Scanning Near-Field Optical Microscopes (SNOM) RSS Feed - Scanning Near-Field Optical Microscopes (SNOM)

Scanning Near Field Optical Microscopy (SNOM/NSOM) is a form of scanning probe microscopy that allows optical imaging with spatial resolution beyond the diffraction limit. This is done by placing the detector very close to the specimen surface in the region called "optical near-field".
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The XE-NSOM is specially designed and tailored for advanced optical measurements including Near-field Scanning Optical Microscopy (NSOM) and Raman Spectrometry. The XE-NSOM offers a complete AFM system setup with unprecedented adaptability for these optical experiments. The high-performance Z-servo scanner of the XE-NSOM supports True Non-Contact AFM and utilizes cantilever-based closed-loop feedback technology.
The BioLyser from Triple-O is an innovative three-in-one modular microscope that combines all the features of a Scanning Near-Field Optical Microscope (SNOM), with an AFM and a conventional inverted optical microscope.
The NTEGRA SPECTRA is a unique integration of Scanning Probe Microscope and confocal microscopy/luminescence and Raman scattering spectroscopy. Owing to the effect of huge tip enhanced Raman scattering it allows carrying out Raman spectroscopy and obtaining images with resolution up to 50 nm.
TriA-SNOM from APE Research is an Aperture SNOM microscope, capable of collecting optical signal in reflection, transmission and back-reflection modes. An instrument for surface science, optics and biology researchers who need a basic microscope easily expandable and interfaciable with their scientific equipement.
The alpha300 S is a user friendly Scanning Near-field Optical Microscope (SNOM) that combines in a unique way the advantages of SNOM, Confocal Microscopy and Atomic Force Microscopy in a single instrument. Switching between the different modes can easily be done by rotating the objective turret. The alpha300 S uses unique micro-fabricated SNOM-cantilever sensors for optical microscopy with spatial resolution below the diffraction limit.