Transmission Electron Microscopes

A transmission electron microscope (TEM) operates in a similar manner to an optical microscope, except that they use a beam of electrons to image the sample rather then a beam of light and they operate in a vacuum. TEM's offer resolutions thousands of time better than optical microscopes, approaching atomic resolution thanks to the shorter wavelength. TEM analysis requires samples to be thinned down such that the electron beam can pass through them. It is a commonly used technique for metallurgical analysis.
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Equipment
The LVEM5 is a full-fledged, multi-mode electron microscope with a user friendly interface. The LVEM5 includes TEM, SEM, STEM and Electron Diffraction modes so that multiple imaging data can be accumulated for any single given sample at the microscale and the nanoscale.
The FEI Tecnai™ family of transmission electron microscopes (TEMs) are designed to offer a truly universal imaging and analysis solution for life sciences, materials sciences, nanotechnology, and the semiconductor and data storage industries. With nearly twenty models to choose from, the Tecnai G2 Series combines modern technology with the stringent demands of an innovative scientific community.
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