Nanoindentation Testers RSS Feed - Nanoindentation Testers

Nanoindentation techniques are used to examine the mechanical properties of a material at the nanoscale. An AFM or SPM probe is used as both an indenter and to image the indentation. Knowing the load on the indenter/probe, the probe geometry and indentation depth, properties such as hardness and Young’s Modulus can be determined.
If you'd like us to help you source a Quotation for Nanoindentation Testers please click here. Once submitted, we will try and place you in contact with a suitable Nanoindentation Testers supplier within 48 hours.
Featured Equipment
The new NanoTest Vantage system from Micro Materials Ltd offers a range of mechanical tests on the nano-scale, allowing the researcher to build a complete picture of material performance. The nanotest Vantage can characterise you samples using numerous techniques including nanoindentation, nano-impact and fatigue, nano-scratch and wear and nano-fretting.
MFP Nanoindenter is a true instrumented indenter and is the first AFM-based indenter that does not use cantilevers as part of the indenting mechanism.
Other Equipment
The PI 85 SEM PicoIndenter supplied by Hysitron is a depth-sensing indenter that delivers excellent performance in the electron microscope, with a conductive boron-doped diamond probe and a vacuum-compatible transducer.
The Hysitron TI 950 TriboIndenter is the next- generation nanomechanical test instrument providing industry- leading sensitivity and unprecedented performance. The TI 950 has been developed as an automated, high throughput instrument to support the numerous nanomechanical characterization techniques developed by Hysitron.
The Nano-Indentation Tester has been created to provide surface mechanical characterization data by indenting to depths at the nanometer-micron scales. This Nano-Indentation Tester can be utilized to characterize organic, inorganic, soft or hard materials and coatings. To illustrate some examples such as thin and multilayer PVD, CVD, PECVD, photoresists, paints, lacquers, and many other types of films and coatings.
The Nano Indenter G300 utilizes a stage that supports samples with diameters up to 300 mm. An excellent long-term investment for industrial users, it provides a fast, reliable method for acquiring mechanical data on uncut silicon wafers. The G300 permits testing of multiple layers, facilitating product development and failure analysis which can have a significant effect on yield, performance and longevity to devices.
Hysitron offers an advanced nanomechanical test instrument called TS 75 TriboScope.
Anton Paar offers a nano-range high resolution nanoindenter with ultra low thermal drift - now available with high temperature/high vacuum options. When used per ISO 14577 test methods the Ultra Nano Hardness Tester is able to measure the most accurate data of any other instruments on the market.
Hysitron PI 87 SEM PicoIndenter is a depth-sensing indenter that is specifically designed for a scanning electron microscope (SEM), with an electrically conductive probe and a vacuum-compatible transducer.
The Agilent T150 Universal Testing Machine (UTM) is a state-of-the-art universal testing machine that offers researchers a superior means of nanomechanical characterization by utilizing a nanomechanical actuating transducer head to produce tensile force. The T150 enables researchers to understand dynamic properties of compliant fibers via the largest dynamic range in the industry and the best resolution on the market.
NANO Indenter XP systems provide a fast and reliable way to acquire mechanical data on the submicron scale. Incorporating the latest technologies for nanoindentation testing, NANO Indenter XP systems are complete test systems that feature a robust design to extend system life, the industry’s most powerful software, improved electronics, and a space-saving load frame. Through 23-bit electronics and very high data-sampling rates, NANO Indenter XP systems produce the most accurate data of any instrumented nanoindentation systems on the market. Each recorded data point is an average of 1000 separate measurements.
Hysitrons PI 95 TEM PicoIndenter is a complete depth-sensing indenter that can perform direct-observation nanomechanical testing in a transmission electron microscope (TEM).
The Agilent Nano Indenter G200 is the world’s most accurate, flexible, and user-friendly instrument for nanoscale mechanical testing. Electromagnetic actuation allows it to achieve unparalleled dynamic range in force and displacement. The G200 Nano Indenter enables users to measure Young’s modulus and hardness in compliance with ISO 14577.
The Anton Paar Table Top Instrument sets the performance of the standard Nanoindentation Tester (NHT) into a small and simple-to-use instrument which is ideally suited to customary nanoindentation testing where a complete platform configuration would not be appropriate or necessary. It can be configured with diverse motorized or manual sample stages in order for your characterization need to be in line with your budget.
IBIS is a high performance nanoindentation system that features a robust construction, traceable calibration, and an unmatched 3 year warranty. IBIS builds on 20 years development at the CSIRO National Standards Laboratory in Sydney Australia. This new system has many significant features that set it above competitor products. It is made specifically for nanoindentation applications, including scratch testing.