Energy Dispersive X-Ray Spectroscopy (EDS) RSS Feed - Energy Dispersive X-Ray Spectroscopy (EDS)

Energy dispersive X-ray spectroscopy (EDS or EDX) is an analytical technique used for the elemental analysis or chemical characterization of a sample. It is one of the variants of X-ray fluorescence spectroscopy which relies on the investigation of a sample through interactions between electromagnetic radiation and matter, analyzing X-rays emitted by the matter in response to being hit with charged particles.
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INCAx-act LN2-free Analytical Silicon Drift Detector with PentaFET® Precision has six advantages. Namelt speed, accuracy, reliability, convenience, quality and rpecision.
ThinFilmID for the in-situ measurement of composition and thickness of thin films down to 1nm in the SEM. ThinFilmID uses Energy Dispersive X-ray Spectrometry (EDS) to measure the composition and thickness of layers in a thin film structure. This technique has a unique combination of advantages that offer real benefits to customers both in terms of speed, optimisation of methods and ease of use.
INCASynergy combines the very best EDS and EBSD systems available today. Oxford Instruments' renowned INCA EDS, which provides the easiest way to obtain the highest quality EDS data, is now combined with HKL's sophisticated CHANNEL5 EBSD system in one powerful and easy to use package.
The highly successful X-Max 80 detector is now available for use on Transmission Electron Microscopes! This detector has solid angles significantly greater than any commercially available SDD for TEM. X-rays are collected faster due to greater collection efficiency, and the count handling capability of SDD. See the difference immediately when analysing nanoparticles, or collecting linescans or X-ray maps. The X-Max TEM will increase productivity without sacrificing accuracy - all in a liquid nitrogen free environment.
The new X-Max Silicon Drift Detector (SDD) offers users over TEN times the solid angle of conventional EDS detectors... without compromising on performance. Now you can have count rate, imaging, and analytical performance all at the same time.