WITEC alpha300 S Scanning Near-field Optical Microscope

WITEC alpha300 S Scanning Near-field Optical Microscope

The alpha300 S is a user friendly Scanning Near-field Optical Microscope (SNOM) that combines in a unique way the advantages of SNOM, Confocal Microscopy and Atomic Force Microscopy in a single instrument. Switching between the different modes can easily be done by rotating the objective turret. The alpha300 S uses unique micro-fabricated SNOM-cantilever sensors for optical microscopy with spatial resolution below the diffraction limit.

The design of the alpha300 S Scanning Near-field Optical Microscope features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM.

For scanning near-field optical microscopy, the alpha300 S uses unique and patented micro-fabricated Cantilever SNOM-sensors that significantly outperform standard fiber optic probes in resolution, transmission, ease of operation and reliability.

The cantilever, employing the well established beam deflection principle for distance control, features a hollow pyramid with an aperture at its apex. This allows topography and optical images to be acquired simultaneously.

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