X-Ray Fluorescence Analyzers RSS Feed - X-Ray Fluorescence Analyzers

X-ray Fluorescence (XRF) analysis is a widely used method of elemental analysis providing both qualitative and quantitative compositional information. Among its advantages are the wide range of measurable elements covering nearly the entire periodic system. X-ray Fluorescence analysis is widely used for elemental analysis and chemical analysis, particularly in the investigation of metals, glass, ceramics and building materials, and for research in geochemistry, forensic science and archaeology.
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Equipment
In industrial process control applications, analytical instruments have to be highly sensitive, fast and accurate. The SPECTRO iQ has been specifically designed to meet these criteria. The new SPECTRO iQ II now features more enhanced technologies and enables simple and reliable operation.
The unique AZX400 sequential WDXRF spectrometer from Rigaku was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400mm diameter, 50mm thick and 30kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.
The ARL QUANT'X EDXRF utilizes an exclusive Peltier cooled Si(Li) detector and unique Digital Pulse Processing (DPP) technology for high-performance, multi-element analysis of environmental and industrial applications, such as air particulates, soil contamination, toxic elements in plastic, and forensic science. The ARL QUANT'X provides the highest performance-price ratio of all other Energy Dispersive XRF (EDXRF) instruments on the market and ensures unmatched sensitivity and indispensable flexibility to satisfy, for example, RoHS and WEEE regulations.
Combining a high power X-ray tube and high resolution detector, the X-Strata980 X-ray Fluorescence analyser from Oxford Instruments delivers limits of detection in single digit ppms. The instrument performs excellent analysis and characterization of multilayer coatings, SAC alloys, µPPF and solar panels.
Generally, a non-destructive measuring system is required to perform various elemental analysis tasks in industry, research and science fields.
SPECTRO Analytical Instruments offers a compact and sophisticated energy dispersive X-ray fluorescence spectrometer dubbed SPECTRO xSORT. The instrument is developed to perform nonstop analysis and metal sorting.
The Axios is a low-power (1kW) wavelength dispersive XRF (WDXRF) spectrometer designed on the rugged and proven Axios instrument platform.
A fully integrated X-ray fluorescence (XRF) spectrometer, the Epsilon 5 combines advanced elemental excitation capabilities with sophisticated instrument control and analytical software.
The XGT-WR series of EDXRF analyzers is being sold by Horiba for several years in order to offer screening measurements for samples with hazardous elements such as Pb, Cd, Hg, Cr, Br, Sb, As for RoHS, ELV, and Cl for halogen free applications.
The Thick-800 is a non-destructive testing solution for organizations that need accurate quality control of printed circuit boards and electronics. Testing capabilities include multi-layer thickness measurements and RoHS testing of solder joint. The Thick-800 is specifically developed for coating thickness measurements
SPECTRO Analytical Instruments offers SPECTRO XEPOS HE, a sophisticated and high-performance XRF spectrometer designed for analysis of process-critical and environmental elements.
SPECTRO Analytical Instruments offers a flexible XRF spectrometer dubbed SPECTRO XEPOS, which is specifically designed for challenging applications.