Transmission Electron Microscopes RSS Feed - Transmission Electron Microscopes

A transmission electron microscope (TEM) operates in a similar manner to an optical microscope, except that they use a beam of electrons to image the sample rather then a beam of light and they operate in a vacuum. TEM's offer resolutions thousands of time better than optical microscopes, approaching atomic resolution thanks to the shorter wavelength. TEM analysis requires samples to be thinned down such that the electron beam can pass through them. It is a commonly used technique for metallurgical analysis.
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The 300 kV HF-3300 TEM/STEM combines cold field emission gun (CFEG) technology pioneered by Hitachi with novel functions such as parallel nanobeam electron diffraction, spatially-resolved EELS, and double-biprism electron holography.
With over 70 years of microscopy innovation, Hitachi offers the HT7710 STEM with maximum performance and productivity for in-situ analysis.
The FEI Tecnai™ family of transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.
Hitachi offers the sleek HT7700, whose radical design includes the ergonomics and user friendliness of a SEM with advanced automation, resolution and analytical capabilities of a TEM.
The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.
The HD-2700 dedicated STEM features the Hitachi developed spherical aberration correction system that has excellent resolution and analytical sensitivity.