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Ellipsometry is an optical metrolgy technique used for the characterization of thin films. In particular it measures complex refractive indix and dielectric function. It is used to characterize a range of materials form semiconductors to biologicals.
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For routine measurements of thin film thickness and refractive index, the alpha-SE® is a great solution. Designed for ease-of-use: simply mount a sample, choose the model that matches your film, and press measure. You have results within seconds.
The M-2000 line of spectroscopic ellipsometers is engineered to meet the diverse demands of thin film characterization. An advanced optical design, wide spectral range, and fast data acquisition make it an extremely powerful and versatile tool. The M-2000 delivers both speed and accuracy. Our patented RCE technology combines Rotating Compensator Ellipsometry with high-speed CCD detection to collect data from the entire spectrum (hundreds of wavelengths) in a fraction of a second with a wide array of configurations.
The SENDIRA infrared ellipsometer covers the infrared spectral range from 1.7 µm up to 25 µm (6,000 cm-1 to 400 cm-1) with FTIR precision and high resolution. The SENDIRA provides detailed chemical, mechanical, electrical, and optical information on complex layer systems.
The SENresearch broadband spectroscopic ellipsometer family is designed to meet the requirements of modern research with special emphasis on speed and accuracy for an unmatched variety of applications.
The IR-VASE® is the first and only spectroscopic ellipsometer to cover the spectral range from 2 to 30 microns (333 to 5000 wavenumbers). The IR-VASE can determine both n and k for materials over the entire width of the spectral range without extrapolating data outside the measured range, as with a Kramers-Kronig analysis. Like other Woollam ellipsometers, the IR-VASE is perfect for thin films or bulk materials including dielectrics, semiconductors, polymers, and metals.