S is a user friendly Scanning Near-field Optical Microscope (SNOM) that
combines in a unique way the advantages of SNOM, Confocal Microscopy and Atomic
Force Microscopy in a single instrument. Switching between the different modes
can easily be done by rotating the objective turret. The alpha300 S uses unique
micro-fabricated SNOM-cantilever sensors for optical microscopy with spatial
resolution below the diffraction limit.
The design of the alpha300
S Scanning Near-field Optical Microscope features a Confocal Microscope
(CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope
(AFM) in a single instrument. By simply rotating the objective turret, the user
can choose from among Confocal Microscopy, SNOM or AFM.
For scanning near-field optical microscopy, the alpha300
S uses unique and patented micro-fabricated Cantilever SNOM-sensors that
significantly outperform standard fiber optic probes in resolution, transmission,
ease of operation and reliability.
The cantilever, employing the well established beam deflection principle for distance control, features a hollow pyramid with an aperture at its apex. This allows topography and optical images to be acquired simultaneously.