The highly successful X-Max 80 detector is now available for use on Transmission Electron Microscopes! This detector has solid angles significantly greater than any commercially available SDD for TEM. X-rays are collected faster due to greater collection efficiency, and the count handling capability of SDD. See the difference immediately when analysing nanoparticles, or collecting linescans or X-ray maps. The X-Max TEM will increase productivity without sacrificing accuracy - all in a liquid nitrogen free environment.