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Profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Vertical resolution is usually in the nanometre level, though lateral resolution is usually poorer.
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KLA-Tencor’s MicroXAM-800 is an optical surface profiler that joins the company’s surface metrology product line. It is a non-contact, white light interferometer that stands apart due to its simple yet innovative user interface.
KLA-Tencor’s P-7 stylus profiler surface measurement system provides excellent measurement repeatability for consistent measurement performance. It has 150mm scan length standard that can provide long scan capability sans the need for stitching.
The MicroXAM -100 3D surface profiler can measure fields of view from 100 X 100 microns to 2.0 X 2.0 millimeters (dependent on the objective lens used). The MicroXAM 100 optical interferometer quickly and accurately measures the 3D topography of surfaces at the nanometer level with a z-scan range of 250 microns (or up to 10 mm with Z-Stitching). With the new 3D image stitching capabilities, multiple images can be stitched together to produce an extended fields of view.
150mm X-Y stages and a large coarse height adjustment to easily accommodate larger sample sizes.The ST400 also has an optional offset camera, with either manual or motorized zooms, to easily identify small features prior to measuring them. The Custom ST400, a more open configuration, allows for the addition of larger X-Y stages to measure even larger areas, a 360° rotational stage for measuring spherical or cylindrical parts and many other custom configurations. Works well for larger samples and larger scan areas. Available with various automation options. Ideal option for diverse and expanding measurement needs.
The new CCI HD Optical profiler with thin & thick film measurement capability merges world leading non-contact dimensional measurement capability with advanced thin and thick film technology.
WITec´s TrueSurface Microscopy enables confocal Raman imaging along rough or heavily inclined samples with the surface held in steady focus and simultaneously maintains the highest confocality.
The DektakXT™ stylus profiler from Bruker features a revolutionary design that enables unmatched repeatability of under four angstroms (<4Å) and rapid scanning speeds. This major milestone in stylus profiler performance is the culmination of Dektak®'s forty-year legacy of innovation and industry leadership.
The Zeta-300 suface metrology tool provides integral acoustic isolation to reduce the effects of sound and air currents on sample measurements. When gathering data on structures that are less than 1µm high, even small vibrations caused by sound and air disturbances can affect your results. Coupled with an optional isolation table, the Zeta-300 delivers accuracy and repeatability unmatched by other optical profilers.
KLA-Tencor’s Alpha-Step D-600 stylus profiler provides users with advanced high resolution 2D and 3D profiling, profile stitching, 2D stress, and several other features in a convenient, user-friendly platform.
The CCI MP Benchtop 3D Optical Profiler from Taylor Hobson brings high performance optical measurements within the reach of both precision manufacturing and research companies.
KLA-Tencor’s Alpha-Step® D-500 stylus profiler is an easy-to-use device that has advanced high resolution 2D profiling, profile stitching, 2D stress, and many additional features.