Profilometers RSS Feed - Profilometers

Profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Vertical resolution is usually in the nanometre level, though lateral resolution is usually poorer.
If you'd like us to help you source a Quotation for Profilometers please click here. Once submitted, we will try and place you in contact with a suitable Profilometers supplier within 48 hours.
The CCI MP Benchtop 3D Optical Profiler from Taylor Hobson brings high performance optical measurements within the reach of both precision manufacturing and research companies.
The MicroXAM -100 3D surface profiler can measure fields of view from 100 X 100 microns to 2.0 X 2.0 millimeters (dependent on the objective lens used). The MicroXAM 100 optical interferometer quickly and accurately measures the 3D topography of surfaces at the nanometer level with a z-scan range of 250 microns (or up to 10 mm with Z-Stitching). With the new 3D image stitching capabilities, multiple images can be stitched together to produce an extended fields of view.
The new CCI HD Optical profiler with thin & thick film measurement capability merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology.
The DektakXT™ stylus profiler from Bruker features a revolutionary design that enables unmatched repeatability of under four angstroms (<4Å) and rapid scanning speeds. This major milestone in stylus profiler performance is the culmination of Dektak®'s forty-year legacy of innovation and industry leadership.
The AlphaStep® D-100 profilometer rapidly and quantitatively measures the 2D topography of surfaces. The AlphaStep® D-100 profilometer measurement systems includes an 800 micron (optional 1.2 millimeter) Z range, sub-angstrom resolution, 6 angstrom step height repeatability, manual x-y theta sample positioning stage, and many other features.
The P-6 stylus profiler and surface analysis system offers a combination of advanced features for process development and manufacturing control of scientific research, photovoltaic solar manufacturing, data storage, MEMS, opto-electronics, and other industrial metrology applications.
The AlphaStep® D-120 systems provides the widest range of application specific capabilities, including a maximum 1.2 millimeter Z range, sub-angstrom resolution, 6 angstrom step height repeatability, motorized X-Y stages, and many other features. With its motorized 150 X 178mm X-Y stages, the AlphaStep® D-120 can be programmed to automatically make multiple measurements at different locations on the sample.
150mm X-Y stages and a large coarse height adjustment to easily accommodate larger sample sizes.The ST400 also has an optional offset camera, with either manual or motorized zooms, to easily identify small features prior to measuring them. The Custom ST400, a more open configuration, allows for the addition of larger X-Y stages to measure even larger areas, a 360° rotational stage for measuring spherical or cylindrical parts and many other custom configurations. Works well for larger samples and larger scan areas. Available with various automation options. Ideal option for diverse and expanding measurement needs.
The Zeta-300 suface metrology tool provides integral acoustic isolation to reduce the effects of sound and air currents on sample measurements. When gathering data on structures that are less than 1µm high, even small vibrations caused by sound and air disturbances can affect your results. Coupled with an optional isolation table, the Zeta-300 delivers accuracy and repeatability unmatched by other optical profilers.
WITec´s TrueSurface Microscopy enables confocal Raman imaging along rough or heavily inclined samples with the surface held in steady focus and simultaneously maintains the highest confocality.