Cryogenic Probe Stations RSS Feed - Cryogenic Probe Stations

Cryogenic Probe Station allows for electrical measurements at temperatures ranged from 5 K to 475 K.
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Equipment
The Model EMPX-HF is a versatile cryogenic electromagnet-based micro-manipulated probe station used for nondestructive testing of devices on full and partial wafers up to 25 mm (1 in) in diameter. The EMPX-HF is a platform for measurement of magneto-transport, electrical, electrooptical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, semiconductors, superconductors, and spintronic devices are typical materials measured in an EMPX-HF.
The Model FWPX is a versatile cryogenic micro-manipulated probe station used for nondestructive testing of devices on full and partial wafers up to 102 mm (4 in) in diameter. The FWPX cryogenic probe station is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices.
The Model CPX is a versatile cryogenic micromanipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter. The CPX is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, and semiconductors are typical materials measured in a CPX. A wide selection of probes, cables, sample holders, and options makes it possible to configure the CPX to meet your specific measurement applications.
The model CRX-EM-HF is a dynamic cryogen-free electromagnet-based micro manipulated probe station, which finds application in non-destructive testing of devices on full and partial wafers up to 25 mm (1 in) in diameter.
The Model CRX-4K is a versatile cryogen-free micro-manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter. The CRX-4K is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, and semiconductors are typical materials measured in a CRX-4K. A wide selection of probes, cables, sample holders, and options makes it possible to configure the CRX-4K to meet your specific measurement applications.
The Model CRX-6.5K is a cryogen-free, low cost, micro-manipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter.
The Model CRX-VF is a comprehensive, cryogen-free micro-manipulated probe station used for NDT of devices on partial and full wafers up to 51 mm diameter.
The Model TTPX is a versatile cryogenic micromanipulated probe station used for non-destructive testing of devices on full and partial wafers up to 51 mm (2 in) in diameter. The TTPX is a platform for measurement of electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Nanoscale electronics, quantum wires and dots, and semiconductors are typical materials measured in a TTPX. A wide selection of probes, cables, sample holders, and options makes it possible to configure the TTPX to meet your specific measurement applications.
The Model CPX-VF is a versatile cryogenic micromanipulated probe station used for non-destructive magnetic testing of devices on full and partial wafers up to 51 mm (2 in) in diameter. The CPX-VF cryogenic probe station is a platform for measurement of magneto-transport, electrical, electrooptical, parametric, high Z, DC, RF, and microwave properties of materials and test devices.
The PS-100 benchtop cryogenic probe offers versatile cryogenic testing in a fully specified standard system rendering the probe station ideal for labs with limited funding or who are just beginning with materials testing.
The Model CPX-HF is a versatile cryogenic micromanipulated probe station used for non-destructive magnetic testing of devices on full and partial wafers up to 25 mm (1 in) in diameter. The CPX-HF cryogenic probe station is a platform for measurement of magneto-transport, electrical, electrooptical, parametric, high Z, DC, RF, and microwave properties of materials and test devices.