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Atom probe is a microscope used in material science. The atom probe is closely related to the method of Field Ion Microscopy. Atom probes are unlike conventional optical or electron microscopes, in that the magnification effect comes from the magnification provided by a highly curved electric field, rather than by the manipulation of radiation paths.
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The C11627-01 Optical NanoGauge available from Hamamatsu is a noncontact film thickness measurement device that uses spectral interferometry.
The LEAP 4000X HR is a high performance 3D atomm probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom by atom identification and accurate spatial positioning. The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample.
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