The HF5000 from Hitachi is a 200 kV aberration-corrected CFE TEM or STEM. It provides a robust blend of atomic-resolution imaging and analysis in combination with extensive automation and sophisticated in-situ capabilities.
Imaging Performance
- The power of atomic resolution SE imaging can be used with HAADF/ADF/BF in parallel
- Any user can achieve quality results with the help of the completely automated Cs corrector (or users can take entire manual control whenever they wish to)
- Field-free imaging of magnetic samples available in TEM and STEM mode
- Users can make use of Ptychography and 4D STEM to get the most out of their sample
Image Credit: Hitachi High-Tech Europe
Analytical Performance
- Maximum EELS performance provided with the help of high brightness, narrow-energy CFE gun
- High throughput, high sensitivity EDX available with symmetrically opposed dual SDDs offering >2 sr collection angle
Image Credit: Hitachi High-Tech Europe
Powerful Automation
- Users can program their workflows and recipes in Python for regular tasks, tomography, high speed acquisition, or the most complicated in-situ experiments
- Users have the option to combine multi-platform control systems and datasets into an individual timeline with the help of Azorus open-source software
Advanced In-Situ Capabilities
- Users can carry out in-situ and operando experiments with gas, liquid, heating, biasing and electrochemistry holders
- Customized holder design service guarantees that users can perform precisely the experiment they require
- Users can view in-situ reactions of gases with surfaces by utilizing the SE detector
Image Credit: Hitachi High-Tech Europe