X-Ray Fluorescence Analyzers RSS Feed - X-Ray Fluorescence Analyzers

X-ray Fluorescence (XRF) analysis is a widely used method of elemental analysis providing both qualitative and quantitative compositional information. Among its advantages are the wide range of measurable elements covering nearly the entire periodic system. X-ray Fluorescence analysis is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.
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Generally, a non-destructive measuring system is required to perform various elemental analysis tasks in industry, research and science fields.
The Thick-800 is a non-destructive testing solution for organizations that need accurate quality control of printed circuit boards and electronics. Testing capabilities include multi-layer thickness measurements and RoHS testing of solder joint. The Thick-800 is specifically developed for coating thickness measurements
The S2 PICOFOX is the world’s first portable bench top spectrometer for rapid semi-quantitative and quantitative multi-element analysis of suspensions, liquids and solids using the principle of total reflection X-ray fluorescence spectroscopy.
SPECTROSCOUT is an energy-dispersive X-Ray Fluorescence (ED-XRF) analyzer that has an analytical power similar to that of other top-grade benchtop analyzers such as SPECTRO XEPOS.
The ARL QUANT'X EDXRF utilizes an exclusive Peltier cooled Si(Li) detector and unique Digital Pulse Processing (DPP) technology for high-performance, multi-element analysis of environmental and industrial applications, such as air particulates, soil contamination, toxic elements in plastic, and forensic science. The ARL QUANT'X provides the highest performance-price ratio of all other Energy Dispersive XRF (EDXRF) instruments on the market and ensures unmatched sensitivity and indispensable flexibility to satisfy, for example, RoHS and WEEE regulations.
Micro-XRF is the key method used for the highly sensitive and non-destructive elemental analysis of a number of samples including in-homogenous and irregular samples.
The Epsilon 3XLE instrument is a benchtop energy dispersive x-ray fluorescence (EDXRF) spectrometer, powered by the latest advances in excitation and detection technology.
A fully integrated X-ray fluorescence (XRF) spectrometer, the Epsilon 5 combines advanced elemental excitation capabilities with sophisticated instrument control and analytical software.
The ARTAX is the first portable XRF spectrometer developed to meet specific requirements of non-destructive in-situ elemental analysis.
SPECTRO Analytical Instruments offers a compact and sophisticated energy dispersive X-ray fluorescence spectrometer dubbed SPECTRO xSORT. The instrument is developed to perform nonstop analysis and metal sorting.
The XGT-WR series of EDXRF analyzers is being sold by Horiba for several years in order to offer screening measurements for samples with hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.
The Bruker M6 JETSTREAM has been developed for the non-destructive elemental analysis of large samples.
PANalytical’s Epsilon 1 is a fully integrated energy dispersive XRF spectrometer meant for use in research and education. It provides unique pre-programmed XRF analysis ranging from fundamental element identification and quantification to highly advanced testing.
SPECTRO Analytical Instruments offers a flexible XRF spectrometer dubbed SPECTRO XEPOS, which is specifically designed for challenging applications.
The Epsilon 3X high-performance benchtop energy dispersive x-ray fluorescence (EDXRF) spectrometer is constructed with advanced excitation and detection technology. It is a highly flexible analytical tool that can be used for several applications.
The unique AZX400 sequential WDXRF spectrometer from Rigaku was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400mm diameter, 50mm thick and 30kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.
SPECTRO Analytical Instruments offers SPECTRO XEPOS HE, a sophisticated and high-performance XRF spectrometer designed for analysis of process-critical and environmental elements.
In industrial process control applications, analytical instruments have to be highly sensitive, fast and accurate. The SPECTRO iQ has been specifically designed to meet these criteria. The new SPECTRO iQ II now features more enhanced technologies and enables simple and reliable operation.