Hitachi’s IM4000Plus broad Ar+ ion milling system (BIB) helps users to cross-section or polish hard, porous, composite, soft and heat sensitive materials with seamless results.
Reliable High-Performance Milling
- High current Ar+ beam provides quick and reliable cross-sectioning
- Stable low kV (<1 kV) capability provided for sensitive materials
- Final polishing, for example, for EBSD, with low angle milling (FlatMilling), or for contrasting by high angle milling (relief milling), in a matter of few minutes
Image Credit: Hitachi High-Tech Europe
Easy Specimen Handling
- Ex-situ alignment of sample and mask makes installation easy and rapid
- Load resin fitted samples measuring up to 25 mm in height and 50 mm in diameter for final polishing
- Users can readjust milling position at all times without the need to remount the sample
Simple Operation and Maintenance
- Simple and least parameter settings available for any type of application or sample
- Easy setup and maintenance with a single ion beam gun
- Constant high intensity ion beam throughout the complete voltage range, with independent ionization and acceleration voltages
Easy End-Point Detection
- Users can note milling in real time with the help of stereomicroscope
Extendibility
- Users can add cryo cooling for heat sensitive materials
- Vacuum transfer can be added for oxidation sensitive specimens
Ion Milling System IM4000
Video Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe
Image Credit: Hitachi High-Tech Europe