Photoluminescence Mapper RSS Feed - Photoluminescence Mapper

Photoluminescence spectroscopy is a proven, non-destructive, measurement technique for material characterisation. It is used to determine compositions of alloys and material quality as well as the quantification of lattice defects. A PL Mapper is a laser based instrument used to generate maps of several parameters over full wafers by measuring optical luminescence emission from materials excited with energy above their bandgap.
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Equipment
From solar cells to live cells, the quick and comprehensive IMA PL™ hyperspectral imaging system offers photoluminescent mapping with excellent image and data quality.
The RPM2000 Rapid Photoluminescence Mapper is a fast, room temperature photoluminescence (PL) mapping system suitable for use in R&D, production and quality control environments. The RPM2000 has been designed specifically to obtain whole wafer PL maps in a mere fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs.
Photoluminescence (or PL) is a spectroscopy technique providing information on electrical and optical properties of semiconductor materials, such as bandgap, emission wavelength, crystallinity and crystal structure, defects etc...