Transmission Electron Microscopes RSS Feed - Transmission Electron Microscopes

A transmission electron microscope (TEM) operates in a similar manner to an optical microscope, except that they use a beam of electrons to image the sample rather then a beam of light and they operate in a vacuum. TEM's offer resolutions thousands of time better than optical microscopes, approaching atomic resolution thanks to the shorter wavelength. TEM analysis requires samples to be thinned down such that the electron beam can pass through them. It is a commonly used technique for metallurgical analysis.
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Hitachi offers the sleek HT7700, whose radical design includes the ergonomics and user friendliness of a SEM with advanced automation, resolution and analytical capabilities of a TEM.
FEI’s Talos™ is a 200kV scanning/transmission electron microscope (S/TEM) that is designed to offer rapid, accurate, quantitative characterization of nanomaterials in several dimensions.
With over 70 years of microscopy innovation, Hitachi offers the HT7710 STEM with maximum performance and productivity for in-situ analysis.
The 300 kV HF-3300 TEM/STEM combines cold field emission gun (CFEG) technology pioneered by Hitachi with novel functions such as parallel nanobeam electron diffraction, spatially-resolved EELS, and double-biprism electron holography.
FEI's Titan S/TEM platform has an excellent and powerful design that is capable of delivering high-quality results, making it a highly sought after scanning/transmission electron microscope (S/TEM) by researchers across the globe. The Titan S/TEM series comprises Titan™ Themis 200, Titan™ Themis 300, Titan™ Themis³ and Titan™ ETEM.
Bruker's QUANTAX EDS, a powerful tool for X-ray spectrometry, features slim-line technology, large area SDDs, and a high-performance pulse processing unit for rapid and reliable analysis of samples.