Photoluminescence Mapper RSS Feed - Photoluminescence Mapper

Photoluminescence spectroscopy is a proven, non-destructive, measurement technique for material characterisation. It is used to determine compositions of alloys and material quality as well as the quantification of lattice defects. A PL Mapper is a laser based instrument used to generate maps of several parameters over full wafers by measuring optical luminescence emission from materials excited with energy above their bandgap.
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Photoluminescence (or PL) is a spectroscopy technique providing information on electrical and optical properties of semiconductor materials, such as bandgap, emission wavelength, crystallinity and crystal structure, defects etc...
The RPM2000 Rapid Photoluminescence Mapper is a fast, room temperature photoluminescence (PL) mapping system suitable for use in R&D, production and quality control environments. The RPM2000 has been designed specifically to obtain whole wafer PL maps in a mere fraction of the time previously associated with this sort of measurement, giving the ability to measure and assess wafers between production runs.
From solar cells to live cells, the quick and comprehensive IMA PL™ hyperspectral imaging system offers photoluminescent mapping with excellent image and data quality.