes or SEM's are microscopes that use a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. SEM's are one of the most versatile and widely used tools of modern science as they allow the study of both morphology and composition of biological and physical materials.
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The Phenom ProX desktop SEM is the ultimate all-in-one imaging and X-ray analysis system. With the ProX, sample structures can be physically examined and their elemental composition determined.
The MERLIN FE-SEM overcomes the conflict between image resolution and analytical capability. The core of MERLIN is the enhanced GEMINI II column which, with its double condenser system, achieves an image resolution of 0.8 nanometers. A sample current of up to 300 nanoamperes is available for analytical purposes such as energy and wavelength dispersive X-ray spectroscopy (EDS and WDS), diffraction analysis of backscattered electrons (EBSD) or the generation of cathodoluminescence.
The latest TM3030 features improved electron optics, higher magnification, and built-in image processing to further enhance image quality and resolution at lower accelerating voltage.
Hitachi S-5200 Nano SEM has the highest resolution SEM. The magnification range is from 100X to 2,000,000X.
The Phenom Pro is Phenom-World’s high-end imaging desktop SEM. In combination with a large range of sample-holders and automated system software, it can be tailored to suit a multitude of applications.
The SU9000 is HITACHI's premium UHR FE-SEM. It characterizes unique electron optics with the sample positioned inside a gap of the split objective lens pole piece.
The variable pressure SEM, Hitachi S-3700N includes a specimen chamber that can handle specimen sizes up to 300mm in diameter and 110mm in height at analytical working distance of 10mm.
The SU8000 family is an extended lineup of Hitachi’s range of high performance, semi-inlens SEM with cold field emission source. It is a response to a high demand for flexible solutions to application and budget needs.
WITec has introduced RISE microscope, the world's first fully-integrated Raman imaging and scanning electron microscope (SEM). Through RISE microscopy, ultra-structural surface properties can be connected to molecular compound information.
The world of microscopy just changed. The Carl Zeiss SMT ORION® PLUS Helium-ion-microscope just broke the world record for resolution. The ORION® PLUS microscope now delivers TEM-like resolution, on bulk samples, with SEM-like ease-of-use. This breakthrough in resolution truly puts the ORION® PLUS in a class of its own, providing an opportunity to see things you've never before seen.
The Phenom Pure desktop SEM is an ideal tool for the transition from light optical to electron microscopes. It is the most economical solution for high-resolution imaging, providing the best imaging results in its class.
Now in its third generation, the PSEM eXplorer is designed for the automated imaging and elemental analysis of a wide spectrum of surfaces and particulate. A unique blend of hardware ruggedization and software sophistication creates a system platform that is readily accessible.
The HITACHI NB5000 FIB-SEM combines a superior 40kV Ga ion FIB column with an ultra-high-resolution Schottky FE-SEM.
The FIB-SIMS instrument is used for imaging surfaces with secondary ions at a nano-scale lateral resolution, sub 100nm.
The EVO 50 offers excellent results from a versatile analytical microscope with a very large specimen chamber.
DB235 is small stage system combining a Hexalens electron column and a Magnum ion column for failure analysis and high-end sample preparation.
The FEI Quanta 50 series provides flexibility and versatility to handle the challenges of today's wide ranging research needs. View any sample and get all the data - surface and compositional images can be combined with accessories for determining material properties and elemental composition.
The SU1510 is a medium size chamber variable pressure SEM with the same performance and features as the S-3400N and S-3700N models. Quad Bias gun electronics greatly enhances low voltage performance and increases beam current well suited for today's SDD X-ray detectors.
The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.
The SIGMA, featuring GEMINI® technology provides outstanding imaging and analytical results from a field emission microscope. The ÓIGMA is now available with variable pressure (VP) technology for exceptional imaging and analysis of non-conductive specimen. It is compatible with a wealth of accessories including the class leading Carl Zeiss BSD and VPSE G3 detectors for superior materials contrast and SE imaging in VP.
Hitachi’s advanced cold field emission SEM offers unmatched low-voltage imaging and comprehensive analytical microanalysis with the uncompromised performance of CFE.
The SU6600 is Hitachi's high-resolution analytical field emission SEM with variable pressure technology enabling observation and analysis of any type of oily, wet or dirty sample.
A scanning electron microscope’s tightly focused electron beam behaves like a radiating dipole source at the electron impact position.
The SECOM platform can be used for easily and quickly combining electron and light microscopy.
The EVO® HD features a new electron source technology facilitating unmatched low-kV resolution. This makes the EVO® HD the premier choice for challenging specimens, the imaging of surface detail or for beam-sensitive materials. The resolution improvements at higher probe currents provide enhanced analytical accuracy.
The SU3500 scanning electron microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance.
This latest SEM from Hitachi High Technologies can perform ultra-high resolution imaging along with several other analytical functions. This is in order to meet the demands of a new market trend which increasingly requires image observation at ultra-high resolution and a wide variety of analytical work together in one SEM.
Carl Zeiss offers shuttle & find which is designed for determining the structures or cells that are required. They are imaged, and the specimen is transferred to scanning electron microscope (SEM) using a specifically designed holder.
The Tecnai G2 F30 is a highly sophisticated 300 kV scanning transmission electron microscope (S/TEM) with a unsurpassed task oriented user interface.
The Agilent 8500 Field Emission Scanning Electron Microscope FE-SEM is a compact system that offers researchers a field emission scanning electron microscope that is easy to use and does not require special facilities. About the size of a laser printer, the 8500 FE-SEM provides convenient plug-and-play performance. No dedicated facilities are required, only an AC power outlet.