X-Ray Fluorescence Analyzers

X-ray Fluorescence (XRF) analysis is a widely used method of elemental analysis providing both qualitative and quantitative compositional information. Among its advantages are the wide range of measurable elements covering nearly the entire periodic system. X-ray Fluorescence analysis is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.
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Equipment
In industrial process control applications, analytical instruments have to be highly sensitive, fast and accurate. The SPECTRO iQ has been specifically designed to meet these criteria. The new SPECTRO iQ II now features more enhanced technologies and enables simple and reliable operation.
SPECTRO Analytical Instruments offers a flexible XRF spectrometer dubbed SPECTRO XEPOS, which is specifically designed for challenging applications.
The innovative ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer from Rigaku was exclusively designed to handle very large and/or heavy samples.
The new NANOHUNTER bench top total reflection X-ray fluorescence (TXRF) spectrometer, performs elemental analysis down to PPB levels. Winner of the 2007 R&D 100 Award for technical innovation, NANOHUNTER finally offers the complete analysis package. Ease of use, superb flexibility, and incredible sensitivity combine to make NANOHUNTER an indispensable tool for advanced materials research, manufacturing quality assurance and process control, forensic analysis, and much much more.
SPECTRO Analytical Instruments offers a compact and sophisticated energy dispersive X-ray fluorescence spectrometer dubbed SPECTRO xSORT. The instrument is developed to perform nonstop analysis and metal sorting.
The Thick-800 is a non-destructive testing solution for organizations that need accurate quality control of printed circuit boards and electronics. Testing capabilities include multi-layer thickness measurements and RoHS testing of solder joint. The Thick-800 is specifically developed for coating thickness measurements
The Epsilon 3 XL instrument is a benchtop energy dispersive x-ray fluorescence (EDXRF) spectrometer, powered by the latest advances in excitation and detection technology . Epsilon 3 XL is an affordable, highly flexible analytical tool suitable for a wide range of applications which features a new high performance ceramic tube and the latest in silicon drift detector technology.
The ARL QUANT'X EDXRF utilizes an exclusive Peltier cooled Si(Li) detector and unique Digital Pulse Processing (DPP) technology for high-performance, multi-element analysis of environmental and industrial applications, such as air particulates, soil contamination, toxic elements in plastic, and forensic science. The ARL QUANT'X provides the highest performance-price ratio of all other Energy Dispersive XRF (EDXRF) instruments on the market and ensures unmatched sensitivity and indispensable flexibility to satisfy, for example, RoHS and WEEE regulations.
Combining a high power X-ray tube and high resolution detector, the X-Strata980 X-ray Fluorescence analyser from Oxford Instruments delivers limits of detection in single digit ppms. The instrument performs excellent analysis and characterization of multilayer coatings, SAC alloys, µPPF and solar panels.
The NANOHUNTER, winner of the 2007 R&D 100 award, a highly innovative product was designed specifically to offer comprehensive trace materials and design characterization analysis capabilities to a wide range of research disciplines and in highly diverse analytical techniques than was possible with prior technology.
The Epsilon 3 instrument is a benchtop energy dispersive x-ray fluorescence (EDXRF) spectrometer, powered by the latest advances in excitation and detection technology. Epsilon 3 is an affordable, highly flexible analytical tool suitable for a wide range of applications which features a new high performance ceramic tube and the latest in silicon drift detector technology.
Generally, a non-destructive measuring system is required to perform various elemental analysis tasks in industry, research and science fields.
SPECTRO Analytical Instruments offers SPECTRO XEPOS HE, a sophisticated and high-performance XRF spectrometer designed for analysis of process-critical and environmental elements.
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